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Statistical Methodologies For Modelling The Impact Of Process Variability In Ultra Deep Submicron Srams
Download Statistical Methodologies For Modelling The Impact Of Process Variability In Ultra Deep Submicron Srams full books in PDF, epub, and Kindle. Read online Statistical Methodologies For Modelling The Impact Of Process Variability In Ultra Deep Submicron Srams ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Statistical Methodologies for Modelling the Impact of Process Variability in Ultra-deep-submicron SRAMs by : Kaya Can Akyel
Download or read book Statistical Methodologies for Modelling the Impact of Process Variability in Ultra-deep-submicron SRAMs written by Kaya Can Akyel and published by . This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The downscaling of device geometry towards its physical limits exacerbates the impact of the inevitable atomistic phenomena tied to matter granularity. In this context, many different variability sources raise and affect the electrical characteristics of the manufactured devices. The variability-aware design methodology has therefore become a popular research topic in the field of digital circuit design, since the increased number of transistors in the modern integrated circuits had led to a large statistical variability affecting dramatically circuit functionality. Static Random Access Memory (SRAM) circuits which are manufactured with the most aggressive design rules in a given technology node and contain billions of transistor, are severely impacted by the process variability which stands as the main obstacle for the further reduction of the bitcell area and of its minimum operating voltage. The reduction of the latter is a very important parameter for Low-Power design, which is one of the most popular research fields of our era. The optimization of SRAM bitcell design therefore has become a crucial task to guarantee the good functionality of the design at an industrial manufacturing level, in the same time answering to the high density and low power demands. However, the long time required by each new technology node process development means a long waiting time before obtaining silicon results, which is in cruel contrast with the fact that the design optimization has to be started as early as possible. An efficient SPICE characterization methodology for the minimum operating voltage of SRAM circuits is therefore a mandatory requirement for design optimization. This research work concentrates on the development of the new simulation methodologies for the modeling of the process variability in ultra-deep-submicron SRAMs, with the ultimate goal of a significantly accurate modeling of the minimum operating voltage Vmin. A particular interest is also carried on the time-dependent sub-class of the process variability, which appears as a change in the electrical characteristics of a given transistor during its operation and during its life-time. This research work has led to many publications and one patent application. The majority of findings are retained by STMicroelectronics SRAM development team for a further use in their design optimization flow.
Book Synopsis VLSI-SoC: Research Trends in VLSI and Systems on Chip by : Giovanni De Micheli
Download or read book VLSI-SoC: Research Trends in VLSI and Systems on Chip written by Giovanni De Micheli and published by Springer. This book was released on 2010-08-23 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.
Book Synopsis Design Optimization of Ultra-scaled Transistors and the Impact of Process Variations by : Shiying Xiong
Download or read book Design Optimization of Ultra-scaled Transistors and the Impact of Process Variations written by Shiying Xiong and published by . This book was released on 2004 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Robust SRAM Designs and Analysis by : Jawar Singh
Download or read book Robust SRAM Designs and Analysis written by Jawar Singh and published by Springer Science & Business Media. This book was released on 2012-08-01 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
Book Synopsis Low Power VLSI Design by : Angsuman Sarkar
Download or read book Low Power VLSI Design written by Angsuman Sarkar and published by Walter de Gruyter GmbH & Co KG. This book was released on 2016-08-08 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book teaches basic and advanced concepts, new methodologies and recent developments in VLSI technology with a focus on low power design. It provides insight on how to use Tanner Spice, Cadence tools, Xilinx tools, VHDL programming and Synopsis to design simple and complex circuits using latest state-of-the art technologies. Emphasis is placed on fundamental transistor circuit-level design concepts.
Book Synopsis Planar Double-Gate Transistor by : Amara Amara
Download or read book Planar Double-Gate Transistor written by Amara Amara and published by Springer Science & Business Media. This book was released on 2009-01-16 with total page 215 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until the 1990s, the reduction of the minimum feature sizes used to fabricate in- grated circuits, called “scaling”, has highlighted serious advantages as integration density, speed, power consumption, functionality and cost. Direct consequence was the decrease of cost-per-function, so the electronic productivity has largely progressed in this period. Another usually cited trend is the evolution of the in- gration density as expressed by the well-know Moore’s Law in 1975: the number of devices per chip doubles every 2 years. This evolution has allowed improving signi?cantly the circuit complexity, offering a great computing power in the case of microprocessor, for example. However, since few years, signi?cant issues appeared such as the increase of the circuit heating, device complexity, variability and dif?culties to improve the integration density. These new trends generate an important growth in development and production costs. Though is it, since 40 years, the evolution of the microelectronics always f- lowed the Moore’s law and each dif?culty has found a solution.
Book Synopsis Embedded Memory Design for Multi-Core and Systems on Chip by : Baker Mohammad
Download or read book Embedded Memory Design for Multi-Core and Systems on Chip written by Baker Mohammad and published by Springer Science & Business Media. This book was released on 2013-10-22 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.
Book Synopsis 2005 International Conference on Integrated Circuit Design and Technology by :
Download or read book 2005 International Conference on Integrated Circuit Design and Technology written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2005 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues for 2009- cataloged as a serial in LC
Book Synopsis Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by : Manoj Sachdev
Download or read book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Book Synopsis Static Timing Analysis for Nanometer Designs by : J. Bhasker
Download or read book Static Timing Analysis for Nanometer Designs written by J. Bhasker and published by Springer Science & Business Media. This book was released on 2009-04-03 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt: iming, timing, timing! That is the main concern of a digital designer charged with designing a semiconductor chip. What is it, how is it T described, and how does one verify it? The design team of a large digital design may spend months architecting and iterating the design to achieve the required timing target. Besides functional verification, the t- ing closure is the major milestone which dictates when a chip can be - leased to the semiconductor foundry for fabrication. This book addresses the timing verification using static timing analysis for nanometer designs. The book has originated from many years of our working in the area of timing verification for complex nanometer designs. We have come across many design engineers trying to learn the background and various aspects of static timing analysis. Unfortunately, there is no book currently ava- able that can be used by a working engineer to get acquainted with the - tails of static timing analysis. The chip designers lack a central reference for information on timing, that covers the basics to the advanced timing veri- cation procedures and techniques.
Book Synopsis Nano-scale CMOS Analog Circuits by : Soumya Pandit
Download or read book Nano-scale CMOS Analog Circuits written by Soumya Pandit and published by CRC Press. This book was released on 2018-09-03 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. The success of nano-scale analog circuit design requires repeat experimentation, correct analysis of the device physics, process technology, and adequate use of the knowledge database. Starting with the basics, Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design introduces the essential fundamental concepts for designing analog circuits with optimal performances. This book explains the links between the physics and technology of scaled MOS transistors and the design and simulation of nano-scale analog circuits. It also explores the development of structured computer-aided design (CAD) techniques for architecture-level and circuit-level design of analog circuits. The book outlines the general trends of technology scaling with respect to device geometry, process parameters, and supply voltage. It describes models and optimization techniques, as well as the compact modeling of scaled MOS transistors for VLSI circuit simulation. • Includes two learning-based methods: the artificial neural network (ANN) and the least-squares support vector machine (LS-SVM) method • Provides case studies demonstrating the practical use of these two methods • Explores circuit sizing and specification translation tasks • Introduces the particle swarm optimization technique and provides examples of sizing analog circuits • Discusses the advanced effects of scaled MOS transistors like narrow width effects, and vertical and lateral channel engineering Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design describes the models and CAD techniques, explores the physics of MOS transistors, and considers the design challenges involving statistical variations of process technology parameters and reliability constraints related to circuit design.
Book Synopsis Analysis and Design of Digital Integrated Circuits by : David A. Hodges
Download or read book Analysis and Design of Digital Integrated Circuits written by David A. Hodges and published by McGraw-Hill Incorporated. This book was released on 2003 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: The third edition of Hodges and Jackson’s Analysis and Design of Digital Integrated Circuits has been thoroughly revised and updated by a new co-author, Resve Saleh of the University of British Columbia. The new edition combines the approachability and concise nature of the Hodges and Jackson classic with a complete overhaul to bring the book into the 21st century. The new edition has replaced the emphasis on BiPolar with an emphasis on CMOS. The outdated MOS transistor model used throughout the book will be replaced with the now standard deep submicron model. The material on memory has been expanded and updated. As well the book now includes more on SPICE simulation and new problems that reflect recent technologies. The emphasis of the book is on design, but it does not neglect analysis and has as a goal to provide enough information so that a student can carry out analysis as well as be able to design a circuit. This book provides an excellent and balanced introduction to digital circuit design for both students and professionals.
Download or read book IEEE Circuits & Devices written by and published by . This book was released on 2005 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dual Mode Logic written by Itamar Levi and published by Springer Nature. This book was released on 2020-12-15 with total page 191 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents Dual Mode Logic (DML), a new design paradigm for digital integrated circuits. DML logic gates can operate in two modes, each optimized for a different metric. Its on-the-fly switching between these operational modes at the gate, block and system levels provide maximal E-D optimization flexibility. Each highly detailed chapter has multiple illustrations showing how the DML paradigm seamlessly implements digital circuits that dissipate less energy while simultaneously improving performance and reducing area without a significant compromise in reliability. All the facets of the DML methodology are covered, starting from basic concepts, through single gate optimization, general module optimization, design trade-offs and new ways DML can be integrated into standard design flows using standard EDA tools. DML logic is compatible with numerous applications but is particularly advantageous for ultra-low power, reliable high performance systems, and advanced scaled technologies Written in language accessible to students and design engineers, each topic is oriented toward immediate application by all those interested in an alternative to CMOS logic. Describes a novel, promising alternative to conventional CMOS logic, known as Dual Mode Logic (DML), with which a single gate can be operated selectively in two modes, each optimized for a different metric (e.g., energy consumption, performance, size); Demonstrates several techniques at the architectural level, which can result in high energy savings and improved system performance; Focuses on the tradeoffs between power, area and speed including optimizations at the transistor and gate level, including alternatives to DML basic cells; Illustrates DML efficiency for a variety of VLSI applications.
Download or read book Timing written by Sachin Sapatnekar and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 301 pages. Available in PDF, EPUB and Kindle. Book excerpt: Statistical timing analysis is an area of growing importance in nanometer te- nologies‚ as the uncertainties associated with process and environmental var- tions increase‚ and this chapter has captured some of the major efforts in this area. This remains a very active field of research‚ and there is likely to be a great deal of new research to be found in conferences and journals after this book is published. In addition to the statistical analysis of combinational circuits‚ a good deal of work has been carried out in analyzing the effect of variations on clock skew. Although we will not treat this subject in this book‚ the reader is referred to [LNPS00‚ HN01‚ JH01‚ ABZ03a] for details. 7 TIMING ANALYSIS FOR SEQUENTIAL CIRCUITS 7.1 INTRODUCTION A general sequential circuit is a network of computational nodes (gates) and memory elements (registers). The computational nodes may be conceptualized as being clustered together in an acyclic network of gates that forms a c- binational logic circuit. A cyclic path in the direction of signal propagation 1 is permitted in the sequential circuit only if it contains at least one register . In general, it is possible to represent any sequential circuit in terms of the schematic shown in Figure 7.1, which has I inputs, O outputs and M registers. The registers outputs feed into the combinational logic which, in turn, feeds the register inputs. Thus, the combinational logic has I + M inputs and O + M outputs.
Download or read book Science Abstracts written by and published by . This book was released on 1993 with total page 980 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Random Telegraph Signals in Semiconductor Devices by : Eddy Simoen
Download or read book Random Telegraph Signals in Semiconductor Devices written by Eddy Simoen and published by . This book was released on 2016 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Following their first observation in 1984, random telegraph signals (RTSs) were initially a purely scientific tool to study fundamental aspects of defects in semiconductor devices. As semiconductor devices move to the nanoscale however, RTSs have become an issue of major concern to the semiconductor industry, both in development of current technology, such as memory devices and logic circuits, as well as in future semiconductor devices beyond the silicon roadmap, such as nanowire, TFET and carbon nanotube-based devices. It has become clear that the reliability of state-of-the-art and future CMOS technology nodes is dominated by RTS and single trap phenomena, and so its understanding is of vital importance for the modelling and simulation of the operation and the expected lifetime of CMOS devices and circuits. It is the aim of this book to provide a comprehensive and up-to-date review of one of the most challenging issues facing the semiconductor industry, from the fundamentals of RTSs to applied technology."--Prové de l'editor.
