Soft Errors

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Soft Errors in Modern Electronic Systems

Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1441969934
Total Pages : 331 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Soft Errors in Modern Electronic Systems by : Michael Nicolaidis

Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Architecture Design for Soft Errors

Author : Shubu Mukherjee
Publisher : Morgan Kaufmann
ISBN 13 : 0080558321
Total Pages : 361 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Architecture Design for Soft Errors by : Shubu Mukherjee

Download or read book Architecture Design for Soft Errors written by Shubu Mukherjee and published by Morgan Kaufmann. This book was released on 2011-08-29 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors Shows readers how to quantify their soft error reliability Provides state-of-the-art techniques to protect against soft errors

Soft Errors

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 1351831550
Total Pages : 439 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Soft Errors by : Jean-Luc Autran

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 439 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Soft Errors

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 146659084X
Total Pages : 439 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Soft Errors by : Jean-Luc Autran

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2015-02-25 with total page 439 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Author : Dan M. Fleetwood
Publisher : World Scientific
ISBN 13 : 9789812794703
Total Pages : 354 pages
Book Rating : 4.7/5 (947 download)

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Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Dan M. Fleetwood

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Dan M. Fleetwood and published by World Scientific. This book was released on 2004 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Author : Alexandra Zimpeck
Publisher : Springer Nature
ISBN 13 : 3030683680
Total Pages : 131 pages
Book Rating : 4.0/5 (36 download)

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Book Synopsis Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs by : Alexandra Zimpeck

Download or read book Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs written by Alexandra Zimpeck and published by Springer Nature. This book was released on 2021-03-10 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.

Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices

Author : Takashi Nakamura
Publisher : World Scientific
ISBN 13 : 9812778829
Total Pages : 364 pages
Book Rating : 4.8/5 (127 download)

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Book Synopsis Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices by : Takashi Nakamura

Download or read book Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients.The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Author : Ronald Donald Schrimpf
Publisher : World Scientific
ISBN 13 : 9812389407
Total Pages : 349 pages
Book Rating : 4.8/5 (123 download)

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Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Ronald Donald Schrimpf

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Ronald Donald Schrimpf and published by World Scientific. This book was released on 2004 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Soft Error Reliability Using Virtual Platforms

Author : Felipe Rocha da Rosa
Publisher : Springer Nature
ISBN 13 : 3030557049
Total Pages : 142 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability Using Virtual Platforms by : Felipe Rocha da Rosa

Download or read book Soft Error Reliability Using Virtual Platforms written by Felipe Rocha da Rosa and published by Springer Nature. This book was released on 2020-11-02 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits

Author : Hsiao-Heng Kelin Lee
Publisher : Stanford University
ISBN 13 :
Total Pages : 156 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits by : Hsiao-Heng Kelin Lee

Download or read book Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits written by Hsiao-Heng Kelin Lee and published by Stanford University. This book was released on 2011 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. latches and flip-flops, is challenging. Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing a new soft error resilience layout design principle called LEAP, or Layout Design through Error-Aware Transistor Positioning. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop encounters on average 2,000X and 5X fewer errors compared to a conventional D flip-flop and our reference DICE flip-flop, respectively; 2) our LEAP-DICE flip-flop has the best soft error performance among all existing SEU-immune flip-flops; 3) In the evaluation of our design framework, we also discovered new soft error effects related to operating conditions such as voltage scaling, clock frequency setting and radiation dose.

Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices

Author : Geancarlo Abich
Publisher : Springer Nature
ISBN 13 : 3031185994
Total Pages : 143 pages
Book Rating : 4.0/5 (311 download)

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Book Synopsis Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices by : Geancarlo Abich

Download or read book Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices written by Geancarlo Abich and published by Springer Nature. This book was released on 2023-01-01 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes an extensive and consistent soft error assessment of convolutional neural network (CNN) models from different domains through more than 14.8 million fault injections, considering different precision bit-width configurations, optimization parameters, and processor models. The authors also evaluate the relative performance, memory utilization, and soft error reliability trade-offs analysis of different CNN models considering a compiler-based technique w.r.t. traditional redundancy approaches.

Soft Error Mechanisms, Modeling and Mitigation

Author : Selahattin Sayil
Publisher : Springer
ISBN 13 : 3319306073
Total Pages : 105 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Soft Error Mechanisms, Modeling and Mitigation by : Selahattin Sayil

Download or read book Soft Error Mechanisms, Modeling and Mitigation written by Selahattin Sayil and published by Springer. This book was released on 2016-02-25 with total page 105 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

Author :
Publisher :
ISBN 13 : 9814472395
Total Pages : pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices by :

Download or read book Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Soft Error Reliability of VLSI Circuits

Author : Behnam Ghavami
Publisher : Springer Nature
ISBN 13 : 3030516105
Total Pages : 114 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability of VLSI Circuits by : Behnam Ghavami

Download or read book Soft Error Reliability of VLSI Circuits written by Behnam Ghavami and published by Springer Nature. This book was released on 2020-10-13 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Dependability in Electronic Systems

Author : Nobuyasu Kanekawa
Publisher : Springer Science & Business Media
ISBN 13 : 144196715X
Total Pages : 226 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Dependability in Electronic Systems by : Nobuyasu Kanekawa

Download or read book Dependability in Electronic Systems written by Nobuyasu Kanekawa and published by Springer Science & Business Media. This book was released on 2010-11-08 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.

Dependable Embedded Systems

Author : Jörg Henkel
Publisher : Springer Nature
ISBN 13 : 303052017X
Total Pages : 606 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Dependable Embedded Systems by : Jörg Henkel

Download or read book Dependable Embedded Systems written by Jörg Henkel and published by Springer Nature. This book was released on 2020-12-09 with total page 606 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Error Correction Coding

Author : Todd K. Moon
Publisher : John Wiley & Sons
ISBN 13 : 0471648000
Total Pages : 800 pages
Book Rating : 4.4/5 (716 download)

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Book Synopsis Error Correction Coding by : Todd K. Moon

Download or read book Error Correction Coding written by Todd K. Moon and published by John Wiley & Sons. This book was released on 2005-06-06 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: An unparalleled learning tool and guide to error correction coding Error correction coding techniques allow the detection and correction of errors occurring during the transmission of data in digital communication systems. These techniques are nearly universally employed in modern communication systems, and are thus an important component of the modern information economy. Error Correction Coding: Mathematical Methods and Algorithms provides a comprehensive introduction to both the theoretical and practical aspects of error correction coding, with a presentation suitable for a wide variety of audiences, including graduate students in electrical engineering, mathematics, or computer science. The pedagogy is arranged so that the mathematical concepts are presented incrementally, followed immediately by applications to coding. A large number of exercises expand and deepen students' understanding. A unique feature of the book is a set of programming laboratories, supplemented with over 250 programs and functions on an associated Web site, which provides hands-on experience and a better understanding of the material. These laboratories lead students through the implementation and evaluation of Hamming codes, CRC codes, BCH and R-S codes, convolutional codes, turbo codes, and LDPC codes. This text offers both "classical" coding theory-such as Hamming, BCH, Reed-Solomon, Reed-Muller, and convolutional codes-as well as modern codes and decoding methods, including turbo codes, LDPC codes, repeat-accumulate codes, space time codes, factor graphs, soft-decision decoding, Guruswami-Sudan decoding, EXIT charts, and iterative decoding. Theoretical complements on performance and bounds are presented. Coding is also put into its communications and information theoretic context and connections are drawn to public key cryptosystems. Ideal as a classroom resource and a professional reference, this thorough guide will benefit electrical and computer engineers, mathematicians, students, researchers, and scientists.