Selected Papers on Ellipsometry

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Publisher :
ISBN 13 :
Total Pages : 754 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Selected Papers on Ellipsometry by : R. M. A. Azzam

Download or read book Selected Papers on Ellipsometry written by R. M. A. Azzam and published by . This book was released on 1990 with total page 754 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ellipsometry at the Nanoscale

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Publisher : Springer Science & Business Media
ISBN 13 : 3642339565
Total Pages : 740 pages
Book Rating : 4.6/5 (423 download)

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Book Synopsis Ellipsometry at the Nanoscale by : Maria Losurdo

Download or read book Ellipsometry at the Nanoscale written by Maria Losurdo and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

A User's Guide to Ellipsometry

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Publisher : Academic Press
ISBN 13 : 0323140009
Total Pages : 279 pages
Book Rating : 4.3/5 (231 download)

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Book Synopsis A User's Guide to Ellipsometry by : Harland G. Tompkins

Download or read book A User's Guide to Ellipsometry written by Harland G. Tompkins and published by Academic Press. This book was released on 2012-12-02 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is specifically designed for the user who wishes expanded use of ellipsometry beyond the relatively limited number of turn-key applications. The book provides a concise discussion of theory and instrumentation before describing how to use optical parameters to determine material properties and optical parameters for inaccessible substrates and unknown films, and how to measure extremely thin films. The book also addresses polysilicon, a material commonly used in the microelectronics industry, and the effect of substrate roughness. This book's concepts and applications are reinforced through the 14 case studies that illustrate specific applications of ellipsometry from the semiconductor industry as well as studies involving corrosion and oxide growth. Allows the user to optimize turn-key operation of ellipsometers and move beyond limited turn-key applications Provides comprehensive discussion of the measurement of film thickness and optical constants in film Discusses the trajectories of the ellipsometric parameters Del and Psi and how changes in the materials affect the parameter Includes 14 case studies to reinforce specific applications Includes three appendices for helpful references

Spectroscopic Ellipsometry

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Publisher : Momentum Press
ISBN 13 : 1606507281
Total Pages : 178 pages
Book Rating : 4.6/5 (65 download)

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Book Synopsis Spectroscopic Ellipsometry by : Harland G. Tompkins

Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.

Progress in Optics

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Publisher : Elsevier
ISBN 13 : 0444505687
Total Pages : 627 pages
Book Rating : 4.4/5 (445 download)

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Book Synopsis Progress in Optics by : Emil Wolf

Download or read book Progress in Optics written by Emil Wolf and published by Elsevier. This book was released on 2000-12-13 with total page 627 pages. Available in PDF, EPUB and Kindle. Book excerpt: Progress in Optics Volume 41.

Ellipsometry and Polarized Light

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Publisher : North Holland
ISBN 13 :
Total Pages : 570 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Ellipsometry and Polarized Light by : R. M. A. Azzam

Download or read book Ellipsometry and Polarized Light written by R. M. A. Azzam and published by North Holland. This book was released on 1987 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. Although known for almost a century, the use of ellipsometry has increased rapidly in the last two decades. Among the most significant recent developments are new applications, novel and automated instrumentation and techniques for error-free data analysis. This book provides the necessary analytical and experimental tools needed for competent understanding and use of these developments. It is directed to those who are already working in the field and, more importantly, to the newcomer who would otherwise have to sift through several hundred published papers. The authors first present a comprehensive study of the different mathematical representations of polarized light and how such light is processed by optical systems, going on to show how these tools are applied to the analysis of ellipsometer systems. To relate ellipsometric measurements to surface properties, use is then made of electromagnetic theory. Experimental techniques and apparatus are described and the many interesting applications of ellipsometry to surface and thin-film phenomena are reviewed. This reference work is addressed to researchers and students with a strong interest in surface and thin-film physics and optics and their applications. It is a must for libraries in the fields of solid state physics, physical chemistry, electro-chemistry, metallurgy and optical engineering.

Spectroscopic Ellipsometry

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Publisher : John Wiley & Sons
ISBN 13 : 9780470060186
Total Pages : 388 pages
Book Rating : 4.0/5 (61 download)

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Book Synopsis Spectroscopic Ellipsometry by : Hiroyuki Fujiwara

Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Selected Papers on Linear Optical Composite Materials

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Publisher : SPIE-International Society for Optical Engineering
ISBN 13 :
Total Pages : 730 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Selected Papers on Linear Optical Composite Materials by : Akhlesh Lakhtakia

Download or read book Selected Papers on Linear Optical Composite Materials written by Akhlesh Lakhtakia and published by SPIE-International Society for Optical Engineering. This book was released on 1996 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt: Topics in this volume include: a physical model for the daguerrotype; experimental relations of gold; electromagnetic properties of random material; and local-field effects and effective-medium theory: a microscopic perspective.

Microanalysis of Solids

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Publisher : Springer Science & Business Media
ISBN 13 : 1489914927
Total Pages : 459 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Microanalysis of Solids by : B.G. Yacobi

Download or read book Microanalysis of Solids written by B.G. Yacobi and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 459 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.

Selected Papers on Characterization of Optical Coatings

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Publisher :
ISBN 13 :
Total Pages : 742 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Selected Papers on Characterization of Optical Coatings by : Michael Ray Jacobson

Download or read book Selected Papers on Characterization of Optical Coatings written by Michael Ray Jacobson and published by . This book was released on 1992 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Optical Properties of Materials and Their Applications

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Publisher : John Wiley & Sons
ISBN 13 : 111950631X
Total Pages : 667 pages
Book Rating : 4.1/5 (195 download)

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Book Synopsis Optical Properties of Materials and Their Applications by : Jai Singh

Download or read book Optical Properties of Materials and Their Applications written by Jai Singh and published by John Wiley & Sons. This book was released on 2020-01-07 with total page 667 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a semi-quantitative approach to recent developments in the study of optical properties of condensed matter systems Featuring contributions by noted experts in the field of electronic and optoelectronic materials and photonics, this book looks at the optical properties of materials as well as their physical processes and various classes. Taking a semi-quantitative approach to the subject, it presents a summary of the basic concepts, reviews recent developments in the study of optical properties of materials and offers many examples and applications. Optical Properties of Materials and Their Applications, 2nd Edition starts by identifying the processes that should be described in detail and follows with the relevant classes of materials. In addition to featuring four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry, the book covers: optical properties of disordered condensed matter and glasses; concept of excitons; photoluminescence, photoinduced changes, and electroluminescence in noncrystalline semiconductors; and photoinduced bond breaking and volume change in chalcogenide glasses. Also included are chapters on: nonlinear optical properties of photonic glasses; kinetics of the persistent photoconductivity in crystalline III-V semiconductors; and transparent white OLEDs. In addition, readers will learn about excitonic processes in quantum wells; optoelectronic properties and applications of quantum dots; and more. Covers all of the fundamentals and applications of optical properties of materials Includes theory, experimental techniques, and current and developing applications Includes four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry Appropriate for materials scientists, chemists, physicists and electrical engineers involved in development of electronic materials Written by internationally respected professionals working in physics and electrical engineering departments and government laboratories Optical Properties of Materials and Their Applications, 2nd Edition is an ideal book for senior undergraduate and postgraduate students, and teaching and research professionals in the fields of physics, chemistry, chemical engineering, materials science, and materials engineering.

Practical Production of Optical Thin Films

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Publisher : Lulu.com
ISBN 13 : 1365536130
Total Pages : 742 pages
Book Rating : 4.3/5 (655 download)

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Book Synopsis Practical Production of Optical Thin Films by : Ronald R. Willey

Download or read book Practical Production of Optical Thin Films written by Ronald R. Willey and published by Lulu.com. This book was released on 2016-11-15 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with the typical equipment, materials, processes, monitoring, and control used in the practical fabrication/production of optical thin films. It focuses on the practical elements needed to actually produce optical coatings.

Ion Implantation

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Publisher : BoD – Books on Demand
ISBN 13 : 9535106341
Total Pages : 452 pages
Book Rating : 4.5/5 (351 download)

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Book Synopsis Ion Implantation by : Mark Goorsky

Download or read book Ion Implantation written by Mark Goorsky and published by BoD – Books on Demand. This book was released on 2012-05-30 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ion implantation presents a continuously evolving technology. While the benefits of ion implantation are well recognized for many commercial endeavors, there have been recent developments in this field. Improvements in equipment, understanding of beam-solid interactions, applications to new materials, improved characterization techniques, and more recent developments to use implantation for nanostructure formation point to new directions for ion implantation and are presented in this book.

Ellipsometry in the Measurement of Surfaces and Thin Films

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Publisher :
ISBN 13 :
Total Pages : 366 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Ellipsometry in the Measurement of Surfaces and Thin Films by : Elio Passaglia

Download or read book Ellipsometry in the Measurement of Surfaces and Thin Films written by Elio Passaglia and published by . This book was released on 1964 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Practical Design of Optical Thin Films, Fifth Edition

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Publisher : Lulu.com
ISBN 13 : 1387526359
Total Pages : 487 pages
Book Rating : 4.3/5 (875 download)

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Book Synopsis Practical Design of Optical Thin Films, Fifth Edition by : Ronald R Willey

Download or read book Practical Design of Optical Thin Films, Fifth Edition written by Ronald R Willey and published by Lulu.com. This book was released on 2018-01-18 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with the basic fundamentals, understanding, and design of optical thin films, or interference coatings for practical production. It focuses on one of the main subjects that is critical to meeting the practical challenges of producing optical coatings. This is the design of coatings, an understanding of which allows the practitioner to know the possibilities and limitations involved in reducing, enhancing, or otherwise controlling the reflection, transmission, and absorption of light (visible or otherwise). This Fifth Edition now includes measurement of index, thickness, and color; the determination of tooling factors; and the programming of Macros, Workbooks, and FilmStar Basic.

Instruments of Science

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Publisher : Taylor & Francis
ISBN 13 : 9780815315612
Total Pages : 740 pages
Book Rating : 4.3/5 (156 download)

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Book Synopsis Instruments of Science by : Robert Bud

Download or read book Instruments of Science written by Robert Bud and published by Taylor & Francis. This book was released on 1998 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: With over 300 entries from the ancient abacus to X-ray diffraction, as represented by a ca. 1900 photo of an X- ray machine as well as the latest research into filmless x- ray systems, this tour of the history of scientific instruments in multiple disciplines provides context and a bibliography for each entry. Newer conceptions of "instrument" include organisms widely used in research: e.g. the mouse, drosophila, and E. coli. Bandw photographs and diagrams showcase more traditional instruments from The Science Museum, London, and the Smithsonian's National Museum of American History. Annotation copyrighted by Book News, Inc., Portland, OR

Theory of Reflection

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Publisher : Springer
ISBN 13 : 331923627X
Total Pages : 538 pages
Book Rating : 4.3/5 (192 download)

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Book Synopsis Theory of Reflection by : John Lekner

Download or read book Theory of Reflection written by John Lekner and published by Springer. This book was released on 2016-01-13 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with the reflection of electromagnetic and particle waves by interfaces. The interfaces can be sharp or diffuse. The topics of the book contain absorption, inverse problems, anisotropy, pulses and finite beams, rough surfaces, matrix methods, numerical methods, reflection of particle waves and neutron reflection. Exact general results are presented, followed by long wave reflection, variational theory, reflection amplitude equations of the Riccati type, and reflection of short waves. The Second Edition of the Theory of Reflection is an updated and much enlarged revision of the 1987 monograph. There are new chapters on periodically stratified media, ellipsometry, chiral media, neutron reflection and reflection of acoustic waves. The chapter on anisotropy is much extended, with a complete treatment of the reflection and transmission properties of arbitrarily oriented uniaxial crystals. The book gives a systematic and unified treatment reflection and transmission of electromagnetic and particle waves at interfaces. It is intended for physicists, chemists, applied mathematicians and engineers, and is written in a simple direct style, with all necessary mathematics explained in the text.