Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Download Secondary Ion Mass Spectrometry Sims Ii Proceedings Of The 2 International Conference On Secondary Ion Mass Spectrometry Sims Ii full books in PDF, epub, and Kindle. Read online Secondary Ion Mass Spectrometry Sims Ii Proceedings Of The 2 International Conference On Secondary Ion Mass Spectrometry Sims Ii ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642618715
Total Pages : 310 pages
Book Rating : 4.6/5 (426 download)
Download or read book Secondary Ion Mass Spectrometry SIMS II written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Newnes
ISBN 13 : 0080913253
Total Pages : 407 pages
Book Rating : 4.0/5 (89 download)
Download or read book The Encyclopedia of Mass Spectrometry written by and published by Newnes. This book was released on 2015-12-04 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume 9: Historical Perspectives, Part A: The Development of Mass Spectrometry of The Encyclopedia of Mass Spectrometry describes and analyzes the development of many aspects of Mass Spectrometry. Beginning with the earliest types of Mass Analyzers, Historical Perspectives explores the development of many different forms of analytical processes and methods. The work follows various instruments and interfaces, to the current state of detectors and computerization. It traces the use of Mass Spectrometry across many different disciplines, including Organic Chemistry, Biochemistry, and Proteomics; Environmental Mass Spectrometry; Forensic Science; Imaging; Medical Monitoring and Diagnosis; Earth and Planetary Sciences; and Nuclear Science. Finally, the book covers the history of manufacturers and societies as well as the professionals who form the Mass Spectrometry community. Also available: Volume 9: Historical Perspectives, Part B: Notable People in Mass Spectrometry briefly reviews the lives and works of many of the major people who carried out this development. Preserves the history and development of Mass Spectrometry for use across scientific fields Written and edited by Mass Spectrometry experts Coordinates with Volume 9: Historical Perspectives, Part B: Notable People in Mass Spectrometry, a collection of short biographies on many of the major people who carried out this development
Author : David M. Lubman
Publisher : Oxford University Press
ISBN 13 : 0195363140
Total Pages : 560 pages
Book Rating : 4.1/5 (953 download)
Download or read book Lasers and Mass Spectrometry written by David M. Lubman and published by Oxford University Press. This book was released on 1990-04-12 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contributors to this volume focus on the fundamentals of the technique of analyzing material based on the atomic weight of the species, using the power and definition of lasers to enable measurement of smaller quantities and more finely localized particles. Each chapter deals with a particular application area and should be sufficient to form an entry point for the utilization of mass spectrometry by graduate students and researchers. The book provides the first full discussion of the new techniques of laser applications in the field.
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642822568
Total Pages : 518 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS IV written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.
Author : E.E. Nikitin
Publisher : Springer Science & Business Media
ISBN 13 : 364282045X
Total Pages : 445 pages
Book Rating : 4.6/5 (428 download)
Download or read book Theory of Slow Atomic Collisions written by E.E. Nikitin and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 445 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theory of atom-molecule collisions is one of the basic fields in chemi cal physics. Its most challenging part - the dynamics of chemical reactions - is as yet unresolved, but is developing very quickly. It is here a great help to have an analysis of those parts of collision theory which are already complete, a good example being the theory of atomic collisions in process es specific to chemical physics. It has long been observed that many notions of this theory can also be applied successfully to reactive and unreactive molecular collisions. More over, atomic collisions often represent a touchstone in testing approaches proposed for the solution of more complicated problems. Research on the theory of slow atomic collisions carried out at the Moscow Institute of Chemical Physics has been based on just these ideas. A general viewpoint concerning the setting up and representation of the theory came out of these studies, and appeared to be useful in studying complicated systems as well. It underlies the representation of the theory of slow atomic colli sions in this book.
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642871488
Total Pages : 279 pages
Book Rating : 4.6/5 (428 download)
Download or read book Ion Formation from Organic Solids written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Second International Conference on Ion Formation from Organic Solids (IFOS II) was held at the University of MUnster, Federal Republic of Germa ny, from September 7 to 9, 1982. The subject of the conference was the rapid ly developing field of ion formation from ~nvolatile, thermally labile organ ic compounds. Rapid progress has been made in this field in the last few years, mainly because of the discovery of unexpected new ionization proces ses such as sputtering and laser-induced desorption. The aim of the conference was twofold: to acquire a basic understanding of these "soft" ionization processes on the one hand, and to examine their present and future analytical applications on the other. ~Je sought to bring. together scientists working in fundamental as well as applied research. The participants represented such widely varied fields as pure and applied phys ics and chemistry, biochemistry, nuclear and solid-state physics, medicine, and pharmacology. These proceedings contain all of the papers presented at the conference. Six review papers cover the fundamentals of different ionization processes. The authors of these reviews were asked to give up-to-date surveys in cluding characteristics of spectra, the influence of excitation parameters, tentative models for ion formation processes, and assessments of their ana lytical applications. These reviews are followed by 26 contributed papers dealing with more specialized aspects of the ionization processes and their analytical applications.
Author : Christopher Barshick
Publisher : CRC Press
ISBN 13 : 9780824702434
Total Pages : 538 pages
Book Rating : 4.7/5 (24 download)
Download or read book Inorganic Mass Spectrometry written by Christopher Barshick and published by CRC Press. This book was released on 2000-02-18 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing a theoretical background for inorganic mass spectrometry, this text describes classical applications of four modern mass spectrometers - magnetic sector, quadrupole, time-of-flight, and ion trap - and illustrates how they have impacted elemental and isotopic analysis. The book features examples that concentrate on routine and non-routine applications of inorganic analysis techniques.
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642881521
Total Pages : 455 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS III written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 455 pages. Available in PDF, EPUB and Kindle. Book excerpt: Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Author : Alfred Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642827241
Total Pages : 578 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS V written by Alfred Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 578 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author : M. Schulz
Publisher : Springer Science & Business Media
ISBN 13 : 3642682472
Total Pages : 323 pages
Book Rating : 4.6/5 (426 download)
Download or read book Insulating Films on Semiconductors written by M. Schulz and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 323 pages. Available in PDF, EPUB and Kindle. Book excerpt: The INFOS 81 Conference on Insulating Films on Semiconductors was held at the University of Erlangen-NUrnberg in Erlangen from 27 to 29 April 1981. This conference was a sequel to the first conference INFOS 79 held in Durham. INFOS 81 attracted 170 participants from universities, research institutes and industry. Attendants were registered from 15 nations. The biannual topical conference series will be continued by INFOS 83 to be held in Eindhoven, The Netherlands, in April 1983. The conference proceedings include all the invited (Y) and contrlDUtea (42) papers presented at the meeting. The topics range from the basic physical understanding of the properties of insulating films and their interface to semiconductors to the discussion of stability and dielectric strength as well as growing and deposition techniques which are relevant for technical applications. Strong emphasis was given to the semiconductor silicon and its native oxide; however, sessions on compound semiconductors and other insulating films also raised strong interest. The proceedings survey the present state of our understanding of the system of insulating films on semiconductors. As a new aspect of the topic, the properties of semiconductors deposited and laser processed on insulating films was in cluded for the first time.
Author : Gustaaf van Tendeloo
Publisher : John Wiley & Sons
ISBN 13 : 3527317066
Total Pages : 1484 pages
Book Rating : 4.5/5 (273 download)
Download or read book Handbook of Nanoscopy, 2 Volume Set written by Gustaaf van Tendeloo and published by John Wiley & Sons. This book was released on 2012-05-21 with total page 1484 pages. Available in PDF, EPUB and Kindle. Book excerpt: This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.
Author : Christine M. Mahoney
Publisher : John Wiley & Sons
ISBN 13 : 1118589246
Total Pages : 325 pages
Book Rating : 4.1/5 (185 download)
Download or read book Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and published by John Wiley & Sons. This book was released on 2013-04-17 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Author : H. Ryssel
Publisher : Springer Science & Business Media
ISBN 13 : 3642687792
Total Pages : 377 pages
Book Rating : 4.6/5 (426 download)
Download or read book Ion Implantation Techniques written by H. Ryssel and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 377 pages. Available in PDF, EPUB and Kindle. Book excerpt: In recent years, ion implantation has developed into the major doping technique for integrated circuits. Several series of conferences have dealt with the application of ion implantation to semiconductors and other materials (Thousand Oaks 1970, Garmisch-Partenkirchen 1971, Osaka 1974, Warwick 1975, Boulder 1976, Budapest 1978, and Albany 1980). Another series of conferences was devoted more to implantation equipment and tech niques (Salford 1977, Trento 1978, and Kingston 1980). In connection with the Third International Conference on Ion Implantation: Equipment and Tech niques, held at Queen's University, ' Kingston, Ontario, Canada, July 8-11, 1980, a two-day instructional program was organized parallel to an implan tation conference for the first time. This implantation school concentra ted on aspects of implantation-equipment design. This book contains all lectures presented at the International Ion Implantation School organized in connection with the Fourth International Conference on Ion Implantation: Equipment and Techniques, held at the Convention Center, Berchtesgaden, Germany, September 13-17, 1982. In con trast to the first .school, the main emphasis in thiS school was placed on practical aspects of implanter operation and application. In three chap ters, various machine aspects of ion implantation (general concepts, ion sources, safety, calibration, dOSimetry), range distributions (stopping power, range profiles), and measuring techniques (electrical and nonelec tri ca 1 measu ri ng techni ques, annea 1 i ng) are di scussed. In the appendi x, a review of the state of the art in modern implantation equipment is given.
Author : Dinesh C. Gupta
Publisher : ASTM International
ISBN 13 : 0803104596
Total Pages : 701 pages
Book Rating : 4.8/5 (31 download)
Download or read book Emerging Semiconductor Technology written by Dinesh C. Gupta and published by ASTM International. This book was released on 1987 with total page 701 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Peter Ingram
Publisher : Academic Press
ISBN 13 : 0080524567
Total Pages : 573 pages
Book Rating : 4.0/5 (85 download)
Download or read book Biomedical Applications of Microprobe Analysis written by Peter Ingram and published by Academic Press. This book was released on 1999-10-29 with total page 573 pages. Available in PDF, EPUB and Kindle. Book excerpt: Biomedical Applications of Microprobe Analysis is a combination reference/laboratory manual for the use of microprobe analysis in both clinical diagnostic and research settings. Also called microchemical microscopy, microprobe analysis uses high-energy bombardment of cells and tissue, in combination with high resolution EM or confocal microscopy to provide a profile of the ion, metal, and mineral concentrations present in a sample. This allows insight into the physiology and pathophysiology of a wide variety of cells and tissues.This book describes methods for obtaining detailed information about the identity and composition of particles too small to be seen with the naked eye and describes how this information can be useful in diagnostic and biomedical research. - Up-to-date review of electron microprobe analysis - Detailed descriptions of sample preparation techniques - Recent technologies including confocal microscopy, infrared microspectroscopy, and laser raman spectroscopy - Over 100 illustrations with numerous specific applications - Contributions by world-renowned experts in the field - Brief summary of highlights precedes each chapter
Author : R. Hochstrasser
Publisher : Springer Science & Business Media
ISBN 13 : 364287861X
Total Pages : 382 pages
Book Rating : 4.6/5 (428 download)
Download or read book Picosecond Phenomena II written by R. Hochstrasser and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: The second international conference on the subject of Picosecond Phenomena was held June 18-20, 1980, in Cape Cod, Massachusetts. Scientists from a broad range of disciplines were brought together to discuss their common interest in ultrafast processes. This meeting was organized as a Topical Meeting of the Optical Society of America and was attended by 250 partici pants. The conference reviewed the latest advances in the experimental and theo retical understanding of phenomena that occur on a picosecond timescale. New discoveries in electronics, chemical dynamics, solid state physics, and pico second optics highlighted the interactions between chemists, physicists, biologists,and engineers who attended the conference. The enthusia~m gener ated by the rapid progress in the last two years and the pleasant Cape Cod weather resulted in a successful and enjoyable conference. The conference owes a special thanks to Dr. Jarus Quinn, Joan Connon, and their colleagues at the Optical Society of America for doing a superb job in implementing the meeting arrangements and to the program committee for the selection and organization of the technical presentations. We gratefully acknowledge the financial support from the National Science Foundation, Office of Naval Research, the u.S. Army Research Office, and the AFOSR.
Author : Mike S. Lee
Publisher : John Wiley & Sons
ISBN 13 : 1118180720
Total Pages : 1362 pages
Book Rating : 4.1/5 (181 download)
Download or read book Mass Spectrometry Handbook written by Mike S. Lee and published by John Wiley & Sons. This book was released on 2012-04-16 with total page 1362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.
