An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

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Author :
Publisher : Morgan & Claypool Publishers
ISBN 13 : 1681740885
Total Pages : 67 pages
Book Rating : 4.6/5 (817 download)

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Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by : Sarah Fearn

Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science written by Sarah Fearn and published by Morgan & Claypool Publishers. This book was released on 2015-10-16 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

ToF-SIMS

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Publisher : IM Publications
ISBN 13 : 1906715173
Total Pages : 742 pages
Book Rating : 4.9/5 (67 download)

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Book Synopsis ToF-SIMS by : J. C. Vickerman

Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

Microbeam and Nanobeam Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 3709165555
Total Pages : 628 pages
Book Rating : 4.7/5 (91 download)

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Book Synopsis Microbeam and Nanobeam Analysis by : Daniele Benoit

Download or read book Microbeam and Nanobeam Analysis written by Daniele Benoit and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.

Secondary Ion Mass Spectrometry by Time-of-flight

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Publisher :
ISBN 13 :
Total Pages : 129 pages
Book Rating : 4.:/5 (184 download)

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Book Synopsis Secondary Ion Mass Spectrometry by Time-of-flight by : Erich Werner Ens

Download or read book Secondary Ion Mass Spectrometry by Time-of-flight written by Erich Werner Ens and published by . This book was released on 1984 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Secondary Ion Mass Spectrometry SIMS V

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Publisher : Springer Science & Business Media
ISBN 13 : 3642827241
Total Pages : 578 pages
Book Rating : 4.6/5 (428 download)

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Book Synopsis Secondary Ion Mass Spectrometry SIMS V by : Alfred Benninghoven

Download or read book Secondary Ion Mass Spectrometry SIMS V written by Alfred Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 578 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.

Secondary Ion Mass Spectrometry by Time-of-flight

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (13 download)

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Book Synopsis Secondary Ion Mass Spectrometry by Time-of-flight by : Erich Werner Ens

Download or read book Secondary Ion Mass Spectrometry by Time-of-flight written by Erich Werner Ens and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Practice of TOF-SIMS

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Author :
Publisher : Momentum Press
ISBN 13 : 1606507745
Total Pages : 267 pages
Book Rating : 4.6/5 (65 download)

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Book Synopsis The Practice of TOF-SIMS by : Alan M. Spool

Download or read book The Practice of TOF-SIMS written by Alan M. Spool and published by Momentum Press. This book was released on 2016-03-24 with total page 267 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.

Chemical Imaging Analysis

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Publisher : Elsevier
ISBN 13 : 0444634509
Total Pages : 493 pages
Book Rating : 4.4/5 (446 download)

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Book Synopsis Chemical Imaging Analysis by : Freddy Adams

Download or read book Chemical Imaging Analysis written by Freddy Adams and published by Elsevier. This book was released on 2015-06-06 with total page 493 pages. Available in PDF, EPUB and Kindle. Book excerpt: Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. - Provides comprehensive coverage of analytical techniques used in chemical imaging analysis - Explores a variety of specialized techniques - Provides a general overview of imaging techniques in diverse fields

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science

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Author :
Publisher : Myprint
ISBN 13 : 9781681747385
Total Pages : 68 pages
Book Rating : 4.7/5 (473 download)

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Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science by : S Fearn

Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science written by S Fearn and published by Myprint. This book was released on 2015-10-05 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry

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Author :
Publisher : Springer Nature
ISBN 13 : 3658285028
Total Pages : 195 pages
Book Rating : 4.6/5 (582 download)

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Book Synopsis Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry by : Danica Heller-Krippendorf

Download or read book Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry written by Danica Heller-Krippendorf and published by Springer Nature. This book was released on 2019-10-31 with total page 195 pages. Available in PDF, EPUB and Kindle. Book excerpt: Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. ​About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.

Secondary Ion Mass Spectrometry

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Publisher : Oxford University Press, USA
ISBN 13 :
Total Pages : 368 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Secondary Ion Mass Spectrometry by : J. C. Vickerman

Download or read book Secondary Ion Mass Spectrometry written by J. C. Vickerman and published by Oxford University Press, USA. This book was released on 1989 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.

Surface Science and Adhesion in Cosmetics

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Publisher : John Wiley & Sons
ISBN 13 : 1119654823
Total Pages : 720 pages
Book Rating : 4.1/5 (196 download)

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Book Synopsis Surface Science and Adhesion in Cosmetics by : K. L. Mittal

Download or read book Surface Science and Adhesion in Cosmetics written by K. L. Mittal and published by John Wiley & Sons. This book was released on 2021-04-06 with total page 720 pages. Available in PDF, EPUB and Kindle. Book excerpt: Activity in the arena of surface chemistry and adhesion aspects in cosmetics is substantial, but the information is scattered in many diverse publications media and no book exists which discusses surface chemistry and adhesion in cosmetics in unified manner. This book containing 15 chapters written by eminent researchers from academia and industry is divided into three parts: Part 1: General Topics; Part 2: Surface Chemistry Aspects; and Part 3: Wetting and Adhesion Aspects. The topics covered include: Lip biophysical properties and characterization; use of advanced silicone materials in long-lasting cosmetics; non-aqueous dispersions of acrylate copolymers in lipsticks; cosmetic oils in Lipstick structure; chemical structure of the hair surface, surface forces and interactions; AFM for hair surface characterization; application of AFM in characterizing hair, skin and cosmetic deposition; SIMS as a surface analysis method for hair, skin and cosmetics; surface tensiometry approach to characterize cosmetic products; spreading of hairsprays on hair; color transfer from long-wear face foundation products; interaction of polyelectrolytes and surfactants on hair surfaces; cosmetic adhesion to facial skin; and adhesion aspects in semi-permanent mascara; lipstick adhesion measurement.

Surface Analysis

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Publisher :
ISBN 13 :
Total Pages : 457 pages
Book Rating : 4.:/5 (754 download)

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Book Synopsis Surface Analysis by : J. C. Vickerman

Download or read book Surface Analysis written by J. C. Vickerman and published by . This book was released on 1997 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Introduction to Focused Ion Beams

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Publisher : Springer Science & Business Media
ISBN 13 : 038723313X
Total Pages : 362 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Introduction to Focused Ion Beams by : Lucille A. Giannuzzi

Download or read book Introduction to Focused Ion Beams written by Lucille A. Giannuzzi and published by Springer Science & Business Media. This book was released on 2006-05-18 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Encyclopedia of Interfacial Chemistry

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Publisher : Elsevier
ISBN 13 : 0128098945
Total Pages : 5276 pages
Book Rating : 4.1/5 (28 download)

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Book Synopsis Encyclopedia of Interfacial Chemistry by :

Download or read book Encyclopedia of Interfacial Chemistry written by and published by Elsevier. This book was released on 2018-03-29 with total page 5276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Encyclopedia of Interfacial Chemistry: Surface Science and Electrochemistry, Seven Volume Set summarizes current, fundamental knowledge of interfacial chemistry, bringing readers the latest developments in the field. As the chemical and physical properties and processes at solid and liquid interfaces are the scientific basis of so many technologies which enhance our lives and create new opportunities, its important to highlight how these technologies enable the design and optimization of functional materials for heterogeneous and electro-catalysts in food production, pollution control, energy conversion and storage, medical applications requiring biocompatibility, drug delivery, and more. This book provides an interdisciplinary view that lies at the intersection of these fields. Presents fundamental knowledge of interfacial chemistry, surface science and electrochemistry and provides cutting-edge research from academics and practitioners across various fields and global regions

Developments in Surface Contamination and Cleaning

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Publisher : Elsevier
ISBN 13 : 0815516851
Total Pages : 1209 pages
Book Rating : 4.8/5 (155 download)

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Book Synopsis Developments in Surface Contamination and Cleaning by : Rajiv Kohli

Download or read book Developments in Surface Contamination and Cleaning written by Rajiv Kohli and published by Elsevier. This book was released on 2008-01-10 with total page 1209 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface contamination is of cardinal importance in a host of technologies and industries, ranging from microelectronics to optics to automotive to biomedical. Thus, the need to understand the causes of surface contamination and their removal is very patent. Generally speaking, there are two broad categories of surface contaminants: film-type and particulates. In the world of shrinking dimensions, such as the ever-decreasing size of microelectronic devices, there is an intensified need to understand the behavior of nanoscale particles and to devise ways to remove them to an acceptable level. Particles which were functionally innocuous a few years ago are ôkiller defectsö today, with serious implications for yield and reliability of the components. This book addresses the sources, detection, characterization and removal of both kinds of contaminants, as well as ways to prevent surfaces from being contaminated. A number of techniques to monitor the level of cleanliness are also discussed. Special emphasis is placed on the behaviour of nanoscale particles. The book is amply referenced and profusely illustrated.• Excellent reference for a host of technologies and industries ranging from microelectronics to optics to automotive to biomedical.• A single source document addressing everything from the sources of contamination to their removal and prevention.• Amply referenced and profusely illustrated.

Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry

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Publisher :
ISBN 13 :
Total Pages : 280 pages
Book Rating : 4.:/5 (495 download)

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Book Synopsis Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry by : Robert Dale English

Download or read book Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry written by Robert Dale English and published by . This book was released on 2001 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: