Physics at Surfaces

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Publisher : Cambridge University Press
ISBN 13 : 1316583260
Total Pages : 470 pages
Book Rating : 4.3/5 (165 download)

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Book Synopsis Physics at Surfaces by : Andrew Zangwill

Download or read book Physics at Surfaces written by Andrew Zangwill and published by Cambridge University Press. This book was released on 1988-03-24 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physics at Surfaces is a unique graduate-level introduction to the physics and chemical physics of solid surfaces, and atoms and molecules that interact with solid surfaces. A subject of keen scientific inquiry since the last century, surface physics emerged as an independent discipline only in the late 1960s as a result of the development of ultra-high vacuum technology and high speed digital computers. With these tools, reliable experimental measurements and theoretical calculations could at last be compared. Progress in the last decade has been truly striking. This volume provides a synthesis of the entire field of surface physics from the perspective of a modern condensed matter physicist with a healthy interest in chemical physics. The exposition intertwines experiment and theory whenever possible, although there is little detailed discussion of technique. This much-needed text will be invaluable to graduate students and researchers in condensed matter physics, physical chemistry and materials science working in, or taking graduate courses in, surface science.

Scanning Tunneling Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 9401118124
Total Pages : 275 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Scanning Tunneling Microscopy by : H. Neddermeyer

Download or read book Scanning Tunneling Microscopy written by H. Neddermeyer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.

Scanning Tunneling Microscopy Studies of Nano-scale Properties of III/V Semiconductor Heterostructures

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Publisher :
ISBN 13 :
Total Pages : 380 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Scanning Tunneling Microscopy Studies of Nano-scale Properties of III/V Semiconductor Heterostructures by : Songlin Zuo

Download or read book Scanning Tunneling Microscopy Studies of Nano-scale Properties of III/V Semiconductor Heterostructures written by Songlin Zuo and published by . This book was released on 2001 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Atomic Force Microscopy/Scanning Tunneling Microscopy

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1475793227
Total Pages : 431 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy by : M.T. Bray

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by M.T. Bray and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

STM and SFM in Biology

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Publisher : Academic Press
ISBN 13 : 0323138853
Total Pages : 344 pages
Book Rating : 4.3/5 (231 download)

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Book Synopsis STM and SFM in Biology by : Othmar Marti

Download or read book STM and SFM in Biology written by Othmar Marti and published by Academic Press. This book was released on 2012-12-02 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: STM and SFM in Biology is a book fully dedicated to biological applications of the new technology of scanning probe microscopy (SX). The scanning tunneling microscope (STM) and its first off-spring, the scanning force microscope (SFM), resolve surface topography at the atomic scale. They also detect certain electronic and mechanical properties, and perform well in ultrahigh vacuum, ambient atmosphere, and aqueous solution environments. Thus, STM and SFM offer powerful tools for biological investigations of nucleic acids, proteins, membranes, and living cells. - Introduces the reader to SXM - Presents fundamentals of STM, SFM, and other SXMs - Covers biological applications of STM and SFM - Describes experimental techniques that can be reproduced in the laboratory - Contains extended bibliographies that guide the reader to detailed source publications

Atomic and Nanometer-Scale Modification of Materials

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Publisher : Springer Science & Business Media
ISBN 13 : 9401120242
Total Pages : 344 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Atomic and Nanometer-Scale Modification of Materials by : P. Avouris

Download or read book Atomic and Nanometer-Scale Modification of Materials written by P. Avouris and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the conference on "Atomic and Nanometer Scale Modification of Materials: Fundamentals and Applications" which was co-sponsored by NATO and the Engineering Foundation, and took place in Ventura, California in August 1992. The goal of the organizers was to bring together and facilitate the exchange of information and ideas between researchers involved in the development of techniques for nanometer-scale modification and manipulation. theorists investigating the fundamental mech anisms of the processes involved in modification, and scientists studying the properties and applications of nanostructures. About seventy scientists from all over the world participated in the conference. It has been more than 30 years since Richard Feynman wrote his prophetic article: ''There is Plenty of Room at the Bottom" (Science and Engineering, 23, 22, 1960). In it he predicted that some day we should be able to store bits of information in structures composed of only 100 atoms or so, and thus be able to write all the information accumulated in all the books in the world in a cube of material one two-hundredths of an inch high. He went on to say, "the prin ciples of physics, as far as I can see, do not speak against the possibility of maneuvering things atom by atom. " Since that time there has been significant progress towards the realization of Feynman's dreams.

Semiconductor Interfaces at the Sub-Nanometer Scale

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Publisher : Springer Science & Business Media
ISBN 13 : 940112034X
Total Pages : 252 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Semiconductor Interfaces at the Sub-Nanometer Scale by : H.W.M Salemink

Download or read book Semiconductor Interfaces at the Sub-Nanometer Scale written by H.W.M Salemink and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Sub-Nanometer Scale was held from 31 August to 2 September, 1992, in Riva del Garda. Italy. The aim of the workshop was to bring together experts in different aspects of the study of semiconductor interfaces and in small-scale devices where the interface properties can be very significant It was our aim that this would help focus research of the growth and characterization of semiconductor interfaces at the atomic scale on the issues that will have the greatest impact on devices of the future. Some 30 participants from industrial and academic research institutes and from 11 countries contributed to the workshop with papers on their recent wode. . 'There was ample time for discussion after each talk. as well as a summary discussion at the end of the meeting. The major themes of the meeting are described below. The meeting included several talks relating to the different growth techniques used in heteroepitaxial growth of semiconductors. Horikoshi discussed the atomistic processes involved in MBE, MEE and MOCVD, presenting results of experimental RHEED and photoluminescence measurements; Foxon compared the merits of MBE, MOCVD, and eBE growth; Molder described RHEED studies of Si/Ge growth by GSMBE, and Pashley discussed the role of surface reconstructions in MBE growth as seen from STM studies on GaAs. On the theoretical side, Vvedensky described several different methods to model growth: molecular dynamics, Monte Carlo techniques, and analytic modeling.

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1475793251
Total Pages : 243 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 2 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Scientific and Technical Aerospace Reports

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Author :
Publisher :
ISBN 13 :
Total Pages : 1096 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1991 with total page 1096 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale

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Publisher : Springer Science & Business Media
ISBN 13 : 9401157243
Total Pages : 138 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale by : R. Rosei

Download or read book Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale written by R. Rosei and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis. The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.

Microsystems and Nanotechnology

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Publisher : Springer Science & Business Media
ISBN 13 : 3642182933
Total Pages : 1011 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Microsystems and Nanotechnology by : Zhaoying Zhou

Download or read book Microsystems and Nanotechnology written by Zhaoying Zhou and published by Springer Science & Business Media. This book was released on 2012-08-30 with total page 1011 pages. Available in PDF, EPUB and Kindle. Book excerpt: “Microsystems and Nanotechnology” presents the latest science and engineering research and achievements in the fields of microsystems and nanotechnology, bringing together contributions by authoritative experts from the United States, Germany, Great Britain, Japan and China to discuss the latest advances in microelectromechanical systems (MEMS) technology and micro/nanotechnology. The book is divided into five parts – the fundamentals of microsystems and nanotechnology, microsystems technology, nanotechnology, application issues, and the developments and prospects – and is a valuable reference for students, teachers and engineers working with the involved technologies. Professor Zhaoying Zhou is a professor at the Department of Precision Instruments & Mechanology , Tsinghua University , and the Chairman of the MEMS & NEMS Society of China. Dr. Zhonglin Wang is the Director of the Center for Nanostructure Characterization, Georgia Tech, USA. Dr. Liwei Lin is a Professor at the Department of Mechanical Engineering, University of California at Berkeley, USA.

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

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Publisher : Springer Science & Business Media
ISBN 13 : 0306470950
Total Pages : 208 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 3 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

High Pressure Scanning Tunneling Microscopy Studies of Adsorbate Structure and Mobility During Catalytic Reactions

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Publisher :
ISBN 13 :
Total Pages : 562 pages
Book Rating : 4.:/5 (35 download)

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Book Synopsis High Pressure Scanning Tunneling Microscopy Studies of Adsorbate Structure and Mobility During Catalytic Reactions by : David Chi-Wai Tang

Download or read book High Pressure Scanning Tunneling Microscopy Studies of Adsorbate Structure and Mobility During Catalytic Reactions written by David Chi-Wai Tang and published by . This book was released on 2005 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Tunneling Microscopy II

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Publisher : Springer Science & Business Media
ISBN 13 : 3642793665
Total Pages : 359 pages
Book Rating : 4.6/5 (427 download)

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Book Synopsis Scanning Tunneling Microscopy II by : Roland Wiesendanger

Download or read book Scanning Tunneling Microscopy II written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.

Springer Handbook of Microscopy

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Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)

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Book Synopsis Springer Handbook of Microscopy by : Peter W. Hawkes

Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

A Laboratory Course in Nanoscience and Nanotechnology

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Publisher : CRC Press
ISBN 13 : 1482231042
Total Pages : 254 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis A Laboratory Course in Nanoscience and Nanotechnology by : Gerrard Eddy Jai Poinern

Download or read book A Laboratory Course in Nanoscience and Nanotechnology written by Gerrard Eddy Jai Poinern and published by CRC Press. This book was released on 2014-12-06 with total page 254 pages. Available in PDF, EPUB and Kindle. Book excerpt: Although there are many theoretical nanotechnology and nanoscience textbooks available to students, there are relatively few practical laboratory-based books. Filling this need, A Laboratory Course in Nanoscience and Nanotechnology presents a hands-on approach to key synthesis techniques and processes currently used in nanotechnology and nanoscienc

Surface Analysis with STM and AFM

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Publisher : John Wiley & Sons
ISBN 13 : 3527615105
Total Pages : 335 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Surface Analysis with STM and AFM by : Sergei N. Magonov

Download or read book Surface Analysis with STM and AFM written by Sergei N. Magonov and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.