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Reliability Physics Symposium 1980 18th Annual
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Book Synopsis Reliability Physics Symposium, 1980. 18th Annual by : Institute of Electrical and Electronics Engineers
Download or read book Reliability Physics Symposium, 1980. 18th Annual written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1980 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis 18th annual proceedings reliability physics 1980 : Las Vegas, Nevada, April 8 - 10, 1980 by : IEEE Electron Devices Society
Download or read book 18th annual proceedings reliability physics 1980 : Las Vegas, Nevada, April 8 - 10, 1980 written by IEEE Electron Devices Society and published by . This book was released on 1980 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability Physics (18th Annual Proceedings 1980) Las Vegas, April 8-10, 1980 by : Reliability Physics
Download or read book Reliability Physics (18th Annual Proceedings 1980) Las Vegas, April 8-10, 1980 written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1980 written by and published by . This book was released on 1980 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability Assessments by : Franklin Richard Nash, Ph.D.
Download or read book Reliability Assessments written by Franklin Richard Nash, Ph.D. and published by CRC Press. This book was released on 2017-07-12 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.
Book Synopsis Product Reliability, Maintainability, and Supportability Handbook by : Michael Pecht
Download or read book Product Reliability, Maintainability, and Supportability Handbook written by Michael Pecht and published by CRC Press. This book was released on 1995-05-04 with total page 450 pages. Available in PDF, EPUB and Kindle. Book excerpt: This unique publication addresses the role of reliability, maintainability, and supportability in the life-cycle of a product, in the context of product effectiveness and worth. It emphasizes all aspects of producing an effective electrical or mechanical system. This is the only handbook available on this subject and the only book that is this comprehensive and informative. The Product Reliability, Maintainability, and Supportability Handbook examines the logistics, cost, and the physics of failure-topics never before found in a single volume on reliability. It describes the factors that affect product effectiveness and worth: performance, reliability, design effectiveness and margin for error, availability, affordability, use effectiveness, and logistic effectiveness. The handbook contains 13 in-depth chapters, opening with an introduction on product effectiveness and worth and concluding with reliability and maintainability data that can be combined with performance data to assess overall effectiveness of the product. The pages are filled with valuable information that can be easily and quickly put to practical use. Basic principles of the mathematical theory of probability and necessary background are provided. Concepts and basic theory of reliability in terms of probability and statistical inference are also given. Techniques for deriving probabilistic models from observational data as well as reliability models and associated validation techniques are detailed. Software and software reliability, quality, and safety are all covered, including the development life-cycle process and mechanisms by which software errors are introduced. The book presents design guidelines and techniques and the requirements for materials, manufacturing, and assembly. Learn how to analyze the reliability of redundant and fault-tolerant products. Use the methods for modeling and analyzing failures of repairable products that normally exhibit wearout characteristics. The Product Reliability, Maintainability, and Supportability Handbook also provides reliability improvement techniques to improve the competitiveness of existing products. The book includes helpful summaries and numerous problem sections to reinforce and test learned information. This reference source is the guide that professionals and technical managers should turn to when they need a comprehensive and detailed overview of everything that goes into producing systems and products that meet customer needs in an effective and timely manner.
Book Synopsis Reliability Physics 1980: Proc. of 18th Annual Symp. Las Vegas, Nevada, April, 8-10, 1980 by : Institute of Electrical and Electronics Engineers
Download or read book Reliability Physics 1980: Proc. of 18th Annual Symp. Las Vegas, Nevada, April, 8-10, 1980 written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1980 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 18th Annual Proceedings written by and published by . This book was released on 1980 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1986 written by and published by . This book was released on 1986 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis CRC Handbook of Thermal Engineering by : Raj P. Chhabra
Download or read book CRC Handbook of Thermal Engineering written by Raj P. Chhabra and published by CRC Press. This book was released on 2017-11-08 with total page 1801 pages. Available in PDF, EPUB and Kindle. Book excerpt: The CRC Handbook of Thermal Engineering, Second Edition, is a fully updated version of this respected reference work, with chapters written by leading experts. Its first part covers basic concepts, equations and principles of thermodynamics, heat transfer, and fluid dynamics. Following that is detailed coverage of major application areas, such as bioengineering, energy-efficient building systems, traditional and renewable energy sources, food processing, and aerospace heat transfer topics. The latest numerical and computational tools, microscale and nanoscale engineering, and new complex-structured materials are also presented. Designed for easy reference, this new edition is a must-have volume for engineers and researchers around the globe.
Book Synopsis Long-Term Non-Operating Reliability of Electronic Products by : Judy Pecht
Download or read book Long-Term Non-Operating Reliability of Electronic Products written by Judy Pecht and published by CRC Press. This book was released on 2019-07-23 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt: In today's electronic environment, operating reliability for continued daily use of electronic products is essential. This book discusses the reliability of products that lie dormant for long periods of time and are subject to stresses such as humidity, ionic contaminants, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm systems, standby power sources, and burglar alarms. Air bags in automobiles, earthquake alarm systems, and radiation warning systems in nuclear power plants are also covered. This physics-of-failure approach is also important to maintaining defense hardware such as missiles and munitions systems which often lie dormant for years before being deployed on very short notice
Download or read book Reliability Physics 1981 written by and published by . This book was released on 1981 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1984 written by and published by . This book was released on 1984 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Polymer Permeability written by J. Comyn and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 387 pages. Available in PDF, EPUB and Kindle. Book excerpt: Polymers are permeable, whilst ceramics, glasses and metals are gener ally impermeable. This may seem a disadvantage in that polymeric containers may allow loss or contamination of their contents and aggressive substances such as water will diffuse into polymeric struc tures such as adhesive joints or fibre-reinforced composites and cause weakening. However, in some cases permeability is an advantage, and one particular area where this is so is in the use of polymers in drug delivery systems. Also, without permeable polymers, we would not enjoy the wide range of dyed fabrics used in clothing and furnishing. The fundamental reason for the permeability of polymers is their relatively high level of molecular motion, a factor which also leads to their high levels of creep in comparison with ceramics, glasses and metals. The aim of this volume is to examine some timely applied aspects of polymer permeability. In the first chapter basic issues in the mathema tics of diffusion are introduced, and this is followed by two chapters where the fundamental aspects of diffusion in polymers are presented. The following chapters, then, each examine some area of applied science where permeability is a key issue. Each chapter is reasonably self-contained and intended to be informative without frequent outside reference. This inevitably leads to some repetition, but it is hoped that this is not excessive.
Book Synopsis Influence of Temperature on Microelectronics and System Reliability by : Pradeep Lall
Download or read book Influence of Temperature on Microelectronics and System Reliability written by Pradeep Lall and published by CRC Press. This book was released on 2020-07-09 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The
Download or read book Reliability Physics ... written by and published by . This book was released on 1980 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Eighteenth Annual Proceedings on Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980 by : IEEE Reliability Society
Download or read book Eighteenth Annual Proceedings on Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980 written by IEEE Reliability Society and published by . This book was released on 1980 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt:
