Quantitative Atomic-Resolution Electron Microscopy

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Author :
Publisher : Academic Press
ISBN 13 : 0323850936
Total Pages : 296 pages
Book Rating : 4.3/5 (238 download)

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Book Synopsis Quantitative Atomic-Resolution Electron Microscopy by :

Download or read book Quantitative Atomic-Resolution Electron Microscopy written by and published by Academic Press. This book was released on 2021-03-31 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

High-Resolution Electron Microscopy for Materials Science

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Publisher : Springer Science & Business Media
ISBN 13 : 4431684220
Total Pages : 196 pages
Book Rating : 4.4/5 (316 download)

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Book Synopsis High-Resolution Electron Microscopy for Materials Science by : Daisuke Shindo

Download or read book High-Resolution Electron Microscopy for Materials Science written by Daisuke Shindo and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Quantitative high-resolution electron microscopy and holography

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Publisher :
ISBN 13 : 9789062757527
Total Pages : 167 pages
Book Rating : 4.7/5 (575 download)

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Book Synopsis Quantitative high-resolution electron microscopy and holography by : Wilhelmus J. de Ruijter

Download or read book Quantitative high-resolution electron microscopy and holography written by Wilhelmus J. de Ruijter and published by . This book was released on 1992 with total page 167 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Transmission Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 764 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Quantitative Electron Microscopy,

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Author :
Publisher : CRC Press
ISBN 13 :
Total Pages : 472 pages
Book Rating : 4.:/5 (44 download)

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Book Synopsis Quantitative Electron Microscopy, by : J. N. Chapman

Download or read book Quantitative Electron Microscopy, written by J. N. Chapman and published by CRC Press. This book was released on 1984 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Liquid Cell Electron Microscopy

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Publisher : Cambridge University Press
ISBN 13 : 1107116570
Total Pages : 529 pages
Book Rating : 4.1/5 (71 download)

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Book Synopsis Liquid Cell Electron Microscopy by : Frances M. Ross

Download or read book Liquid Cell Electron Microscopy written by Frances M. Ross and published by Cambridge University Press. This book was released on 2017 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2.6.2 Electrodes for Electrochemistry

In-situ Electron Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 3527652183
Total Pages : 403 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis In-situ Electron Microscopy by : Gerhard Dehm

Download or read book In-situ Electron Microscopy written by Gerhard Dehm and published by John Wiley & Sons. This book was released on 2012-05-30 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Quantitative Electron-probe Microanalysis

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Publisher :
ISBN 13 :
Total Pages : 356 pages
Book Rating : 4.:/5 (44 download)

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Book Synopsis Quantitative Electron-probe Microanalysis by : Victor D. Scott

Download or read book Quantitative Electron-probe Microanalysis written by Victor D. Scott and published by . This book was released on 1983 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Springer Handbook of Microscopy

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Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)

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Book Synopsis Springer Handbook of Microscopy by : Peter W. Hawkes

Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Atomic Resolution Microscopy of Surfaces and Interfaces: Volume 466

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Publisher :
ISBN 13 :
Total Pages : 302 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Atomic Resolution Microscopy of Surfaces and Interfaces: Volume 466 by : David J. Smith

Download or read book Atomic Resolution Microscopy of Surfaces and Interfaces: Volume 466 written by David J. Smith and published by . This book was released on 1997-09-05 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.

Quantitative Microbeam Analysis

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Publisher : Routledge
ISBN 13 : 1351420534
Total Pages : 493 pages
Book Rating : 4.3/5 (514 download)

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Book Synopsis Quantitative Microbeam Analysis by : A.G Fitzgerald

Download or read book Quantitative Microbeam Analysis written by A.G Fitzgerald and published by Routledge. This book was released on 2017-07-12 with total page 493 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.

Physical Principles of Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 9780387258003
Total Pages : 224 pages
Book Rating : 4.2/5 (58 download)

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Book Synopsis Physical Principles of Electron Microscopy by : Ray Egerton

Download or read book Physical Principles of Electron Microscopy written by Ray Egerton and published by Springer Science & Business Media. This book was released on 2011-02-11 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Introduction to Conventional Transmission Electron Microscopy

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Publisher : Cambridge University Press
ISBN 13 : 0521620066
Total Pages : 741 pages
Book Rating : 4.5/5 (216 download)

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Book Synopsis Introduction to Conventional Transmission Electron Microscopy by : Marc De Graef

Download or read book Introduction to Conventional Transmission Electron Microscopy written by Marc De Graef and published by Cambridge University Press. This book was released on 2003-03-27 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

Advanced Transmission Electron Microscopy

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Publisher : Springer
ISBN 13 : 1493966073
Total Pages : 729 pages
Book Rating : 4.4/5 (939 download)

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Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo

Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 729 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Scanning Transmission Electron Microscopy

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Publisher : CRC Press
ISBN 13 : 0429512732
Total Pages : 164 pages
Book Rating : 4.4/5 (295 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Alina Bruma

Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.

Impact of Electron and Scanning Probe Microscopy on Materials Research

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Publisher : Springer Science & Business Media
ISBN 13 : 9401144516
Total Pages : 503 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby

Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Electron Microscopy in Science and Engineering

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Publisher : Springer Nature
ISBN 13 : 9811651019
Total Pages : 153 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Electron Microscopy in Science and Engineering by : Krishanu Biswas

Download or read book Electron Microscopy in Science and Engineering written by Krishanu Biswas and published by Springer Nature. This book was released on 2022-02-09 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.