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Author :
Publisher :
ISBN 13 :
Total Pages : 37 pages
Book Rating : 4.:/5 (843 download)
Download or read book Preprints of the International Test Conference 1984 written by and published by . This book was released on 1984 with total page 37 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : G. Russell
Publisher : Springer Science & Business Media
ISBN 13 : 9780747600015
Total Pages : 406 pages
Book Rating : 4.6/5 ( download)
Download or read book Advanced Simulation and Test Methodologies for VLSI Design written by G. Russell and published by Springer Science & Business Media. This book was released on 1989-02-28 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : British Library. Document Supply Centre
Publisher :
ISBN 13 :
Total Pages : 792 pages
Book Rating : 4.3/5 (91 download)
Download or read book Index of Conference Proceedings Received written by British Library. Document Supply Centre and published by . This book was released on 1987 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher : Conference
ISBN 13 :
Total Pages : 1090 pages
Book Rating : 4.:/5 (318 download)
Download or read book International Test Conference, 1993 written by and published by Conference. This book was released on 1993 with total page 1090 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.
Author : British Library. Lending Division
Publisher :
ISBN 13 :
Total Pages : 492 pages
Book Rating : 4.X/5 (4 download)
Download or read book Index of Conference Proceedings Received written by British Library. Lending Division and published by . This book was released on 1988 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Gaynor E. Taylor
Publisher : IET
ISBN 13 : 9780863412677
Total Pages : 298 pages
Book Rating : 4.4/5 (126 download)
Download or read book Algorithmic and Knowledge Based CAD for VLSI written by Gaynor E. Taylor and published by IET. This book was released on 1992 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Samples the present state-of-the-art in CAD for VLSI, covering both newly developed algorithms and applications of techniques from the artificial intelligence community. The material is based on a tutorial course run in conjunction with the 1991 European Conference on Circuit Theory and Design, and should interest engineers involved in the design and testing of integrated circuits and systems. Annotation copyrighted by Book News, Inc., Portland, OR
Author :
Publisher :
ISBN 13 :
Total Pages : 558 pages
Book Rating : 4.3/5 (91 download)
Download or read book Proceedings of the ... European Test Conference written by and published by . This book was released on 1991 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Antonin Kucera
Publisher : Springer
ISBN 13 : 3642360467
Total Pages : 224 pages
Book Rating : 4.6/5 (423 download)
Download or read book Mathematical and Engineering Methods in Computer Science written by Antonin Kucera and published by Springer. This book was released on 2013-01-17 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the post-proceedings of the 8th Doctoral Workshop on Mathematical and Engineering Methods in Computer Science, MEMICS 2012, held in Znojmo, Czech Republic, in October, 2012. The 13 thoroughly revised papers were carefully selected out of 31 submissions and are presented together with 6 invited papers. The topics covered by the papers include: computer-aided analysis and verification, applications of game theory in computer science, networks and security, modern trends of graph theory in computer science, electronic systems design and testing, and quantum information processing.
Author : Prithviraj Kabisatpathy
Publisher : Springer Science & Business Media
ISBN 13 : 0387257438
Total Pages : 183 pages
Book Rating : 4.3/5 (872 download)
Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Author : F.P.M. Beenker
Publisher : Springer Science & Business Media
ISBN 13 : 1461523656
Total Pages : 216 pages
Book Rating : 4.4/5 (615 download)
Download or read book Testability Concepts for Digital ICs written by F.P.M. Beenker and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.
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ISBN 13 :
Total Pages : 618 pages
Book Rating : 4.:/5 (31 download)
Download or read book Fossil Energy Update written by and published by . This book was released on 1985 with total page 618 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 348 pages
Book Rating : 4.:/5 (3 download)
Download or read book Resources in Education written by and published by . This book was released on 1992-02 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Stephen A. Dyer
Publisher : John Wiley & Sons
ISBN 13 : 0471221651
Total Pages : 1096 pages
Book Rating : 4.4/5 (712 download)
Download or read book Wiley Survey of Instrumentation and Measurement written by Stephen A. Dyer and published by John Wiley & Sons. This book was released on 2004-04-07 with total page 1096 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-depth coverage of instrumentation and measurement from the Wiley Encyclopedia of Electrical and Electronics Engineering The Wiley Survey of Instrumentation and Measurement features 97 articles selected from the Wiley Encyclopedia of Electrical and Electronics Engineering, the one truly indispensable reference for electrical engineers. Together, these articles provide authoritative coverage of the important topic of instrumentation and measurement. This collection also, for the first time, makes this information available to those who do not have access to the full 24-volume encyclopedia. The entire encyclopedia is available online-visit www.interscience.wiley.com/EEEE for more details. Articles are grouped under sections devoted to the major topics in instrumentation and measurement, including: * Sensors and transducers * Signal conditioning * General-purpose instrumentation and measurement * Electrical variables * Electromagnetic variables * Mechanical variables * Time, frequency, and phase * Noise and distortion * Power and energy * Instrumentation for chemistry and physics * Interferometers and spectrometers * Microscopy * Data acquisition and recording * Testing methods The articles collected here provide broad coverage of this important subject and make the Wiley Survey of Instrumentation and Measurement a vital resource for researchers and practitioners alike
Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
ISBN 13 : 9781402027857
Total Pages : 240 pages
Book Rating : 4.0/5 (278 download)
Download or read book Embedded Processor-Based Self-Test written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2004-12-20 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Author : Zainalabedin Navabi
Publisher : Springer Science & Business Media
ISBN 13 : 1441975489
Total Pages : 452 pages
Book Rating : 4.4/5 (419 download)
Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Author : 国立国会図書館 (Japan)
Publisher :
ISBN 13 :
Total Pages : 1592 pages
Book Rating : 4.:/5 ( download)
Download or read book 国立国会図書館所蔵科学技術関係欧文会議錄目錄 written by 国立国会図書館 (Japan) and published by . This book was released on 1997 with total page 1592 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Matthew Mahoney
Publisher : John Wiley & Sons
ISBN 13 : 9780818607851
Total Pages : 272 pages
Book Rating : 4.6/5 (78 download)
Download or read book DSP-Based Testing of Analog and Mixed-Signal Circuits written by Matthew Mahoney and published by John Wiley & Sons. This book was released on 1987-05-11 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.
