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Post Silicon Validation And Debug
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Book Synopsis Post-Silicon Validation and Debug by : Prabhat Mishra
Download or read book Post-Silicon Validation and Debug written by Prabhat Mishra and published by Springer. This book was released on 2018-09-01 with total page 393 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.
Book Synopsis QED Post-silicon Validation and Debug by : Hai Lin
Download or read book QED Post-silicon Validation and Debug written by Hai Lin and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: During post-silicon validation and debug, manufactured integrated circuits (ICs) are tested in actual system environments to detect and fix design flaws (bugs). Traditional pre-silicon verification is inadequate; as a result, many critical bugs are detected only after ICs are manufactured (i.e., during post-silicon validation and debug). However, post-silicon validation and debug is challenging because traditional techniques are ad hoc (e.g., insertion of various Design for Debug structures based on various heuristics), and the associated costs are rising faster than design costs. These challenges are further magnified by the slowdown of silicon CMOS scaling, as ICs incorporate tremendous complexity to meet increasing demands for improvements in performance and energy efficiency. Examples include the use of multiple processor cores, co-processors, hardware accelerators, uncore components (defined as components in an SoC that are neither the processor cores nor the co-processors / accelerators; examples of uncore components include cache controllers, memory controllers, and interconnection networks), and power management units. This dissertation presents the Quick Error Detection (QED) technique to overcome post-silicon validation and debug challenges. QED is essential because long error detection latency, the time elapsed between the occurrence of an error caused by a bug and its manifestation as an observable failure, severely limits the effectiveness of existing post-silicon validation and debug approaches. Experimental results collected using several state-of-the-art commercial hardware platforms, as well as results obtained from simulations of various bug scenarios that occurred in commercial multi-core System-on-Chips (SoCs), demonstrate the effectiveness and practicality of QED: 1. QED improves error detection latencies by up to 9 orders of magnitude, from billions of clock cycles to very few clock cycles (generally fewer than 1,000 clock cycles for most bug scenarios). 2. QED enables up to 4-fold improvement in bug coverage (i.e., QED detects bugs that may be missed by traditional post-silicon validation approaches). 3. Symbolic Quick Error Detection (Symbolic QED) localizes difficult logic bugs automatically in a few hours (less than 7 hours for most bug scenarios), without requiring any additional hardware. Localizing a bug involves identifying a bug trace (defined as a sequence of inputs, e.g., instructions, that activates and detects the bug) and identifying the hardware design block where the bug is (possibly) located. This was demonstrated for an open-source multi-core SoC consisting of 500 millions transistors. In contrast, it might take days or weeks (or even months) of manual work, per bug, when traditional techniques are used. QED is effective for bugs inside processor cores, co-processors / software-programmable accelerators (which are components in an SoC that can be programmed using software to perform a specific set of functions, examples include graphic processing unit and digital signal processor), non-programmable hardware accelerators (which are components in a SoC that are designed to perform a pre-defined set of functions, but cannot be programmed using software, examples include accelerators for video or audio compression), and uncore components such as cache controllers, memory controllers, and interconnection networks. QED has been successfully used in industry during post-silicon validation and debug of a commercial multi-core SoC.
Book Synopsis Trace-Based Post-Silicon Validation for VLSI Circuits by : Xiao Liu
Download or read book Trace-Based Post-Silicon Validation for VLSI Circuits written by Xiao Liu and published by Springer Science & Business Media. This book was released on 2013-06-12 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Book Synopsis System-on-Chip Security by : Farimah Farahmandi
Download or read book System-on-Chip Security written by Farimah Farahmandi and published by Springer Nature. This book was released on 2019-11-22 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.
Book Synopsis Post-Silicon and Runtime Verification for Modern Processors by : Ilya Wagner
Download or read book Post-Silicon and Runtime Verification for Modern Processors written by Ilya Wagner and published by Springer Science & Business Media. This book was released on 2010-11-25 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. The authors start by giving an overview of the state of the art in verification, particularly current post-silicon methodologies in use in the industry, both for the domain of processor pipeline design and for memory subsystems. They then dive into the presentation of several new post-silicon verification solutions aimed at boosting the verification coverage of modern processors, dedicating several chapters to this topic. The presentation of runtime verification solutions follows a similar approach. This is an area of processor design that is still in its early stages of exploration and that holds the promise of accomplishing the ultimate goal of achieving complete correctness guarantees for microprocessor-based computation. The authors conclude the book with a look towards the future of late-stage verification and its growing role in the processor life-cycle.
Book Synopsis Fundamentals of IP and SoC Security by : Swarup Bhunia
Download or read book Fundamentals of IP and SoC Security written by Swarup Bhunia and published by Springer. This book was released on 2017-01-24 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about security in embedded systems and it provides an authoritative reference to all aspects of security in system-on-chip (SoC) designs. The authors discuss issues ranging from security requirements in SoC designs, definition of architectures and design choices to enforce and validate security policies, and trade-offs and conflicts involving security, functionality, and debug requirements. Coverage also includes case studies from the “trenches” of current industrial practice in design, implementation, and validation of security-critical embedded systems. Provides an authoritative reference and summary of the current state-of-the-art in security for embedded systems, hardware IPs and SoC designs; Takes a "cross-cutting" view of security that interacts with different design and validation components such as architecture, implementation, verification, and debug, each enforcing unique trade-offs; Includes high-level overview, detailed analysis on implementation, and relevant case studies on design/verification/debug issues related to IP/SoC security.
Book Synopsis Design for Testability, Debug and Reliability by : Sebastian Huhn
Download or read book Design for Testability, Debug and Reliability written by Sebastian Huhn and published by Springer Nature. This book was released on 2021-04-19 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Book Synopsis Network-on-Chip Security and Privacy by : Prabhat Mishra
Download or read book Network-on-Chip Security and Privacy written by Prabhat Mishra and published by Springer Nature. This book was released on 2021-06-04 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of Network-on-Chip (NoC) security vulnerabilities and state-of-the-art countermeasures, with contributions from System-on-Chip (SoC) designers, academic researchers and hardware security experts. Readers will gain a clear understanding of the existing security solutions for on-chip communication architectures and how they can be utilized effectively to design secure and trustworthy systems.
Book Synopsis A Reconfigurable Post-silicon Debug Infrastructure for Systems-on-chip by :
Download or read book A Reconfigurable Post-silicon Debug Infrastructure for Systems-on-chip written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: As the level of integrated circuit (IC) complexity continues to increase, the post-silicon validation stage is becoming a large component of the overall development cost. To address this, we propose a reconfigurable post-silicon debug infrastructure that enhances the post-silicon validation process by enabling the observation and control of signals that are internal to the manufactured device. The infrastructure is composed of dedicated programmable logic and programmable access networks. Our reconfigurable infrastructure enables not only the diagnoses of bugs; it also allows the detection and potential correction of errors in normal operation. In this thesis we describe the architecture, implementation and operation of our new infrastructure. Furthermore, we identify and address three key challenges arising from the implementation of this infrastructure. Our results demonstrate that it is possible to implement an effective reconfigurable post-silicon infrastructure that is able to observe and control circuits operating at full speed, with an area overhead of between 5% and 10% for many of our target ICs.
Book Synopsis Reliability, Availability and Serviceability of Networks-on-Chip by : Érika Cota
Download or read book Reliability, Availability and Serviceability of Networks-on-Chip written by Érika Cota and published by Springer Science & Business Media. This book was released on 2011-09-23 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Author :Krishnendu Chakrabarty Publisher :Springer Science & Business Media ISBN 13 :9781402072055 Total Pages :218 pages Book Rating :4.0/5 (72 download)
Book Synopsis SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by : Krishnendu Chakrabarty
Download or read book SOC (System-on-a-Chip) Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2002-09-30 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt: Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).
Book Synopsis Debug Automation from Pre-Silicon to Post-Silicon by : Mehdi Dehbashi
Download or read book Debug Automation from Pre-Silicon to Post-Silicon written by Mehdi Dehbashi and published by Springer. This book was released on 2014-09-25 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
Book Synopsis On-Chip Instrumentation by : Neal Stollon
Download or read book On-Chip Instrumentation written by Neal Stollon and published by Springer Science & Business Media. This book was released on 2010-12-06 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.
Book Synopsis Principles of Verifiable RTL Design by : Lionel Bening
Download or read book Principles of Verifiable RTL Design written by Lionel Bening and published by Springer Science & Business Media. This book was released on 2001-05-31 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first edition of Principles of Verifiable RTL Design offered a common sense method for simplifying and unifying assertion specification by creating a set of predefined specification modules that could be instantiated within the designer's RTL. Since the release of the first edition, an entire industry-wide initiative for assertion specification has emerged based on ideas presented in the first edition. This initiative, known as the Open Verification Library Initiative (www.verificationlib.org), provides an assertion interface standard that enables the design engineer to capture many interesting properties of the design and precludes the need to introduce new HDL constructs (i.e., extensions to Verilog are not required). Furthermore, this standard enables the design engineer to `specify once,' then target the same RTL assertion specification over multiple verification processes, such as traditional simulation, semi-formal and formal verification tools. The Open Verification Library Initiative is an empowering technology that will benefit design and verification engineers while providing unity to the EDA community (e.g., providers of testbench generation tools, traditional simulators, commercial assertion checking support tools, symbolic simulation, and semi-formal and formal verification tools). The second edition of Principles of Verifiable RTL Design expands the discussion of assertion specification by including a new chapter entitled `Coverage, Events and Assertions'. All assertions exampled are aligned with the Open Verification Library Initiative proposed standard. Furthermore, the second edition provides expanded discussions on the following topics: start-up verification; the place for 4-state simulation; race conditions; RTL-style-synthesizable RTL (unambiguous mapping to gates); more `bad stuff'. The goal of the second edition is to keep the topic current. Principles of Verifiable RTL Design, A Functional Coding Style Supporting Verification Processes, Second Edition tells you how you can write Verilog to describe chip designs at the RTL level in a manner that cooperates with verification processes. This cooperation can return an order of magnitude improvement in performance and capacity from tools such as simulation and equivalence checkers. It reduces the labor costs of coverage and formal model checking by facilitating communication between the design engineer and the verification engineer. It also orients the RTL style to provide more useful results from the overall verification process.
Book Synopsis Trace Signal Selection for Post-silicon Debug by :
Download or read book Trace Signal Selection for Post-silicon Debug written by and published by . This book was released on 2014 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern technology scaling enables integration of billions of transistors on the same chip. This increase in design complexity makes it difficult to comprehensively validate the design prior to mass production. The main challenge in post-silicon validation is the lack of observability to the internal signals of the manufactured chips. One way to increase this observability is by using Embedded Logic Analyzers (ELAs) which are widely adopted by the industry for the past few years. A core component inside an ELA are trace buffers, which record the signal values corresponding to a small subset of state elements in the design for a few thousand clock cycles. Due to the large area overhead of the trace buffers, only a small fraction of the state elements in the design can be traced online. The signal values of the traced state elements are then used to restore the values of the remaining not-traced state elements. The automated trace signal selection problem focuses on selection of the trace signals in order to maximize the restoration of the remaining state elements within an observation window. In this dissertation, we first propose a hybrid single-mode trace signal selection algorithm which achieves a good balance between solution quality and runtime-scalability. Next, we consider the impact of control signals in the restoration process using the values of the trace signals. We first propose an automated procedure to identify control signals; currently identification of control signals in a design is mostly done manually. However manual identification is not an easy task anymore because of increase in the number of control signals with increase in design complexity as well as automated insertion by CAD tools. We next introduce the trace signal selection problem in the presence of multiple operation modes which occur when control signals take different values. We show existing algorithms which are based on trace signal selection in a single operation mode achieve poor signal restoration over multiple operation modes. In contrast, our proposed algorithm considers restoration over all the operation modes and is therefore able to achieve much higher restoration over all the desired operation modes.
Book Synopsis Formal Verification by : Erik Seligman
Download or read book Formal Verification written by Erik Seligman and published by Morgan Kaufmann. This book was released on 2023-05-26 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Formal Verification: An Essential Toolkit for Modern VLSI Design, Second Edition presents practical approaches for design and validation, with hands-on advice to help working engineers integrate these techniques into their work. Formal Verification (FV) enables a designer to directly analyze and mathematically explore the quality or other aspects of a Register Transfer Level (RTL) design without using simulations. This can reduce time spent validating designs and more quickly reach a final design for manufacturing. Building on a basic knowledge of SystemVerilog, this book demystifies FV and presents the practical applications that are bringing it into mainstream design and validation processes. Every chapter in the second edition has been updated to reflect evolving FV practices and advanced techniques. In addition, a new chapter, Formal Signoff on Real Projects, provides guidelines for implementing signoff quality FV, completely replacing some simulation tasks with significantly more productive FV methods. After reading this book, readers will be prepared to introduce FV in their organization to effectively deploy FV techniques that increase design and validation productivity.
Book Synopsis Microprocessor Design by : Grant McFarland
Download or read book Microprocessor Design written by Grant McFarland and published by McGraw Hill Professional. This book was released on 2010-04-23 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gain a Working Knowledge of the Entire Microprocessor Design Flow This unique step-by-step guide is a complete introduction to modern microprocessor design, explained in simple nontechnical language without complex mathematics. An ideal primer for those working in or studying the semiconductor industry, Microprocessor Design explains all the key concepts, terms, and acronyms needed to understand the steps required to design and manufacture a microprocessor. Developed from a successful corporate training course, this hands-on learning guide walks readers through every step of microprocessor design. You'll follow a new processor product from initial planning through design to production. In Microprocessor Design, the author converts his real-world design and teaching experience into an easy-to-follow reference employing an on-the-job-training approach to cover: The evolution of microprocessors Microprocessor design planning Architecture and microarchitecture Logic design and circuit design Semiconductor manufacturing Processor packaging and test This authoritative reference is an excellent introduction for students or engineers new to processor design and can show industry veterans how their specialty fits into the overall design flow. This accessible and practical guide will provide the reader with a broad working knowledge of the concepts of microprocessor design, as well as an understanding of the individual steps in the process and the jargon used by the industry.
