Noncontact Atomic Force Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540431176
Total Pages : 468 pages
Book Rating : 4.4/5 (311 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : S. Morita

Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2002-07-24 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Springer Handbook of Microscopy

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Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)

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Book Synopsis Springer Handbook of Microscopy by : Peter W. Hawkes

Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Noncontact Atomic Force Microscopy

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 3642560199
Total Pages : 448 pages
Book Rating : 4.6/5 (425 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : S. Morita

Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Amplitude Modulation Atomic Force Microscopy

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 352764394X
Total Pages : 212 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Amplitude Modulation Atomic Force Microscopy by : Ricardo García

Download or read book Amplitude Modulation Atomic Force Microscopy written by Ricardo García and published by John Wiley & Sons. This book was released on 2011-08-24 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.

Noncontact Atomic Force Microscopy

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Author :
Publisher : Springer
ISBN 13 : 3319155881
Total Pages : 539 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : Seizo Morita

Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer. This book was released on 2015-05-18 with total page 539 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Scanning Probe Microscopy

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Publisher : Springer Nature
ISBN 13 : 3030370895
Total Pages : 330 pages
Book Rating : 4.0/5 (33 download)

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Book Synopsis Scanning Probe Microscopy by : Ernst Meyer

Download or read book Scanning Probe Microscopy written by Ernst Meyer and published by Springer Nature. This book was released on 2021-05-31 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Surface Analysis with STM and AFM

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Publisher : John Wiley & Sons
ISBN 13 : 3527615105
Total Pages : 335 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Surface Analysis with STM and AFM by : Sergei N. Magonov

Download or read book Surface Analysis with STM and AFM written by Sergei N. Magonov and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

Physics at Surfaces

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Publisher : Cambridge University Press
ISBN 13 : 1316583260
Total Pages : 470 pages
Book Rating : 4.3/5 (165 download)

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Book Synopsis Physics at Surfaces by : Andrew Zangwill

Download or read book Physics at Surfaces written by Andrew Zangwill and published by Cambridge University Press. This book was released on 1988-03-24 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physics at Surfaces is a unique graduate-level introduction to the physics and chemical physics of solid surfaces, and atoms and molecules that interact with solid surfaces. A subject of keen scientific inquiry since the last century, surface physics emerged as an independent discipline only in the late 1960s as a result of the development of ultra-high vacuum technology and high speed digital computers. With these tools, reliable experimental measurements and theoretical calculations could at last be compared. Progress in the last decade has been truly striking. This volume provides a synthesis of the entire field of surface physics from the perspective of a modern condensed matter physicist with a healthy interest in chemical physics. The exposition intertwines experiment and theory whenever possible, although there is little detailed discussion of technique. This much-needed text will be invaluable to graduate students and researchers in condensed matter physics, physical chemistry and materials science working in, or taking graduate courses in, surface science.

Fundamentals of Finite Element Analysis

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Publisher : McGraw-Hill Companies
ISBN 13 :
Total Pages : 494 pages
Book Rating : 4.:/5 (762 download)

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Book Synopsis Fundamentals of Finite Element Analysis by : David V. Hutton

Download or read book Fundamentals of Finite Element Analysis written by David V. Hutton and published by McGraw-Hill Companies. This book was released on 2004 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new text, intended for the senior undergraduate finite element course in civil or mechanical engineering departments, gives students a solid basis in the mechanical principles of the finite element method and provides a theoretical foundation for applying available software analysis packages and evaluating the results obtained. Dr. Hutton discusses basic theory of the finite element method while avoiding variational calculus, instead focusing upon the engineering mechanics and mathematical background that may be expected of a senior undergraduate engineering student. The text relies upon basic equilibrium principles, introduction of the principle of minimum potential energy, and the Galerkin finite element method, which readily allows application of the FEM to nonstructural problems. The text is software-independent, making it flexible enough for use in a wide variety of programs, and offers a good selection of homework problems and examples.

Nanotribology and Nanomechanics I

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Publisher : Springer Science & Business Media
ISBN 13 : 364215283X
Total Pages : 633 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Nanotribology and Nanomechanics I by : Bharat Bhushan

Download or read book Nanotribology and Nanomechanics I written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2011-05-30 with total page 633 pages. Available in PDF, EPUB and Kindle. Book excerpt: The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

Nanotribology and Nanomechanics

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Publisher : Springer Science & Business Media
ISBN 13 : 3540776087
Total Pages : 1530 pages
Book Rating : 4.5/5 (47 download)

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Book Synopsis Nanotribology and Nanomechanics by : Bharat Bhushan

Download or read book Nanotribology and Nanomechanics written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-05-10 with total page 1530 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume serves as a timely, practical introduction to the principles of nanotribology and nanomechanics and applications to magnetic storage systems and MEMS/NEMS. Assuming some familiarity with macrotribology/mechanics, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. Graduate students, research workers, and practicing engineers will find the book of value.

Atomistic Computer Simulations

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Publisher : John Wiley & Sons
ISBN 13 : 3527671838
Total Pages : 291 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Atomistic Computer Simulations by : Veronika Brázdová

Download or read book Atomistic Computer Simulations written by Veronika Brázdová and published by John Wiley & Sons. This book was released on 2013-04-16 with total page 291 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many books explain the theory of atomistic computer simulations; this book teaches you how to run them This introductory "how to" title enables readers to understand, plan, run, and analyze their own independent atomistic simulations, and decide which method to use and which questions to ask in their research project. It is written in a clear and precise language, focusing on a thorough understanding of the concepts behind the equations and how these are used in the simulations. As a result, readers will learn how to design the computational model and which parameters of the simulations are essential, as well as being able to assess whether the results are correct, find and correct errors, and extract the relevant information from the results. Finally, they will know which information needs to be included in their publications. This book includes checklists for planning projects, analyzing output files, and for troubleshooting, as well as pseudo keywords and case studies. The authors provide an accompanying blog for the book with worked examples, and additional material and references: http://www.atomisticsimulations.org/.

Kelvin Probe Force Microscopy

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Publisher : Springer
ISBN 13 : 3319756877
Total Pages : 530 pages
Book Rating : 4.3/5 (197 download)

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Book Synopsis Kelvin Probe Force Microscopy by : Sascha Sadewasser

Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer. This book was released on 2018-03-09 with total page 530 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Electrical Atomic Force Microscopy for Nanoelectronics

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Publisher : Springer
ISBN 13 : 3030156125
Total Pages : 424 pages
Book Rating : 4.0/5 (31 download)

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Book Synopsis Electrical Atomic Force Microscopy for Nanoelectronics by : Umberto Celano

Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Surface and Interface Science, Volumes 1 and 2

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Publisher : John Wiley & Sons
ISBN 13 : 3527411569
Total Pages : 1010 pages
Book Rating : 4.5/5 (274 download)

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Book Synopsis Surface and Interface Science, Volumes 1 and 2 by : Klaus Wandelt

Download or read book Surface and Interface Science, Volumes 1 and 2 written by Klaus Wandelt and published by John Wiley & Sons. This book was released on 2012-04-16 with total page 1010 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering interface science from a novel surface science perspective, this unique handbook offers a comprehensive overview of this burgeoning field. Eight topical volumes cover basic concepts and methods, elemental and composite surfaces, solid-gas, solid-liquid and inorganic biological interfaces, as well as applications of surface science in nanotechnology, materials science and molecular electronics. With its broad scope and clear structure, it is ideal as a reference for scientists in the field, as well as an introduction for newcomers.

Noncontact Atomic Force Microscopy

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 364201495X
Total Pages : 410 pages
Book Rating : 4.6/5 (42 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : Seizo Morita

Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2009-09-18 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Dekker Encyclopedia of Nanoscience and Nanotechnology

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Author :
Publisher : CRC Press
ISBN 13 : 9780824750510
Total Pages : 784 pages
Book Rating : 4.7/5 (55 download)

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Book Synopsis Dekker Encyclopedia of Nanoscience and Nanotechnology by : James A. Schwarz

Download or read book Dekker Encyclopedia of Nanoscience and Nanotechnology written by James A. Schwarz and published by CRC Press. This book was released on 2004 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: