Scientific and Technical Aerospace Reports

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Publisher :
ISBN 13 :
Total Pages : 1034 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1972 with total page 1034 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Government Reports Announcements & Index

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Publisher :
ISBN 13 :
Total Pages : 1452 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Government Reports Announcements & Index by :

Download or read book Government Reports Announcements & Index written by and published by . This book was released on 1993-03 with total page 1452 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Microscopy for Nanotechnology

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Publisher : Springer Science & Business Media
ISBN 13 : 0387396209
Total Pages : 533 pages
Book Rating : 4.3/5 (873 download)

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Book Synopsis Scanning Microscopy for Nanotechnology by : Weilie Zhou

Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Introduction to Atomic Force Microscopy

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Publisher : Lulu.com
ISBN 13 : 024462108X
Total Pages : 96 pages
Book Rating : 4.2/5 (446 download)

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Book Synopsis Introduction to Atomic Force Microscopy by : Ernesto Placidi

Download or read book Introduction to Atomic Force Microscopy written by Ernesto Placidi and published by Lulu.com. This book was released on 2017-07-24 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is addressed at students or researchers who want to deepen their understanding of the peculiar physical aspects of the various measurement modes in AFM that are often not discussed extensively in topical text books. Models for contact and adhesion between bodies are described in detail, so as done for the contact mode, the lateral force mode and the kinetic modes: a large section is dedicated to the physics of the harmonic oscillator interacting with a surface. A brief discussion about the technical aspects is also presented, without going into detail, as these are widely available elsewhere, in textbooks and even on internet sites.

Nuclear Science Abstracts

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Publisher :
ISBN 13 :
Total Pages : 928 pages
Book Rating : 4.:/5 (89 download)

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Book Synopsis Nuclear Science Abstracts by :

Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1972-04 with total page 928 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Atomic Force Microscopy

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Publisher : CRC Press
ISBN 13 : 1000707946
Total Pages : 140 pages
Book Rating : 4.0/5 (7 download)

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Book Synopsis Atomic Force Microscopy by : Wesley C. Sanders

Download or read book Atomic Force Microscopy written by Wesley C. Sanders and published by CRC Press. This book was released on 2019-10-08 with total page 140 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

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Publisher : Springer Science & Business Media
ISBN 13 : 0387857311
Total Pages : 329 pages
Book Rating : 4.3/5 (878 download)

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Book Synopsis Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by : Patrick Echlin

Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

International Aerospace Abstracts

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Publisher :
ISBN 13 :
Total Pages : 1366 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis International Aerospace Abstracts by :

Download or read book International Aerospace Abstracts written by and published by . This book was released on 1966-05 with total page 1366 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Probe Microscopy

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Publisher : Springer
ISBN 13 : 3662452405
Total Pages : 375 pages
Book Rating : 4.6/5 (624 download)

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Book Synopsis Scanning Probe Microscopy by : Bert Voigtländer

Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Atomic Force Microscopy

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Publisher : OUP Oxford
ISBN 13 : 0191576670
Total Pages : 256 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis Atomic Force Microscopy by : Peter Eaton

Download or read book Atomic Force Microscopy written by Peter Eaton and published by OUP Oxford. This book was released on 2010-03-25 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.

Government Reports Annual Index

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Publisher :
ISBN 13 :
Total Pages : 1290 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Government Reports Annual Index by :

Download or read book Government Reports Annual Index written by and published by . This book was released on 1993 with total page 1290 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.

Atomic Force Microscopy (AFM)

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Publisher : Nova Science Publishers
ISBN 13 : 9781631171727
Total Pages : 0 pages
Book Rating : 4.1/5 (717 download)

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Book Synopsis Atomic Force Microscopy (AFM) by : Hongshun Yang

Download or read book Atomic Force Microscopy (AFM) written by Hongshun Yang and published by Nova Science Publishers. This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the wide application of nanotechnology in scientific research as well as in industrial product development, it is urgent to develop appropriate tools for investigating and manipulating molecules, especially macromolecules at the nanoscale level. Different microscopes are typical equipment. Due to the high resolution, being maximally close to samples' original status and the low requirement of sample preparation, atomic force microscopy (AFM) has been applied as a nanotechnology tool since it was invented in 1986. As this equipment utilises the force between the sample and scanning tip rather than the light signal as used by many other microscopes, samples with different optical properties can be investigated with AFM without limitations. AFM has many modes including contact mode and non-contact mode, which can be applied for achieving different purposes depending on the samples' properties and final purposes. Recent force spectroscopy can measure the interaction forces of the tip-sample, which is a function of distance between the tip and the sample, thus called a force-distance curve. Force spectroscopy can also be conducted with static or dynamic modes, which has been widely applied in many fields, especially in biophysics for measuring mechanical properties of living organisms or cells. This book focuses on the research on AFM principles, modes of operation and limitation and they are discussed with detailed examples in various fields, ranging from inorganic materials in physics to organic materials in food science, biomedical science, chemistry and others.

An Introduction to Nanoscience and Nanotechnology

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Publisher : Wiley-ISTE
ISBN 13 :
Total Pages : 248 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis An Introduction to Nanoscience and Nanotechnology by : Alain Nouailhat

Download or read book An Introduction to Nanoscience and Nanotechnology written by Alain Nouailhat and published by Wiley-ISTE. This book was released on 2008-01-14 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Part of this book adapted from "Introduction aux nanosciences et aux nanotechnologies" published in France by Hermes Science/Lavoisier in 2006."

Spinach On The Ceiling: The Multifaceted Life Of A Theoretical Chemist

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Publisher : World Scientific
ISBN 13 : 1786348047
Total Pages : 313 pages
Book Rating : 4.7/5 (863 download)

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Book Synopsis Spinach On The Ceiling: The Multifaceted Life Of A Theoretical Chemist by : Martin Karplus

Download or read book Spinach On The Ceiling: The Multifaceted Life Of A Theoretical Chemist written by Martin Karplus and published by World Scientific. This book was released on 2020-06-22 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: 'Karplus's tales of a turbulent graduate school experience at Caltech will inspire readers to muster fortitude when everything seems to be spinning out of control. Karplus balances rigorous scientific discussions with refreshing chapters expounding his passion for photography and gastronomy.'Nature Chemistry, May 2020Nobel Laureate Martin Karplus was eight when his family fled Nazi-occupied Austria via Switzerland and France for the United States. He would later credit his life as a refugee as a decisive influence on his world view and approach to science.Spinach on the Ceiling is an autobiographical telling of Karplus' life story, and how it led him to win the Nobel Prize in Chemistry in 2013. The book captures pivotal moments in Martin's life — from his escape to Switzerland in 1938 shortly after Hitler's entrance into Austria; to memorable moments like when his parents gave him a microscope which opened his eyes to the wonders of science; to his education in New England and California; and his eventual scientific career which took him to England, Illinois, Columbia, Strasbourg, and Harvard. It relates how Martin's optimistic outlook and belief in his vision made it possible for him to overcome setbacks in his life, and turn a subject of study his colleagues considered a waste of time into a central part of chemistry and structural biology. It is his hope to inspire and aid young readers, in particular, to have a successful trajectory in their own lives. Although research and teaching have been his primary focus, he has traveled the world photographing people and places with a Leica IIIC and has had numerous exhibitions of the photographs. He has also enjoyed a lifelong interest in cooking and worked in some of the best restaurants in France and Spain.

Dissertation Abstracts International

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Publisher :
ISBN 13 :
Total Pages : 896 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Dissertation Abstracts International by :

Download or read book Dissertation Abstracts International written by and published by . This book was released on 2002 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Amplitude Modulation Atomic Force Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 352764394X
Total Pages : 212 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Amplitude Modulation Atomic Force Microscopy by : Ricardo García

Download or read book Amplitude Modulation Atomic Force Microscopy written by Ricardo García and published by John Wiley & Sons. This book was released on 2011-08-24 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.

Atomic Force Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 0470638826
Total Pages : 496 pages
Book Rating : 4.4/5 (76 download)

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Book Synopsis Atomic Force Microscopy by : Greg Haugstad

Download or read book Atomic Force Microscopy written by Greg Haugstad and published by John Wiley & Sons. This book was released on 2012-09-24 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”