Metrology, Inspection, and Process Control for Microlithography XIV

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Publisher : Society of Photo Optical
ISBN 13 : 9780819436160
Total Pages : 938 pages
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Book Synopsis Metrology, Inspection, and Process Control for Microlithography XIV by : Neal T. Sullivan

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Metrology, Inspection, and Process Control for Microlithography XIV

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ISBN 13 :
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Metrology, Inspection, and Process Control for Microlithography

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ISBN 13 :
Total Pages : 830 pages
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Metrology, Inspection, and Process Control for Microlithography XXX

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Metrology, Inspection, and Process Control for Microlithography XXVIII

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ISBN 13 :
Total Pages : 500 pages
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Metrology, Inspection, and Process Control for Microlithography XXVIII

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Metrology, Inspection, and Process Control for Microlithography XXVI

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ISBN 13 :
Total Pages : 600 pages
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Metrology, Inspection, and Process Control for Microlithography XXX

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Metrology, Inspection, and Process Control for Microlithography

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ISBN 13 :
Total Pages : 914 pages
Book Rating : 4.3/5 (91 download)

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Encyclopedia of Optical and Photonic Engineering (Print) - Five Volume Set

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Publisher : CRC Press
ISBN 13 : 1351247174
Total Pages : 3726 pages
Book Rating : 4.3/5 (512 download)

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Book Synopsis Encyclopedia of Optical and Photonic Engineering (Print) - Five Volume Set by : Craig Hoffman

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Metrology, Inspection, and Process Control for Microlithography XVIII

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ISBN 13 :
Total Pages : 770 pages
Book Rating : 4.F/5 ( download)

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Handbook of Silicon Semiconductor Metrology

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Publisher : CRC Press
ISBN 13 : 0203904540
Total Pages : 703 pages
Book Rating : 4.2/5 (39 download)

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Book Synopsis Handbook of Silicon Semiconductor Metrology by : Alain C. Diebold

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Metrology, Inspection, and Process Control for Microlithography XXIII

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Publisher : Society of Photo Optical
ISBN 13 : 9780819475251
Total Pages : 1300 pages
Book Rating : 4.4/5 (752 download)

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Book Synopsis Metrology, Inspection, and Process Control for Microlithography XXIII by : John Alexander Allgair

Download or read book Metrology, Inspection, and Process Control for Microlithography XXIII written by John Alexander Allgair and published by Society of Photo Optical. This book was released on 2009 with total page 1300 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821

Metrology, Inspection, and Process Control for Microlithography XI

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Publisher : Society of Photo Optical
ISBN 13 : 9780819424648
Total Pages : 636 pages
Book Rating : 4.4/5 (246 download)

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Book Synopsis Metrology, Inspection, and Process Control for Microlithography XI by : Susan K. Jones

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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

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Publisher : The Electrochemical Society
ISBN 13 : 9781566773485
Total Pages : 572 pages
Book Rating : 4.7/5 (734 download)

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Book Synopsis Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes by : Bernd O. Kolbesen

Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 2003 with total page 572 pages. Available in PDF, EPUB and Kindle. Book excerpt: .".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.

Metrology, Inspection, and Process Control for Microlithography X

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ISBN 13 :
Total Pages : 2725 pages
Book Rating : 4.:/5 (746 download)

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Metrology, Inspection, and Process Control for Microlithography X

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