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Light Emission From Rare Earth Doped Silicon Oxide Thin Films Deposited By Ecr Pecvd
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Book Synopsis Light Emission from Rare Earth-doped Silicon Oxide Thin Films Deposited by ECR-PECVD by : Jing Li
Download or read book Light Emission from Rare Earth-doped Silicon Oxide Thin Films Deposited by ECR-PECVD written by Jing Li and published by . This book was released on 2008 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Optical and Structural Properties of Europium Doped Silicon Oxide Thin Films by : Rashin Basiri Namin
Download or read book Optical and Structural Properties of Europium Doped Silicon Oxide Thin Films written by Rashin Basiri Namin and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rare earth doping is one of the main approaches to enhance the optical properties of silicon-based materials. In this work, a set of europium doped silicon oxide (Eu[subscript x]Si[subscript y]O[subscript z]) thin films are fabricated using an integrated magnetron sputtering electron cyclotron resonance plasma enhanced chemical vapor deposition (IMS-ECR-PECVD) system. The thin film composition was studied by Rutherford backscattering spectrometry (RBS) and elastic recoil detection (ERD) measurements verifying high control over the Eu content by changing the sputtering power. Variable Angle spectroscopic ellipsometry (VASE) was conducted, delivering the refractive index and thickness. Using a UV laser (325 nm) excitation source, Photoluminescence (PL) measurements were performed, and it was confirmed that Eu[superscript 3+] transition which is associated with the red light emission is successfully achieved even at annealing temperatures as low as 300°C. Performing X-ray diffraction (XRD) analysis, the structural properties of the thin films were studied and the formation of Eu[subscript x]Si[subscript y]O[subscript z] crystals was confirmed for the samples annealed at elevated temperatures.
Book Synopsis Springer Handbook of Glass by : J. David Musgraves
Download or read book Springer Handbook of Glass written by J. David Musgraves and published by Springer Nature. This book was released on 2019-11-08 with total page 1851 pages. Available in PDF, EPUB and Kindle. Book excerpt: This handbook provides comprehensive treatment of the current state of glass science from the leading experts in the field. Opening with an enlightening contribution on the history of glass, the volume is then divided into eight parts. The first part covers fundamental properties, from the current understanding of the thermodynamics of the amorphous state, kinetics, and linear and nonlinear optical properties through colors, photosensitivity, and chemical durability. The second part provides dedicated chapters on each individual glass type, covering traditional systems like silicates and other oxide systems, as well as novel hybrid amorphous materials and spin glasses. The third part features detailed descriptions of modern characterization techniques for understanding this complex state of matter. The fourth part covers modeling, from first-principles calculations through molecular dynamics simulations, and statistical modeling. The fifth part presents a range of laboratory and industrial glass processing methods. The remaining parts cover a wide and representative range of applications areas from optics and photonics through environment, energy, architecture, and sensing. Written by the leading international experts in the field, the Springer Handbook of Glass represents an invaluable resource for graduate students through academic and industry researchers working in photonics, optoelectronics, materials science, energy, architecture, and more.
Book Synopsis Rare Earth Oxide Thin Films by : Marco Fanciulli
Download or read book Rare Earth Oxide Thin Films written by Marco Fanciulli and published by Springer. This book was released on 2010-11-18 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin rare earth (RE) oxide films are emerging materials for microelectronic, nanoelectronic, and spintronic applications. The state-of-the-art of thin film deposition techniques as well as the structural, physical, chemical, and electrical properties of thin RE oxide films and of their interface with semiconducting substrates are discussed. The aim is to identify proper methodologies for the development of RE oxides thin films and to evaluate their effectiveness as innovative materials in different applications.
Download or read book Chemical Abstracts written by and published by . This book was released on 2002 with total page 2002 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Crystalline Rare-Earth-doped Sesquioxide PLD-Films on alpha-Aluminia by :
Download or read book Crystalline Rare-Earth-doped Sesquioxide PLD-Films on alpha-Aluminia written by and published by Cuvillier Verlag. This book was released on 2004-07-28 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: The development of integrated optical devices demands the fabrication of high-quality optically active thin films. This work focuses on thin sesquioxide films, which are promising because the sesquioxides are well-known hosts for rare-earth-ions, leading to luminescent materials and solid-state lasers with superior mechanical and thermal properties (e. g. low phonon energies, large thermal conductivity).Optical quality crystalline thin films of rare-earth-doped sesquioxides (yttria, lutetia, and scandia) have been grown by the pulsed laser deposition (PLD) technique on single-crystal (0001) a-alumina substrates. Alumina substrates offer a lattice constant that matches that of cubic Y2O3 in the á111ñ direction very well. Using Lu2O3 and Sc2O3, the mismatch of 4.8% related to Y2O3 on alumina substrates can be considerably reduced leading to the production of films with less dislocations.The crystal structure of these films (thicknesses from 1 nm to 500 nm) was determined by X-ray diffraction (XRD) and surface X-ray diffraction (SXRD) analysis. These measurements show that the films were textured along the á111ñ direction, however with a small polycrystalline component, which is negligible in thick films. Using Rutherford backscattering analysis (RBS), the correct stoichiometric composition of the films could be proved. At optimum growth conditions, epitaxial growth of Y2O3 along the á111ñ direction on the [0001] a-Al2O3 was experimentally verified by the observation of channelling in the RBS experiments.The surface morphology of the thin films has been studied using atomic force microscopy (AFM). While amorphous films have no defined surface structure, crystalline films show a triangular surface morphology, which is attributed to the á111ñ growth direction. The same structure is observed along the {111} cleavage of an yttria bulk crystal. Thin films with a mean thickness of 5 nm have no completely covered surface, but show island growth, where the shape of the single crystallites, having angles of 60° or 120° , indicates the á111ñ growth direction during the early stages of film growth.To study the optical properties of the rare-earth-doped films, spectroscopic measurements in the (vacuum-) ultraviolet and visible spectral-range have been carried out. The emission and excitation spectra of the Eu3+-doped films look similar to those of the corresponding crystalline bulk material down to a film thickness of 100 nm, i. e. the symmetry around the Eu3+-ions is preserved, whereas films with a thickness £ 20nm show a completely different emission behavior. This change can be explained by subplantation effects of high-energy plasma species hitting the substrate surface, leading to mixed compounds like Y3Al5O12. In addition, surface effects due to a large surface-to-volume ratio of the observed islands have a significant impact on the 'film' properties.For possible applications in integrated optics, waveguide experiments have been performed in the system Y2O3–Al2O3. Single-mode guiding of the fundamental mode was demonstrated in the 1 µm thick yttria layer.
Book Synopsis Photonic Applications in Devices and Communication Systems by : Peter Mascher
Download or read book Photonic Applications in Devices and Communication Systems written by Peter Mascher and published by SPIE-International Society for Optical Engineering. This book was released on 2005 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Book Synopsis Rare Earth Oxide Thin Films from Solution Based Inorganic Precursor Deposition as Potential Candidates for Insulators in Advanced Gate Stacks by : Maraike Ahlf
Download or read book Rare Earth Oxide Thin Films from Solution Based Inorganic Precursor Deposition as Potential Candidates for Insulators in Advanced Gate Stacks written by Maraike Ahlf and published by . This book was released on 2012 with total page 774 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Ceramic Abstracts by : American Ceramic Society
Download or read book Ceramic Abstracts written by American Ceramic Society and published by . This book was released on 1995 with total page 1150 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Atomic Layer Deposition for Semiconductors by : Cheol Seong Hwang
Download or read book Atomic Layer Deposition for Semiconductors written by Cheol Seong Hwang and published by Springer Science & Business Media. This book was released on 2013-10-18 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, logic devices and machines. Reviews history, operating principles and ALD processes for each device.
Download or read book Physics Briefs written by and published by . This book was released on 1994 with total page 916 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Index to IEEE Publications by : Institute of Electrical and Electronics Engineers
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1996 with total page 1260 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Metals Abstracts written by and published by . This book was released on 1996 with total page 1628 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis International Aerospace Abstracts by :
Download or read book International Aerospace Abstracts written by and published by . This book was released on 1996 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Photovoltaic and Photoactive Materials by : Joseph M. Marshall
Download or read book Photovoltaic and Photoactive Materials written by Joseph M. Marshall and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: The primary objective of this NATO Advanced Study Institute (ASI) was to present an up-to-date overview of various current areas of interest in the field of photovoltaic and related photoactive materials. This is a wide-ranging subject area, of significant commercial and environmental interest, and involves major contributions from the disciplines of physics, chemistry, materials, electrical and instrumentation engineering, commercial realisation etc. Therefore, we sought to adopt an inter disciplinary approach, bringing together recognised experts in the various fields while retaining a level of treatment accessible to those active in specific individual areas of research and development. The lecture programme commenced with overviews of the present relevance and historical development of the subject area, plus an introduction to various underlying physical principles of importance to the materials and devices to be addressed in later lectures. Building upon this, the ASI then progressed to more detailed aspects of the subject area. We were also fortunately able to obtain a contribution from Thierry Langlois d'Estaintot of the European Commission Directorate, describing present and future EC support for activities in this field. In addition, poster sessions were held throughout the meeting, to allow participants to present and discuss their current activities. These were supported by what proved to be very effective feedback sessions (special thanks to Martin Stutzmann), prior to which groups of participants enthusiastically met (often in the bar) to identify and agree topics of common interest.
Book Synopsis Semiconductor Laser Engineering, Reliability and Diagnostics by : Peter W. Epperlein
Download or read book Semiconductor Laser Engineering, Reliability and Diagnostics written by Peter W. Epperlein and published by John Wiley & Sons. This book was released on 2013-01-25 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.