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Author : Sheng Ye
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (16 download)
Download or read book Kelvin Probe Force Microscopy (KPFM) for Nanoelectronic Device Characterisation written by Sheng Ye and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sascha Sadewasser
Publisher : Springer
ISBN 13 : 3319756877
Total Pages : 530 pages
Book Rating : 4.3/5 (197 download)
Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer. This book was released on 2018-03-09 with total page 530 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Author : Sheng Ye
Publisher :
ISBN 13 :
Total Pages : 125 pages
Book Rating : 4.:/5 (111 download)
Download or read book Kelvin Probe Force Microscopy (KPFM) for Nanoelectric Device Characterisation written by Sheng Ye and published by . This book was released on 2016 with total page 125 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sascha Sadewasser
Publisher : Springer Science & Business Media
ISBN 13 : 3642225667
Total Pages : 334 pages
Book Rating : 4.6/5 (422 download)
Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer Science & Business Media. This book was released on 2011-10-22 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Author : Paula M. Vilarinho
Publisher : Springer Science & Business Media
ISBN 13 : 1402030193
Total Pages : 503 pages
Book Rating : 4.4/5 (2 download)
Download or read book Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials written by Paula M. Vilarinho and published by Springer Science & Business Media. This book was released on 2006-06-15 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Author : Dawn A. Bonnell
Publisher : World Scientific
ISBN 13 : 981443471X
Total Pages : 640 pages
Book Rating : 4.8/5 (144 download)
Download or read book Scanning Probe Microscopy for Energy Research written by Dawn A. Bonnell and published by World Scientific. This book was released on 2013 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Author : Umberto Celano
Publisher : Springer
ISBN 13 : 3030156125
Total Pages : 408 pages
Book Rating : 4.0/5 (31 download)
Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Author : Sergei V. Kalinin
Publisher : Springer Science & Business Media
ISBN 13 : 0387286683
Total Pages : 1002 pages
Book Rating : 4.3/5 (872 download)
Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Author : Mario Lanza
Publisher : John Wiley & Sons
ISBN 13 : 3527340912
Total Pages : 382 pages
Book Rating : 4.5/5 (273 download)
Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-12-04 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Author : Challa S.S.R. Kumar
Publisher : Springer
ISBN 13 : 3662445514
Total Pages : 653 pages
Book Rating : 4.6/5 (624 download)
Download or read book Surface Science Tools for Nanomaterials Characterization written by Challa S.S.R. Kumar and published by Springer. This book was released on 2015-03-10 with total page 653 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author : Dawn Bonnell
Publisher : World Scientific
ISBN 13 : 9814434728
Total Pages : 640 pages
Book Rating : 4.8/5 (144 download)
Download or read book Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications written by Dawn Bonnell and published by World Scientific. This book was released on 2013-03-26 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Author : Mario Lanza
Publisher : John Wiley & Sons
ISBN 13 : 3527699783
Total Pages : 385 pages
Book Rating : 4.5/5 (276 download)
Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-08-07 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Author : Cai Shen
Publisher : CRC Press
ISBN 13 : 1000577872
Total Pages : 457 pages
Book Rating : 4.0/5 (5 download)
Download or read book Atomic Force Microscopy for Energy Research written by Cai Shen and published by CRC Press. This book was released on 2022-04-26 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.
Author : Tino Wagner
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (946 download)
Download or read book High-resolution Kelvin Probe Force Microscopy of Active Nanoelectronic Devices written by Tino Wagner and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Paolo Samorì
Publisher : John Wiley & Sons
ISBN 13 : 3527608567
Total Pages : 570 pages
Book Rating : 4.5/5 (276 download)
Download or read book Scanning Probe Microscopies Beyond Imaging written by Paolo Samorì and published by John Wiley & Sons. This book was released on 2006-08-21 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt: This first book to focus on the use of SPMs to actively manipulate molecules and nanostructures on surfaces goes way beyond conventional treatments of scanning microscopy merely for imaging purposes. It reviews recent progress in the use of SPMs on such soft materials as polymers, with a particular emphasis on chemical discrimination, mechanical properties, tip-induced reactions and manipulations, as well as their nanoscale electrical properties. Detailing the practical application potential of this hot topic, this book is of great interest to specialists of wide-ranging disciplines, including physicists, chemists, materials scientists, spectroscopy experts, surface scientists, and engineers.
Author : Wilfried G. J. H. M. van Sark
Publisher : Springer Science & Business Media
ISBN 13 : 3642222757
Total Pages : 588 pages
Book Rating : 4.6/5 (422 download)
Download or read book Physics and Technology of Amorphous-Crystalline Heterostructure Silicon Solar Cells written by Wilfried G. J. H. M. van Sark and published by Springer Science & Business Media. This book was released on 2011-11-16 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today’s solar cell multi-GW market is dominated by crystalline silicon (c-Si) wafer technology, however new cell concepts are entering the market. One very promising solar cell design to answer these needs is the silicon hetero-junction solar cell, of which the emitter and back surface field are basically produced by a low temperature growth of ultra-thin layers of amorphous silicon. In this design, amorphous silicon (a-Si:H) constitutes both „emitter“ and „base-contact/back surface field“ on both sides of a thin crystalline silicon wafer-base (c-Si) where the electrons and holes are photogenerated; at the same time, a-Si:H passivates the c-Si surface. Recently, cell efficiencies above 23% have been demonstrated for such solar cells. In this book, the editors present an overview of the state-of-the-art in physics and technology of amorphous-crystalline heterostructure silicon solar cells. The heterojunction concept is introduced, processes and resulting properties of the materials used in the cell and their heterointerfaces are discussed and characterization techniques and simulation tools are presented.
Author : Rafi Shikler
Publisher :
ISBN 13 :
Total Pages : 186 pages
Book Rating : 4.:/5 (234 download)
Download or read book Nanoscale Electrical Characterization of Semiconductors Using Kelvin Probe Force Microscopy written by Rafi Shikler and published by . This book was released on 2002 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt:
