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Author : ASM International
Publisher : ASM International
ISBN 13 : 161503076X
Total Pages : 453 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa '98 written by ASM International and published by ASM International. This book was released on 1998-01-01 with total page 453 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Grace M. Davidson
Publisher : ASM International
ISBN 13 : 1615030824
Total Pages : 310 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 1997: International Symposium for Testing and Failure Analysis written by Grace M. Davidson and published by ASM International. This book was released on 1997-01-01 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030859
Total Pages : 456 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa 2001 written by ASM International and published by ASM International. This book was released on 2001-01-01 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Electronic Device Failure Analysis Society
Publisher : ASM International
ISBN 13 : 1615030891
Total Pages : 524 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 2006 written by Electronic Device Failure Analysis Society and published by ASM International. This book was released on 2006 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : ASM International
ISBN 13 : 0871707454
Total Pages : 162 pages
Book Rating : 4.8/5 (717 download)
Download or read book Microelectronic Failure Analysis Desk Reference written by and published by ASM International. This book was released on 2001-01-01 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Author : Tejinder Gandhi
Publisher : ASM International
ISBN 13 : 1627082468
Total Pages : 750 pages
Book Rating : 4.6/5 (27 download)
Download or read book Microelectronics Fialure Analysis Desk Reference, Seventh Edition written by Tejinder Gandhi and published by ASM International. This book was released on 2019-11-01 with total page 750 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author :
Publisher :
ISBN 13 :
Total Pages : 664 pages
Book Rating : 4.:/5 (31 download)
Download or read book Advanced Materials & Processes written by and published by . This book was released on 2005 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. S. M. International
Publisher : ASM International
ISBN 13 : 1627080740
Total Pages : 561 pages
Book Rating : 4.6/5 (27 download)
Download or read book ISTFA 2014 written by A. S. M. International and published by ASM International. This book was released on 2014-11-01 with total page 561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030867
Total Pages : 534 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa 2003 written by ASM International and published by ASM International. This book was released on 2003-01-01 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 556 pages
Book Rating : 4.3/5 (91 download)
Download or read book Proceedings written by and published by . This book was released on 2005 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : ASM International
ISBN 13 : 1615030921
Total Pages : 371 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 2009 written by and published by ASM International. This book was released on 2009-01-01 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Author :
Publisher : ASM International
ISBN 13 : 1627081518
Total Pages : pages
Book Rating : 4.6/5 (27 download)
Download or read book ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2017-12-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author :
Publisher : ASM International
ISBN 13 : 1615037276
Total Pages : 487 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 2010 written by and published by ASM International. This book was released on 2010-01-01 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Lucille A. Giannuzzi
Publisher : Springer Science & Business Media
ISBN 13 : 038723313X
Total Pages : 362 pages
Book Rating : 4.3/5 (872 download)
Download or read book Introduction to Focused Ion Beams written by Lucille A. Giannuzzi and published by Springer Science & Business Media. This book was released on 2006-05-18 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Author : Ivan Jorge Chueiri
Publisher :
ISBN 13 :
Total Pages : 510 pages
Book Rating : 4.E/5 ( download)
Download or read book XIII SBMicro, International Conference on Microelectronics and Packaging, ICMP'98: Advanced courses and invited papers written by Ivan Jorge Chueiri and published by . This book was released on 1998 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J.C.J. Bart
Publisher : IOS Press
ISBN 13 : 1607501228
Total Pages : 824 pages
Book Rating : 4.6/5 (75 download)
Download or read book Plastics Additives written by J.C.J. Bart and published by IOS Press. This book was released on 2006-03-15 with total page 824 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Cover-to-cover reading of Plastics Additives, Advanced Industrial Analysis, is recommended for both professional analysts and plastics technologists. Professor Bart’s prose style is easy to read. A professional background in analytical chemistry is not assumed. Particularly valuable is the trove of good advice as to which approach might be best in a given situation. Every department with a serious interest in additive / property relations should invest in a copy.” -- PMAD Newsletter. This industrially relevant and up-to-date resource deals with all established and emerging analytical methods for in-polymer additive analysis of plastics formulations. Quality assurance and industrial troubleshooting all benefit from direct analysis modes. Plastics Additives comprises detailed coverage of solid-state spectroscopy, thermal analysis and pyrolysis, laser techniques, surface studies and microanalysis along with process analytics, quantitative analysis and modern method development and validation applied to additives in polymers. The book is organised for quick and easy reference and is extensively illustrated with over 200 figures, 300 flow diagrams and tables to facilitate rapid understanding of this topic, and it contains 4000 references. Emphasis is on understanding (principles and characteristics) and industrial applicability.
Author : A. S. M. International
Publisher : ASM International
ISBN 13 : 1627080228
Total Pages : 634 pages
Book Rating : 4.6/5 (27 download)
Download or read book ISTFA 2013 written by A. S. M. International and published by ASM International. This book was released on 2013-01-01 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
