Scanning Transmission Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 764 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Introduction to Scanning Transmission Electron Microscopy

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Author :
Publisher : Routledge
ISBN 13 : 1351436619
Total Pages : 127 pages
Book Rating : 4.3/5 (514 download)

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Book Synopsis Introduction to Scanning Transmission Electron Microscopy by : Dr Robert Keyse

Download or read book Introduction to Scanning Transmission Electron Microscopy written by Dr Robert Keyse and published by Routledge. This book was released on 2018-12-19 with total page 127 pages. Available in PDF, EPUB and Kindle. Book excerpt: 1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Introduction to Conventional Transmission Electron Microscopy

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Publisher : Cambridge University Press
ISBN 13 : 0521620066
Total Pages : 741 pages
Book Rating : 4.5/5 (216 download)

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Book Synopsis Introduction to Conventional Transmission Electron Microscopy by : Marc De Graef

Download or read book Introduction to Conventional Transmission Electron Microscopy written by Marc De Graef and published by Cambridge University Press. This book was released on 2003-03-27 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

Physical Principles of Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 9780387258003
Total Pages : 224 pages
Book Rating : 4.2/5 (58 download)

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Book Synopsis Physical Principles of Electron Microscopy by : Ray Egerton

Download or read book Physical Principles of Electron Microscopy written by Ray Egerton and published by Springer Science & Business Media. This book was released on 2011-02-11 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Introduction to Scanning Transmission Electron Microscopy

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Author :
Publisher : CRC Press
ISBN 13 : 9781138441514
Total Pages : pages
Book Rating : 4.4/5 (415 download)

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Book Synopsis Introduction to Scanning Transmission Electron Microscopy by : Robert Keyse

Download or read book Introduction to Scanning Transmission Electron Microscopy written by Robert Keyse and published by CRC Press. This book was released on 2018-06-28 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Scanning and Transmission Electron Microscopy

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Publisher : Oxford University Press, USA
ISBN 13 : 9780195107517
Total Pages : 225 pages
Book Rating : 4.1/5 (75 download)

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Book Synopsis Scanning and Transmission Electron Microscopy by : Stanley L. Flegler

Download or read book Scanning and Transmission Electron Microscopy written by Stanley L. Flegler and published by Oxford University Press, USA. This book was released on 1995 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: A core textbook for courses on electron microscopy Ideal for use in any laboratory, this book presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through: * microscope operation * image production * analytical techniques Specimen preparation is discussed in detail with emphasis on specific parameters for biological specimens. This unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available.

Introduction to Scanning Transmission Electron Microscopy

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Publisher :
ISBN 13 : 9780203749890
Total Pages : pages
Book Rating : 4.7/5 (498 download)

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Book Synopsis Introduction to Scanning Transmission Electron Microscopy by : Robert J. Keyse

Download or read book Introduction to Scanning Transmission Electron Microscopy written by Robert J. Keyse and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.

A Beginners' Guide to Scanning Electron Microscopy

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Author :
Publisher : Springer
ISBN 13 : 3319984829
Total Pages : 422 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis A Beginners' Guide to Scanning Electron Microscopy by : Anwar Ul-Hamid

Download or read book A Beginners' Guide to Scanning Electron Microscopy written by Anwar Ul-Hamid and published by Springer. This book was released on 2018-10-26 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.

Introduction to Scanning Transmission Electron Microscopy

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Publisher : Springer
ISBN 13 : 9789813083431
Total Pages : 114 pages
Book Rating : 4.0/5 (834 download)

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Book Synopsis Introduction to Scanning Transmission Electron Microscopy by : Robert J. Keyse

Download or read book Introduction to Scanning Transmission Electron Microscopy written by Robert J. Keyse and published by Springer. This book was released on 1997-07-28 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt: STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Analytical Transmission Electron Microscopy

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Publisher : Springer Science & Business
ISBN 13 : 9401786011
Total Pages : 357 pages
Book Rating : 4.4/5 (17 download)

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Book Synopsis Analytical Transmission Electron Microscopy by : Jürgen Thomas

Download or read book Analytical Transmission Electron Microscopy written by Jürgen Thomas and published by Springer Science & Business. This book was released on 2014-04-17 with total page 357 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.

Microelectronics Failure Analysis

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Publisher : ASM International
ISBN 13 : 1615037268
Total Pages : 673 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis Microelectronics Failure Analysis by : EDFAS Desk Reference Committee

Download or read book Microelectronics Failure Analysis written by EDFAS Desk Reference Committee and published by ASM International. This book was released on 2011 with total page 673 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes bibliographical references and index.

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

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Publisher : World Scientific Publishing Company
ISBN 13 : 1783265302
Total Pages : 432 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) by : Rolf Erni

Download or read book Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) written by Rolf Erni and published by World Scientific Publishing Company. This book was released on 2015-03-23 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Scanning Transmission Electron Microscopy of Nanomaterials

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Publisher :
ISBN 13 : 9781848167896
Total Pages : 571 pages
Book Rating : 4.1/5 (678 download)

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Book Synopsis Scanning Transmission Electron Microscopy of Nanomaterials by : Nobuo Tanaka

Download or read book Scanning Transmission Electron Microscopy of Nanomaterials written by Nobuo Tanaka and published by . This book was released on 2014 with total page 571 pages. Available in PDF, EPUB and Kindle. Book excerpt: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Aberration-Corrected Analytical Transmission Electron Microscopy

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 1119979900
Total Pages : 235 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Aberration-Corrected Analytical Transmission Electron Microscopy by : Rik Brydson

Download or read book Aberration-Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Scanning Electron Microscopy

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Publisher : Springer
ISBN 13 : 3540389679
Total Pages : 538 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Scanning Electron Microscopy by : Ludwig Reimer

Download or read book Scanning Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Scanning and Transmission Electron Microscopy

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Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (128 download)

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Book Synopsis Scanning and Transmission Electron Microscopy by : Stanley L. Flegler

Download or read book Scanning and Transmission Electron Microscopy written by Stanley L. Flegler and published by . This book was released on 1993 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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Publisher : Cambridge University Press
ISBN 13 : 113944638X
Total Pages : 232 pages
Book Rating : 4.1/5 (394 download)

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Book Synopsis Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by : S. J. B. Reed

Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed and published by Cambridge University Press. This book was released on 2005-08-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.