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Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : 810 pages
Book Rating : 4.F/5 ( download)
Download or read book IEEE Standard ATLAS Test Language written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1984 with total page 810 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : 116 pages
Book Rating : 4.F/5 ( download)
Download or read book IEEE Standard C/ATLAS Syntax written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1982 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE ATLAS Committee
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 424 pages
Book Rating : 4.F/5 ( download)
Download or read book IEEE Standard ATLAS Test Language written by IEEE ATLAS Committee and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1978 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1248 pages
Book Rating : 4.:/5 (31 download)
Download or read book Index of Specifications and Standards written by and published by . This book was released on 2005 with total page 1248 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : 76 pages
Book Rating : 4.F/5 ( download)
Download or read book IEEE Standards written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1997 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Justyna Zander
Publisher : CRC Press
ISBN 13 : 135183391X
Total Pages : 690 pages
Book Rating : 4.3/5 (518 download)
Download or read book Model-Based Testing for Embedded Systems written by Justyna Zander and published by CRC Press. This book was released on 2017-12-19 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." —Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." —Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." —Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comté, Besançon, France, and co-author of Practical Model-Based Testing
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Publisher : DIANE Publishing
ISBN 13 : 1428983430
Total Pages : 1246 pages
Book Rating : 4.4/5 (289 download)
Download or read book Department Of Defense Index of Specifications and Standards Numerical Canceled Listing Part IV July 2005 written by and published by DIANE Publishing. This book was released on with total page 1246 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 : 9780738106229
Total Pages : pages
Book Rating : 4.1/5 (62 download)
Download or read book IEEE Standard Test Language for All Systems-Common/Abbreviated Test Language for All Systems (C/ATLAS): 716-1995 written by and published by . This book was released on 1995 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 434 pages
Book Rating : 4.F/5 ( download)
Download or read book IEEE Autotestcon Proceedings written by and published by . This book was released on 1989 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alexander Miczo
Publisher : John Wiley & Sons
ISBN 13 : 0471457779
Total Pages : 697 pages
Book Rating : 4.4/5 (714 download)
Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by John Wiley & Sons. This book was released on 2003-10-24 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Author : United States. Congress. House. Committee on Armed Services. Subcommittee on Investigations
Publisher :
ISBN 13 :
Total Pages : 76 pages
Book Rating : 4.:/5 (319 download)
Download or read book Fifty-second Report to Congress (January 1 Through December 31, 1981) of the Department of Defense written by United States. Congress. House. Committee on Armed Services. Subcommittee on Investigations and published by . This book was released on 1982 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Francis C. Wong
Publisher : Elsevier
ISBN 13 : 0080504345
Total Pages : 248 pages
Book Rating : 4.0/5 (85 download)
Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author :
Publisher :
ISBN 13 :
Total Pages : 348 pages
Book Rating : 4.:/5 (319 download)
Download or read book Federal Information Processing Standards Publication written by and published by . This book was released on 1983 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alexander D. Stoyenko
Publisher : Springer Science & Business Media
ISBN 13 : 1461540321
Total Pages : 335 pages
Book Rating : 4.4/5 (615 download)
Download or read book Constructing Predictable Real Time Systems written by Alexander D. Stoyenko and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher :
ISBN 13 :
Total Pages : 628 pages
Book Rating : 4.F/5 ( download)
Download or read book Quick Reference to IEEE Standards written by and published by . This book was released on 1986 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: "A complete index of all terms in IEEE Standards and ANSI Standards published by IEEE, together with tables of contents of all the documents indexed"--Cover.
Author : New York Public Library. Research Libraries
Publisher :
ISBN 13 :
Total Pages : 520 pages
Book Rating : 4.X/5 (1 download)
Download or read book Bibliographic Guide to Technology written by New York Public Library. Research Libraries and published by . This book was released on 1978 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher :
ISBN 13 :
Total Pages : 2062 pages
Book Rating : 4.F/5 ( download)
Download or read book The Publishers' Trade List Annual written by and published by . This book was released on 1985 with total page 2062 pages. Available in PDF, EPUB and Kindle. Book excerpt:
