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High Energy Electron Diffraction And Microscopy
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Book Synopsis High Energy Electron Diffraction and Microscopy by : L.-M. Peng
Download or read book High Energy Electron Diffraction and Microscopy written by L.-M. Peng and published by Oxford University Press, USA. This book was released on 2004 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
Book Synopsis Elastic and Inelastic Scattering in Electron Diffraction and Imaging by : Zhong-lin Wang
Download or read book Elastic and Inelastic Scattering in Electron Diffraction and Imaging written by Zhong-lin Wang and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 461 pages. Available in PDF, EPUB and Kindle. Book excerpt: Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
Book Synopsis Reflection High-Energy Electron Diffraction by : Ayahiko Ichimiya
Download or read book Reflection High-Energy Electron Diffraction written by Ayahiko Ichimiya and published by Cambridge University Press. This book was released on 2004-12-13 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: Publisher Description
Book Synopsis Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces by : P.K. Larsen
Download or read book Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces written by P.K. Larsen and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.
Book Synopsis High Energy Electron Diffraction and Microscopy by : L. M. Peng
Download or read book High Energy Electron Diffraction and Microscopy written by L. M. Peng and published by Oxford University Press. This book was released on 2004-01-08 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.
Book Synopsis Compendium of Surface and Interface Analysis by : The Surface Science Society of Japan
Download or read book Compendium of Surface and Interface Analysis written by The Surface Science Society of Japan and published by Springer. This book was released on 2018-02-19 with total page 807 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
Book Synopsis Interaction of Atoms and Molecules with Solid Surfaces by : V. Bortolani
Download or read book Interaction of Atoms and Molecules with Solid Surfaces written by V. Bortolani and published by Springer Science & Business Media. This book was released on 2013-11-22 with total page 693 pages. Available in PDF, EPUB and Kindle. Book excerpt: There is considerable interest, both fundamental and technological, in the way atoms and molecules interact with solid surfaces. Thus the description of heterogeneous catalysis and other surface reactions requires a detailed understand ing of molecule-surface interactions. The primary aim of this volume is to provide fairly broad coverage of atoms and molecules in interaction with a variety of solid surfaces at a level suitable for graduate students and research workers in condensed matter physics, chemical physics, and materials science. The book is intended for experimental workers with interests in basic theory and concepts and had its origins in a Spring College held at the International Centre for Theoretical Physics, Miramare, Trieste. Valuable background reading can be found in the graduate-Ievel introduction to the physics of solid surfaces by ZangwilI(1) and in the earlier works by Garcia Moliner and F1ores(2) and Somorjai.(3) For specifically molecule-surface interac tions, additional background can be found in Rhodin and Ertl(4) and March.(S) V. Bortolani N. H. March M. P. Tosi References 1. A. Zangwill, Physics at Surfaces, Cambridge University Press, Cambridge (1988). 2. F. Garcia-Moliner and F. Flores, Introduction to the Theory of Solid Surfaces, Cambridge University Press, Cambridge (1979). 3. G. A. Somorjai, Chemistry in Two Dimensions: Surfaces, Cornell University Press, Ithaca, New York (1981). 4. T. N. Rhodin and G. Erd, The Nature of the Surface Chemical Bond, North-Holland, Amsterdam (1979). 5. N. H. March, Chemical Bonds outside Metal Surfaces, Plenum Press, New York (1986).
Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook
Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Book Synopsis Surface Microscopy with Low Energy Electrons by : Ernst Bauer
Download or read book Surface Microscopy with Low Energy Electrons written by Ernst Bauer and published by Springer. This book was released on 2014-07-10 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Book Synopsis Transmission Electron Microscopy by : C. Barry Carter
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Book Synopsis Reflection Electron Microscopy and Spectroscopy for Surface Analysis by : Zhong Lin Wang
Download or read book Reflection Electron Microscopy and Spectroscopy for Surface Analysis written by Zhong Lin Wang and published by Cambridge University Press. This book was released on 1996-05-23 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Book Synopsis Applications of Physical Methods to Inorganic and Bioinorganic Chemistry by : Robert A. Scott
Download or read book Applications of Physical Methods to Inorganic and Bioinorganic Chemistry written by Robert A. Scott and published by John Wiley & Sons. This book was released on 2007-12-10 with total page 597 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern spectroscopic and instrumental techniques are essential to the practice of inorganic and bioinorganic chemistry. This first volume in the new Wiley Encyclopedia of Inorganic Chemistry Methods and Applications Series provides a consistent and comprehensive description of the practical applicability of a large number of techniques to modern problems in inorganic and bioinorganic chemistry. The outcome is a text that provides invaluable guidance and advice for inorganic and bioinorganic chemists to select appropriate techniques, whilst acting as a source to the understanding of these methods. This volume is also available as part of Encyclopedia of Inorganic Chemistry, 5 Volume Set. This set combines all volumes published as EIC Books from 2007 to 2010, representing areas of key developments in the field of inorganic chemistry published in the Encyclopedia of Inorganic Chemistry. Find out more.
Book Synopsis Transmission Electron Microscopy by : Ludwig Reimer
Download or read book Transmission Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Book Synopsis In Situ Characterization of Thin Film Growth by : Gertjan Koster
Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques
Book Synopsis Materials Discovery and Design by : Turab Lookman
Download or read book Materials Discovery and Design written by Turab Lookman and published by Springer. This book was released on 2018-09-22 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book addresses the current status, challenges and future directions of data-driven materials discovery and design. It presents the analysis and learning from data as a key theme in many science and cyber related applications. The challenging open questions as well as future directions in the application of data science to materials problems are sketched. Computational and experimental facilities today generate vast amounts of data at an unprecedented rate. The book gives guidance to discover new knowledge that enables materials innovation to address grand challenges in energy, environment and security, the clearer link needed between the data from these facilities and the theory and underlying science. The role of inference and optimization methods in distilling the data and constraining predictions using insights and results from theory is key to achieving the desired goals of real time analysis and feedback. Thus, the importance of this book lies in emphasizing that the full value of knowledge driven discovery using data can only be realized by integrating statistical and information sciences with materials science, which is increasingly dependent on high throughput and large scale computational and experimental data gathering efforts. This is especially the case as we enter a new era of big data in materials science with the planning of future experimental facilities such as the Linac Coherent Light Source at Stanford (LCLS-II), the European X-ray Free Electron Laser (EXFEL) and MaRIE (Matter Radiation in Extremes), the signature concept facility from Los Alamos National Laboratory. These facilities are expected to generate hundreds of terabytes to several petabytes of in situ spatially and temporally resolved data per sample. The questions that then arise include how we can learn from the data to accelerate the processing and analysis of reconstructed microstructure, rapidly map spatially resolved properties from high throughput data, devise diagnostics for pattern detection, and guide experiments towards desired targeted properties. The authors are an interdisciplinary group of leading experts who bring the excitement of the nascent and rapidly emerging field of materials informatics to the reader.
Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo
Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Book Synopsis In-situ Electron Microscopy at High Resolution by : Florian Banhart
Download or read book In-situ Electron Microscopy at High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
