Handbook Of Auger Electron Spectroscopy

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Auger Electron Spectroscopy Reference Manual

Author : G. McGuire
Publisher : Springer Science & Business Media
ISBN 13 : 1475717024
Total Pages : 144 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Auger Electron Spectroscopy Reference Manual by : G. McGuire

Download or read book Auger Electron Spectroscopy Reference Manual written by G. McGuire and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt: Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability. subsequent deexcitation occurring by an outer-level electron de The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole. The excess energy is transferred to the need for an ultrahigh-vacuum system is due to the limited and causes the ejection of another electron, which is by definition mean free path of electrons in the 0-3000 e V kinetic energy an Auger electron. The Auger electron transition, denoted by range. The Auger peaks decay exponentially with overlayer cov the electron levels involved, is independent of the excitation erage, which is consistent with an exponential dependence of source and leaves the atom with a constant kinetic energy. The escape probability on the depth of the parent atom. A compila kinetic energy is given by the differences in binding energies for tion of data from a variety of sources has been used to generate the three levels (for example, EK-E L, - EL ) minus a correction 2 an escape depth curve which falls in the range of 5-30 A in the term for the work function and electron wave function relaxation. energy range from 0 to 3000 eV. The observed escape depth does When the Auger transition occurs within a few angstroms of the not show a strong dependence on the matrix.

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Author : Siegfried Hofmann
Publisher : Springer Science & Business Media
ISBN 13 : 3642273807
Total Pages : 544 pages
Book Rating : 4.6/5 (422 download)

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Book Synopsis Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by : Siegfried Hofmann

Download or read book Auger- and X-Ray Photoelectron Spectroscopy in Materials Science written by Siegfried Hofmann and published by Springer Science & Business Media. This book was released on 2012-10-25 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Handbook of Auger Electron Spectroscopy

Author : Kenton D. Childs
Publisher :
ISBN 13 : 9780964812406
Total Pages : 405 pages
Book Rating : 4.8/5 (124 download)

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Book Synopsis Handbook of Auger Electron Spectroscopy by : Kenton D. Childs

Download or read book Handbook of Auger Electron Spectroscopy written by Kenton D. Childs and published by . This book was released on 1995 with total page 405 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Handbook of Applied Solid State Spectroscopy

Author : D.R. Vij
Publisher : Springer Science & Business Media
ISBN 13 : 0387375902
Total Pages : 748 pages
Book Rating : 4.3/5 (873 download)

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Book Synopsis Handbook of Applied Solid State Spectroscopy by : D.R. Vij

Download or read book Handbook of Applied Solid State Spectroscopy written by D.R. Vij and published by Springer Science & Business Media. This book was released on 2007-02-15 with total page 748 pages. Available in PDF, EPUB and Kindle. Book excerpt: Solid-State spectroscopy is a burgeoning field with applications in many branches of science, including physics, chemistry, biosciences, surface science, and materials science. This handbook brings together in one volume information about various spectroscopic techniques that is currently scattered in the literature of these disciplines. This concise yet comprehensive volume covers theory and applications of a broad range of spectroscopies. It provides an overview of sixteen spectroscopic technique and self-contained chapters present up-to-date scientific and technical information and references with minimal overlap and redundancy.

An Introduction to Surface Analysis by XPS and AES

Author : John F. Watts
Publisher : John Wiley & Sons
ISBN 13 : 1119417643
Total Pages : 320 pages
Book Rating : 4.1/5 (194 download)

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Book Synopsis An Introduction to Surface Analysis by XPS and AES by : John F. Watts

Download or read book An Introduction to Surface Analysis by XPS and AES written by John F. Watts and published by John Wiley & Sons. This book was released on 2019-08-27 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Handbook of Surface and Interface Analysis

Author : John C. Riviere
Publisher : CRC Press
ISBN 13 : 1420007807
Total Pages : 671 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Handbook of Surface and Interface Analysis by : John C. Riviere

Download or read book Handbook of Surface and Interface Analysis written by John C. Riviere and published by CRC Press. This book was released on 2009-06-24 with total page 671 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear

Handbook of Monochromatic XPS Spectra

Author : B. Vincent Crist
Publisher : John Wiley & Sons
ISBN 13 : 0471492655
Total Pages : 562 pages
Book Rating : 4.4/5 (714 download)

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Book Synopsis Handbook of Monochromatic XPS Spectra by : B. Vincent Crist

Download or read book Handbook of Monochromatic XPS Spectra written by B. Vincent Crist and published by John Wiley & Sons. This book was released on 2000-10-19 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials. Offers a clear presentation of spectra with the rightamount of experimental detail. All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.

Practical Materials Characterization

Author : Mauro Sardela
Publisher : Springer
ISBN 13 : 1461492815
Total Pages : 242 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Practical Materials Characterization by : Mauro Sardela

Download or read book Practical Materials Characterization written by Mauro Sardela and published by Springer. This book was released on 2014-07-10 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Surface Analysis by Auger and X-ray Photoelectron Spectroscopy

Author : David Briggs
Publisher : Im Publications
ISBN 13 : 9781901019049
Total Pages : 899 pages
Book Rating : 4.0/5 (19 download)

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Book Synopsis Surface Analysis by Auger and X-ray Photoelectron Spectroscopy by : David Briggs

Download or read book Surface Analysis by Auger and X-ray Photoelectron Spectroscopy written by David Briggs and published by Im Publications. This book was released on 2003-01-01 with total page 899 pages. Available in PDF, EPUB and Kindle. Book excerpt:

An Introduction to Surface Analysis by Electron Spectroscopy

Author : John F. Watts
Publisher : Oxford University Press, USA
ISBN 13 :
Total Pages : 100 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis An Introduction to Surface Analysis by Electron Spectroscopy by : John F. Watts

Download or read book An Introduction to Surface Analysis by Electron Spectroscopy written by John F. Watts and published by Oxford University Press, USA. This book was released on 1990 with total page 100 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.

W Tungsten

Author : Wolfgang Kurtz
Publisher : Springer Science & Business Media
ISBN 13 : 3662086905
Total Pages : 358 pages
Book Rating : 4.6/5 (62 download)

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Book Synopsis W Tungsten by : Wolfgang Kurtz

Download or read book W Tungsten written by Wolfgang Kurtz and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 358 pages. Available in PDF, EPUB and Kindle. Book excerpt: The present volume continues the description of the chemical reactions of eiemental tungsten started with "Tungsten" Suppl. Vol. A 7. It covers the reactions with the metallic elements from zinc to actinoids. The treatment includes phase diagrams, bulk reactions, and surface processes which again are of outstanding importance in most systems. The raader is referred to the introductory remarks on pp. X/XI. Frankfurt am Main Ernst Koch November 1987 Introductory Remarks Abbreviations In order not to overload the text, the following abbreviations are sometimes used without definitions in the present volume, in addition to the abbreviations usual in the Gmelin Handbook. a. c. alternating current AE Auger electron Auger electron spectroscopy(ic) or spectrum AES bcc body-centered cubic CPD contact potential difference counts per second cps d. c. direct current DTA differential thermoanalysis Fermi Ievel EF EI electron impact ELS electron energy loss spectroscopy or spectrum EMF, emf electromotive force fcc face-centered cubic FE field emission field electron (emission) microscope(ic) FEM FES field emission spectroscopy FIM field ion microscope(ic) F-N Fowler-Nordheim hcp hexagonal close-packed 6 L Langmuir=1·10- Torr·s LEED low energy electron diffraction monolayer ML PES photoelectron spectroscopy PSD photon-stimulated desorption RHEED reflection high energy electron diffraction room temperature RT SI secondary ion SIMS secondary ion mass spectrometry TDS thermal desorption spectroscopy(ic) or spectrum TE thermionic emission total energy distribution TED UHV ultra-high vacuum UPS ultra-violet photoelectron spectroscopy(ic) or spectrum XPS X-ray photoelectron spectroscopy(ic) or spectrum Gmelin Handbock WSuppl. Vol.

Handbook of X-Ray Data

Author : Günter H. Zschornack
Publisher : Springer Science & Business Media
ISBN 13 : 3540286187
Total Pages : 969 pages
Book Rating : 4.5/5 (42 download)

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Book Synopsis Handbook of X-Ray Data by : Günter H. Zschornack

Download or read book Handbook of X-Ray Data written by Günter H. Zschornack and published by Springer Science & Business Media. This book was released on 2007-01-24 with total page 969 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Author : Patrick Echlin
Publisher : Springer Science & Business Media
ISBN 13 : 1475790279
Total Pages : 463 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Advanced Scanning Electron Microscopy and X-Ray Microanalysis by : Patrick Echlin

Download or read book Advanced Scanning Electron Microscopy and X-Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

ToF-SIMS

Author : J. C. Vickerman
Publisher : IM Publications
ISBN 13 : 1906715173
Total Pages : 742 pages
Book Rating : 4.9/5 (67 download)

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Book Synopsis ToF-SIMS by : J. C. Vickerman

Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

Electron Microscopy

Author : S. Amelinckx
Publisher : John Wiley & Sons
ISBN 13 : 3527614559
Total Pages : 527 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Electron Microscopy by : S. Amelinckx

Download or read book Electron Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 527 pages. Available in PDF, EPUB and Kindle. Book excerpt: Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Molten Salt Chemistry

Author : Gleb Mamantov
Publisher : Springer Science & Business Media
ISBN 13 : 9400938632
Total Pages : 538 pages
Book Rating : 4.4/5 (9 download)

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Book Synopsis Molten Salt Chemistry by : Gleb Mamantov

Download or read book Molten Salt Chemistry written by Gleb Mamantov and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Molten salts are of considerable significance to chemical technology. Applications range from the established ones, such as the production of aluminum, magnesium, sodium and fluorine, to those as yet to be fully exploited, such as molten salt batteries and fuel cells, catalysis, and solar energy. Molten salts are investigated for different purposes by many diverse techniques. There is a need to keep investigators working in different areas, such as metal production, power sources, and glass industry, aware of progress in various specialties, as well as to familiarize new research workers with the fundamental aspects of the broad field of molten salt _ chemistry. This volume constitutes the plenary lectures presented at the NATO Advanced Study Institute on Molten Salt Chemistry, Camerino, Italy, August 3-15, 1986. The fundamentals and several selected applications of molten salt chemistry were addressed. The major fundamental topics covered at this ASI were the structure of melts, thermodynamics of molten salt mixtures, theoretical and experimental studies of transport processes, metal-metal salt solutions, solvent properties of melt systems, acid-base effects in molten salt chemistry, electronic absorption, vibrational, and nuclear magnetic resonance spectroscopy of melt systems, electrochemistry and electroanalytical chemistry in molten salts, and organic chemistry in molten salts. The applied aspects of molten salt chemistry included the chemistry of aluminum production, electrodeposition using molten salts, and molten salt batteries and fuel cells.

Spectroscopy for Materials Characterization

Author : Simonpietro Agnello
Publisher : John Wiley & Sons
ISBN 13 : 1119697328
Total Pages : 500 pages
Book Rating : 4.1/5 (196 download)

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Book Synopsis Spectroscopy for Materials Characterization by : Simonpietro Agnello

Download or read book Spectroscopy for Materials Characterization written by Simonpietro Agnello and published by John Wiley & Sons. This book was released on 2021-09-08 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.