Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (137 download)

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Book Synopsis Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications by : Automotive Electronic Systems Reliability Standards

Download or read book Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications written by Automotive Electronic Systems Reliability Standards and published by . This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook.Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter. Striving for the target of Zero Defects in component manufacturing and product use it is strongly recommended to apply this handbook. If it gets adopted as a standard, the term "shall" will represent a binding requirement.This document does not relieve the supplier of the responsibility to assure that a product meets the complete set of its requirements. Error and issue corrections with latest state of art updates.

Surface Vehicle Recommended Practice

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ISBN 13 :
Total Pages : 45 pages
Book Rating : 4.:/5 (244 download)

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Book Synopsis Surface Vehicle Recommended Practice by : Society of Automotive Engineers

Download or read book Surface Vehicle Recommended Practice written by Society of Automotive Engineers and published by . This book was released on 2007 with total page 45 pages. Available in PDF, EPUB and Kindle. Book excerpt:

(R) Handbook for Robustness Validation of Automotive Electrical/electronic Modules

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ISBN 13 :
Total Pages : 126 pages
Book Rating : 4.:/5 (927 download)

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Book Synopsis (R) Handbook for Robustness Validation of Automotive Electrical/electronic Modules by :

Download or read book (R) Handbook for Robustness Validation of Automotive Electrical/electronic Modules written by and published by . This book was released on 2012 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This document addresses robustness of electrical/electronic modules for use in automotive applications. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. This document primarily deals with electrical/electronic modules (EEMs), but can easily be adapted for use on mechatronics, sensors, actuators and switches. EEM qualification is the main scope of this document. Other procedures addressing random failures are specifically addressed in the CPI (Component Process Interaction) section 10. This document is to be used within the context of the Zero Defect concept for component manufacturing and product use. It is recommended that the robustness of semiconductor devices and other components used in the EEM be assured using SAE J1879 OCT2007, Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications. The emphasis of this document is on hardware and manufacturing failure mechanisms, however, other contemporary issues as shown in Figure 1 need to be addressed for a thorough Robustness Validation. A Pareto of contemporary issues is shown in Figure 1. Although this document addresses many of the issues shown, however some are outside the scope of this document and will need to be addressed for a thorough RV process application. Examples of issues outside the scope of this document are system interactions, interfaces, functionality, HMI (Human-Machine Interface) and software. At the time of publication of this handbook, a system level Robustness Validation handbook, which addresses these issues, had been initiated"--Publisher's website.

Handbook for Robustness Validation of Automotive Electrical/Electronic Modules

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (137 download)

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Book Synopsis Handbook for Robustness Validation of Automotive Electrical/Electronic Modules by : Automotive Electronic Systems Reliability Standards

Download or read book Handbook for Robustness Validation of Automotive Electrical/Electronic Modules written by Automotive Electronic Systems Reliability Standards and published by . This book was released on 2012 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document addresses robustness of electrical/electronic modules for use in automotive applications. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. This document primarily deals with electrical/electronic modules (EEMs), but can easily be adapted for use on mechatronics, sensors, actuators and switches. EEM qualification is the main scope of this document. Other procedures addressing random failures are specifically addressed in the CPI (Component Process Interaction) section 10. This document is to be used within the context of the Zero Defect concept for component manufacturing and product use.It is recommended that the robustness of semiconductor devices and other components used in the EEM be assured using SAE J1879 OCT2007, Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications.The emphasis of this document is on hardware and manufacturing failure mechanisms, however, other contemporary issues as shown in Figure 1 need to be addressed for a thorough Robustness Validation. A Pareto of contemporary issues is shown in Figure 1. Although this document addresses many of the issues shown, however some are outside the scope of this document and will need to be addressed for a thorough RV process application. Examples of issues outside the scope of this document are system interactions, interfaces, functionality, HMI (Human-Machine Interface) and software. At the time of publication of this handbook, a system level Robustness Validation handbook, which addresses these issues, had been initiated. In late 2006 Members of the SAE International Automotive Electronic Systems Reliability Standards Committee and ZVEI (German Electrical and Electronic Manufacturers` Association) formed a joint task force to update SAE Recommended Practice J1211 NOV1978 "Recommended Environmental Practices for Electronic Equipment Design." The 1978 of version of SAE J1211* was written in an era when electronics were first being introduced to the automobile. There was a high level of concern that the harsh environmental conditions experienced in locations in the vehicle could have a serious negative affect on the reliability of electronic components and systems. Some early engine control modules (ECMs) had failure rates in the 350 failures per million hours (f/106 hrs) range, or expressed in the customer's terms, a 25% probability of failure in the first 12 months of vehicle ownership. At that time, warranty data was presented in R/100 (repairs per 100 vehicles) units, for example, 25 R/100 at 12 months.In these early years, when the automotive electronics industry was in it's infancy, a large percentage of these were "hard" catastrophic and intermittent failures exacerbated by exposure to environmental extremes of temperature (40 °C to +85 °C); high mechanical loads from rough road vibration and rail shipment; mechanical shocks of up to 100g from handling and crash impact; severe electrical transients, electrostatic discharge and electromagnetic interference; large swings in electrical supply voltage; reverse electrical supply voltage; and exposure to highly corrosive chemicals (e.g., road salt and battery acid). The focus of the 1978 version of J1211 was on characterizing these harsh vehicle environment for areas of the vehicle (engine compartment, instrument panel, passenger compartment, truck, under body, etc.) and suggesting lab test methods which design engineers could use to evaluate the performance of their components and systems at or near the worst-case conditions expected in the area of the vehicle where their electrical/electronic components would be mounted. By testing their prototypes at the worst case conditions (i.e., at the product's specification limits) described in the 1978 version of J1211 designers were able to detect and design out weaknesses and thereby reduce the likelihood of failure due to environmental factors.By the mid-1980s, it became common practice to specify "test-to-pass" (zero failures allowed) environmental conditions-based reliability demonstration life tests with acceptance levels in the 90% to 95% reliability range (with confidence levels of 70% to 90%). This translates to approximately 5 to 20 f/106 hrs. The sample size for these tests was determined using binomial distribution statistical tables and this would result in a requirement to test 6 to 24 test units without experiencing a failure. If a failure occurred, the sample size would have to be increased and the testing continued without another failure till the "bogie" was reached. The environmental conditions during the test were typically defined such that the units under test were operated at specification limits based on J1211 recommended practices (e.g., 40°C and +85°C) for at least some portion of the total test time. The "goal" of passing such a demonstration test was often very challenging and the "test-analyze-fix" programs that resulted, although very time-consuming and expensive, produced much-needed reliability growth. Reliability improved significantly in the late 1980s and early 1990s and vehicle manufactures and their suppliers began expressing warranty data in R/1000 units instead of R/100 units.By the turn of the century automobile warranty periods had increased from 12 months to 3, 4, 5 (and even 10 years for some systems) and most manufacturers had started specifying life expectancies for vehicle components of 10, 15 and sometimes 20 years. And by this time several vehicle manufacturers and their best electrical/electronic component suppliers had improved reliability to the point where warranty data was being expressed in parts-per-million (ppm) in the triple, double and even single-digit range. This translates to failure rates in the 0.05 f/106 hrs range and better! The achievement of such high reliability is not the result of test-to-pass reliability demonstration testing based on binomial distribution statistical tables. With this method, reliability demonstration in the 99.99% to 99.9999% range would require thousands of test units! On the contrary, the methods and techniques used by engineering teams achieving such reliability excellence did not require increasingly large sample sizes, more expensive and lengthy testing, or more engineers. It is about working smarter, not harder; and about systems-level robust design and robustness validation thinking rather than component-level "test-to-pass" thinking.The task force leaders and members were of the strong opinion that the 2008 version of SAE J1211 should document the state-of-the-art methods and techniques being used by leading companies and engineering teams to achieve ultra-high reliability while at the same time reducing overall cost life-cycle and shortening time-to-market. The SAE International Automotive Electronic Systems Reliability Standards Committee and ZVEI (German Electrical and Electronic Manufacturers` Association) are hopeful that this Handbook for Robustness Validation of Automotive Electrical/Electronic Modules will help many companies and engineering teams make the transition from the 1980s "cookbook" reliability demonstration approach to a more effective, economically feasible knowledge-based Robustness Validation approach.* Relevant information and data from SAE J1211 NOV1978 is preserved in SAE J2837 "Environmental Conditions and Design Practices for Automotive Electronic Equipment: Reference Data from SAE J1211 NOV1978"

Advanced Microsystems for Automotive Applications 2009

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Publisher : Springer Science & Business Media
ISBN 13 : 3642007457
Total Pages : 477 pages
Book Rating : 4.6/5 (42 download)

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Book Synopsis Advanced Microsystems for Automotive Applications 2009 by : Gereon Meyer

Download or read book Advanced Microsystems for Automotive Applications 2009 written by Gereon Meyer and published by Springer Science & Business Media. This book was released on 2009-04-15 with total page 477 pages. Available in PDF, EPUB and Kindle. Book excerpt: The current economic crisis is cutting the automotive sector to the quick. Public authorities worldwide are now faced with requests for providing loans and accepting guarantees and even for putting large automotive companies under state control. Assessing the long-term benefits of such help and wei- ing the needs of different sectors against each other poses a major challenge for the national policies. Given the upcoming change of customer preferences and state regulations towards safety, sustainability and comfort of a car, the automotive industry is particularly called to prove its ability to make nec- sary innovations available in order to accelerate its pace to come out of the crisis. Consequently the Green Car is assuming a prominent role in the current debate. Various power train concepts are currently under discussion for the Green Car including extremely optimised internal combustion engines, hybrid drives and battery-electric traction. Electrical cars are the most appealing option because they are free of local emissions and provide the opportunity to use primary energy from sources other than crude oil for transport. Well to wheel analysis show that their green-house gas emissions can be rated negligibly small if electricity from renewable sources like wind and solar is used.

Semiconductor Power Devices

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Publisher : Springer Science & Business Media
ISBN 13 : 3642111254
Total Pages : 539 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Semiconductor Power Devices by : Josef Lutz

Download or read book Semiconductor Power Devices written by Josef Lutz and published by Springer Science & Business Media. This book was released on 2011-01-15 with total page 539 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.

Handbook for Robustness Validation of Automotive Electrical/electronic Modules

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ISBN 13 :
Total Pages : 146 pages
Book Rating : 4.:/5 (553 download)

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Book Synopsis Handbook for Robustness Validation of Automotive Electrical/electronic Modules by :

Download or read book Handbook for Robustness Validation of Automotive Electrical/electronic Modules written by and published by . This book was released on 2008 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Applied Reliability for Industry 3

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Publisher : John Wiley & Sons
ISBN 13 : 178630693X
Total Pages : 212 pages
Book Rating : 4.7/5 (863 download)

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Book Synopsis Applied Reliability for Industry 3 by : Abdelkhalak El Hami

Download or read book Applied Reliability for Industry 3 written by Abdelkhalak El Hami and published by John Wiley & Sons. This book was released on 2023-05-09 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Safety of Controllers, Sensors, and Actuators

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Publisher : SAE International
ISBN 13 : 0768098181
Total Pages : 222 pages
Book Rating : 4.7/5 (68 download)

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Book Synopsis The Safety of Controllers, Sensors, and Actuators by : Juan Pimentel

Download or read book The Safety of Controllers, Sensors, and Actuators written by Juan Pimentel and published by SAE International. This book was released on 2019-03-07 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: Safety has been ranked as the number one concern for the acceptance and adoption of automated vehicles since safety has driven some of the most complex requirements in the development of self-driving vehicles. Recent fatal accidents involving self-driving vehicles have uncovered issues in the way some automated vehicle companies approach the design, testing, verification, and validation of their products. Traditionally, automotive safety follows functional safety concepts as detailed in the standard ISO 26262. However, automated driving safety goes beyond this standard and includes other safety concepts such as safety of the intended functionality (SOTIF) and multi-agent safety. The Safety of Controllers, Sensors, and Actuators addresses the concept of safety for self-driving vehicles through the inclusion of 10 recent and highly relevent SAE technical papers. Topics that these papers feature include risk reduction techniques in semiconductor-based systems, component certification, and safety assessment and audits for vehcicle components. As the fifth title in a series on automated vehicle safety, this contains introductory content by the Editor with 10 SAE technical papers specifically chosen to illuminate the specific safety topic of that book.

Embedded Mechatronic Systems

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Publisher : ISTE Press - Elsevier
ISBN 13 : 1785481894
Total Pages : 274 pages
Book Rating : 4.7/5 (854 download)

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Book Synopsis Embedded Mechatronic Systems by : Abdelkhalak El Hami

Download or read book Embedded Mechatronic Systems written by Abdelkhalak El Hami and published by ISTE Press - Elsevier. This book was released on 2019-12-15 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure throughout ever-increasing service lives. The particularly severe conditions of use of embedded mechatronics cause failure mechanisms which are the source of breakdowns. Until now, these failure phenomena have not been looked at with enough depth to be able to be controlled. Embedded Mechatronic Systems 1, Second Edition presents two methodologies: the statistical approach to the design optimization by reliability and the experimental approach for the characterization of the development of mechatronic systems in operating mode. It also analyzes new analysis tools on the effects of thermal, vibratory, humidity, electric and electromagnetic stresses. Presents a statistical approach to the design optimization by reliability It presents an experimental approach for the characterization of the development of mechatronic systems in operating mode The book analyzes new analysis tools on the effects of thermal, vibratory, humidity, electric and electromagnetic stresses

Recent Advances in Microelectronics Reliability

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Publisher : Springer Nature
ISBN 13 : 3031593618
Total Pages : 405 pages
Book Rating : 4.0/5 (315 download)

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Book Synopsis Recent Advances in Microelectronics Reliability by : Willem Dirk van Driel

Download or read book Recent Advances in Microelectronics Reliability written by Willem Dirk van Driel and published by Springer Nature. This book was released on with total page 405 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Issues in Electronics Research and Application: 2011 Edition

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Publisher : ScholarlyEditions
ISBN 13 : 1464963916
Total Pages : 1976 pages
Book Rating : 4.4/5 (649 download)

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Book Synopsis Issues in Electronics Research and Application: 2011 Edition by :

Download or read book Issues in Electronics Research and Application: 2011 Edition written by and published by ScholarlyEditions. This book was released on 2012-01-09 with total page 1976 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues in Electronics Research and Application: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Electronics Research and Application. The editors have built Issues in Electronics Research and Application: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Electronics Research and Application in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Electronics Research and Application: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Dependable Multicore Architectures at Nanoscale

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Publisher : Springer
ISBN 13 : 3319544225
Total Pages : 294 pages
Book Rating : 4.3/5 (195 download)

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Book Synopsis Dependable Multicore Architectures at Nanoscale by : Marco Ottavi

Download or read book Dependable Multicore Architectures at Nanoscale written by Marco Ottavi and published by Springer. This book was released on 2017-08-28 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.

Sensors for Safety and Process Control in Hydrogen Technologies

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Publisher : CRC Press
ISBN 13 : 1466596554
Total Pages : 387 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Sensors for Safety and Process Control in Hydrogen Technologies by : Thomas Hübert

Download or read book Sensors for Safety and Process Control in Hydrogen Technologies written by Thomas Hübert and published by CRC Press. This book was released on 2018-10-09 with total page 387 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understand, Select, and Design Sensors for Hydrogen-Based Applications The use of hydrogen generated from renewable energy sources is expected to become an essential component of a low-carbon, environmentally friendly energy supply, spurring the worldwide development of hydrogen technologies. Sensors for Safety and Process Control in Hydrogen Technologies provides practical, expert-driven information on modern sensors for hydrogen and other gases as well as physical parameters essential for safety and process control in hydrogen technologies. It illustrates how sensing technologies can ensure the safe and efficient implementation of the emerging global hydrogen market. The book explains the various facets of sensor technologies, including practical aspects relevant in hydrogen technologies. It presents a comprehensive and up-to-date account of the theory (physical and chemical principles), design, and implementations of sensors in hydrogen technologies. The authors also offer guidance on the development of new sensors based on the analysis of the capabilities and limitations of existing sensors with respect to current performance requirements. Suitable for both technical and non-technical personnel, the book provides a balance between detailed descriptions and simple explanations. It gives invaluable insight into the role sensors play as key enabling devices for both control and safety in established and emerging hydrogen technologies.

Power Electronics for the Next Generation Wind Turbine System

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Publisher : Springer
ISBN 13 : 3319212486
Total Pages : 198 pages
Book Rating : 4.3/5 (192 download)

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Book Synopsis Power Electronics for the Next Generation Wind Turbine System by : Ke Ma

Download or read book Power Electronics for the Next Generation Wind Turbine System written by Ke Ma and published by Springer. This book was released on 2015-07-25 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents recent studies on the power electronics used for the next generation wind turbine system. Some criteria and tools for evaluating and improving the critical performances of the wind power converters have been proposed and established. The book addresses some emerging problems as well as possibilities for the wind power conversion, and may be useful as an inspiring reference for the researchers in this field.

New Approaches to Reliability Qualification of Semiconductor Components Under Varying and Progressive Stresses

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Publisher : Cuvillier
ISBN 13 : 9783736975200
Total Pages : 166 pages
Book Rating : 4.9/5 (752 download)

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Book Synopsis New Approaches to Reliability Qualification of Semiconductor Components Under Varying and Progressive Stresses by : Alexander Hirler

Download or read book New Approaches to Reliability Qualification of Semiconductor Components Under Varying and Progressive Stresses written by Alexander Hirler and published by Cuvillier. This book was released on 2021-11-15 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the present work, urgent issues in the reliability qualification of semiconductor devices are addressed, which particularly affect value chains such as those in the automotive industry. These have particularly high requirements for long lifetime and low failure rates of their products, which are additionally exposed to more extreme operating and environmental conditions than in most other areas of application. In particular, the question arises on how to assess a product or semiconductor technology against the requirement of an application-specific mission profile with multiple non-constant stressors. For this purpose, the behavior of failure distributions under varying and progressive stress loads is investigated and described using cumulative damage models. For the first time, the industry-wide approach of transforming non-constant mission profiles into effective constant stress and test conditions for reliability assessment and qualification can be physically justified and substantiated with measurement data. This stress transformation is exemplified using the time-dependent dielectric breakdown (TDDB) failure mechanism with the two stressors voltage and temperature; and then extended to include the use of multi-dimensional mission profiles and interdependent stressors. These measurements are performed on university metal-oxide-semiconductor (MOS) capacitors as well as on commercially available state-of-the-art transistors. Finally, it is demonstrated that the obtained findings in the field of cumulative damage can be applied to use reliability studies with ramp-stress for acceleration model verification and to determine model parameters with less time and experimental effort

Semiconductor Device Reliability

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Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (89 download)

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Book Synopsis Semiconductor Device Reliability by : A. Christou

Download or read book Semiconductor Device Reliability written by A. Christou and published by . This book was released on 1989 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: