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ISBN 13 :
Total Pages : 526 pages
Book Rating : 4.3/5 (91 download)
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2000 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 664 pages
Book Rating : 4.3/5 (91 download)
Download or read book Proceedings written by and published by . This book was released on 1996 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rochit Rajsuman
Publisher : Artech House Publishers
ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.3/5 (91 download)
Download or read book Iddq Testing for CMOS VLSI written by Rochit Rajsuman and published by Artech House Publishers. This book was released on 1995 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.
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ISBN 13 :
Total Pages : 736 pages
Book Rating : 4.3/5 (91 download)
Download or read book Proceedings of the ... Midwest Symposium on Circuits and Systems written by and published by . This book was released on 1998 with total page 736 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher : Conference
ISBN 13 :
Total Pages : 1032 pages
Book Rating : 4.:/5 (318 download)
Download or read book Proceedings, International Test Conference 1995 written by and published by Conference. This book was released on 1995 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rochit Rajsuman
Publisher :
ISBN 13 :
Total Pages : 158 pages
Book Rating : 4.4/5 (91 download)
Download or read book Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California written by Rochit Rajsuman and published by . This book was released on 1994 with total page 158 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1360 pages
Book Rating : 4.3/5 (243 download)
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769506135
Total Pages : 528 pages
Book Rating : 4.5/5 (61 download)
Download or read book 18th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
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ISBN 13 :
Total Pages : 1860 pages
Book Rating : 4.3/5 (243 download)
Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 1860 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 138 pages
Book Rating : 4.3/5 (91 download)
Download or read book Digest of Papers written by and published by . This book was released on 1997 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 472 pages
Book Rating : 4.:/5 (31 download)
Download or read book Proceedings of the ... European Symposium on Reliability of Electron Devices, Failure Physics and Analysis written by and published by . This book was released on 1999 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 384 pages
Book Rating : 4.3/5 (91 download)
Download or read book Documentation Abstracts written by and published by . This book was released on 1994 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
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ISBN 13 :
Total Pages : 942 pages
Book Rating : 4.F/5 ( download)
Download or read book Dissertation Abstracts International written by and published by . This book was released on 2006 with total page 942 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher : Conference
ISBN 13 :
Total Pages : 1090 pages
Book Rating : 4.:/5 (318 download)
Download or read book International Test Conference, 1993 written by and published by Conference. This book was released on 1993 with total page 1090 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.
Author : Richard J. Ross
Publisher : ASM International(OH)
ISBN 13 :
Total Pages : 664 pages
Book Rating : 4.3/5 (91 download)
Download or read book Microelectronic Failure Analysis written by Richard J. Ross and published by ASM International(OH). This book was released on 1999 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed
Author : Jaume Segura
Publisher : John Wiley & Sons
ISBN 13 : 9780471476696
Total Pages : 370 pages
Book Rating : 4.4/5 (766 download)
Download or read book CMOS Electronics written by Jaume Segura and published by John Wiley & Sons. This book was released on 2004-03-26 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.
