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Fault Models In Testing
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Book Synopsis VLSI Fault Modeling and Testing Techniques by : George W. Zobrist
Download or read book VLSI Fault Modeling and Testing Techniques written by George W. Zobrist and published by Praeger. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.
Book Synopsis Formal Description Techniques IX by : R. Gotzhein
Download or read book Formal Description Techniques IX written by R. Gotzhein and published by Springer. This book was released on 1996-09-30 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the combined proceedings of the latest IFIP Formal Description Techniques (FDTs) and Protocol Specification, Testing and Verification (PSTV) series. It addresses FDTs applicable to communication protocols and distributed systems, with special emphasis on standardised FDTs. It features state-of-the-art in theory, application, tools and industrialisation of formal description.
Book Synopsis Delay Fault Testing for VLSI Circuits by : Angela Krstic
Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Book Synopsis Testing Static Random Access Memories by : Said Hamdioui
Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Book Synopsis Assessing Fault Model and Test Quality by : Kenneth M. Butler
Download or read book Assessing Fault Model and Test Quality written by Kenneth M. Butler and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt: For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.
Book Synopsis High Performance Memory Testing by : R. Dean Adams
Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Book Synopsis Data-Driven and Model-Based Methods for Fault Detection and Diagnosis by : Majdi Mansouri
Download or read book Data-Driven and Model-Based Methods for Fault Detection and Diagnosis written by Majdi Mansouri and published by Elsevier. This book was released on 2020-02-05 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: Data-Driven and Model-Based Methods for Fault Detection and Diagnosis covers techniques that improve the quality of fault detection and enhance monitoring through chemical and environmental processes. The book provides both the theoretical framework and technical solutions. It starts with a review of relevant literature, proceeds with a detailed description of developed methodologies, and then discusses the results of developed methodologies, and ends with major conclusions reached from the analysis of simulation and experimental studies. The book is an indispensable resource for researchers in academia and industry and practitioners working in chemical and environmental engineering to do their work safely. - Outlines latent variable based hypothesis testing fault detection techniques to enhance monitoring processes represented by linear or nonlinear input-space models (such as PCA) or input-output models (such as PLS) - Explains multiscale latent variable based hypothesis testing fault detection techniques using multiscale representation to help deal with uncertainty in the data and minimize its effect on fault detection - Includes interval PCA (IPCA) and interval PLS (IPLS) fault detection methods to enhance the quality of fault detection - Provides model-based detection techniques for the improvement of monitoring processes using state estimation-based fault detection approaches - Demonstrates the effectiveness of the proposed strategies by conducting simulation and experimental studies on synthetic data
Book Synopsis Micro-Electrode-Dot-Array Digital Microfluidic Biochips by : Zipeng Li
Download or read book Micro-Electrode-Dot-Array Digital Microfluidic Biochips written by Zipeng Li and published by Springer. This book was released on 2018-12-14 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an insightful guide to the design, testing and optimization of micro-electrode-dot-array (MEDA) digital microfluidic biochips. The authors focus on the characteristics specific for MEDA biochips, e.g., real-time sensing and advanced microfluidic operations like lamination mixing and droplet shape morphing. Readers will be enabled to enhance the automated design and use of MEDA and to develop a set of solutions to facilitate the full exploitation of design complexities that are possible with standard CMOS fabrication techniques. The book provides the first set of design automation and test techniques for MEDA biochips. The methods described in this book have been validated using fabricated MEDA biochips in the laboratory. Readers will benefit from an in-depth look at the MEDA platform and how to combine microfluidics with software, e.g., applying biomolecular protocols to software-controlled and cyberphysical microfluidic biochips.
Book Synopsis Integrated Circuit Test Engineering by : Ian A. Grout
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Book Synopsis Testing of Digital Systems by : N. K. Jha
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Book Synopsis Software Testing and Analysis by : Mauro Pezze
Download or read book Software Testing and Analysis written by Mauro Pezze and published by John Wiley & Sons. This book was released on 2008 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: Teaches readers how to test and analyze software to achieve an acceptable level of quality at an acceptable cost Readers will be able to minimize software failures, increase quality, and effectively manage costs Covers techniques that are suitable for near-term application, with sufficient technical background to indicate how and when to apply them Provides balanced coverage of software testing & analysis approaches By incorporating modern topics and strategies, this book will be the standard software-testing textbook
Book Synopsis Digital System Test and Testable Design by : Zainalabedin Navabi
Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Book Synopsis In-Circuit Testing by : John T. Bateson
Download or read book In-Circuit Testing written by John T. Bateson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 197 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this text is to increase your understanding of the methods employed for improving the quality of printed circuit boards (PCBs) in a practical manufacturing environment, by discussing printed circuit board faults and the test strategies implemented to detect these faults. This text emphasizes in-circuit testing as a prime test and diagnostic technique. Test strategies are described - implementing functional board testers, in-circuit board testers, in-circuit analyzers, and loaded board shorts testers. Also discussed are in-circuit tester's hardware, software, fix turing, and programming. Specific attention has been given to the in-circuit tester's capabilities and limitations, features and benefits, advantages and disadvantages. Chapter 5, as part of the total production testing process, discusses rework stations, network ing, and test area management. Chapter 8 is devoted to discussing the benefits derived by employing in-circuit testing in the service repair arena. This text concludes with chapters on vendor investiga tion and a financial justification. Additional emphasis is placed on having design engineering acquire an interest in manufacturability, testability, and the importance of consulting with manufacturing early in the design process. This book is designed for ease of reading and comprehension for all levels of interest: ATE students, fust-time ATE users, as well as those involved in test, manufacturing, quality control or assurance, production, engineering, and management.
Book Synopsis Digital Systems Testing and Testable Design by : Miron Abramovici
Download or read book Digital Systems Testing and Testable Design written by Miron Abramovici and published by Wiley-IEEE Press. This book was released on 1994-09-27 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Book Synopsis IDDQ Testing of VLSI Circuits by : Ravi K. Gulati
Download or read book IDDQ Testing of VLSI Circuits written by Ravi K. Gulati and published by Springer Science & Business Media. This book was released on 1992-12-31 with total page 134 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Book Synopsis System-level Test and Validation of Hardware/Software Systems by : Matteo Sonza Reorda
Download or read book System-level Test and Validation of Hardware/Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
