Experimental Determination of Dislocation Core Structures by HRTEM

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Publisher :
ISBN 13 :
Total Pages : 8 pages
Book Rating : 4.:/5 (946 download)

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Book Synopsis Experimental Determination of Dislocation Core Structures by HRTEM by :

Download or read book Experimental Determination of Dislocation Core Structures by HRTEM written by and published by . This book was released on 2001 with total page 8 pages. Available in PDF, EPUB and Kindle. Book excerpt: The overarching scientific goal of this study is to use state-of-the-art TEM techniques to experimentally characterize dislocation core structures in metals and alloys at the atomic scale. The past year has involved the culmination of efforts on intermetallic alloys and pure fcc metals and the development of new techniques for the study of bcc metals and alloys. Our work on (Ni, Fe)3 Ge indicated that changes in mechanical behavior associated with Fe additions are related to variations in dislocation core geometry and its effect on dislocation mobility. These findings have both motivated and been found to be in agreement with first principles based calculations of dislocation core structures in these alloys. In a related study, our weak-beam TEM and HREM experimental observations of dislocation core structures in fcc gold and iridium have been shown to be in excellent agreement with theoretical predictions for these metals. More recent efforts have focused on developing the techniques for characterizing dislocation core structures in bcc metals. Direct HREM observations of dislocation cores and the derivation of localized electron structure data from electron energy loss spectra (EELS) measurements are long term goals, and preliminary steps toward these challenging tasks are underway.

Characterization of Dislocation Core Structures in BCC Metals

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ISBN 13 :
Total Pages : 17 pages
Book Rating : 4.:/5 (742 download)

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Book Synopsis Characterization of Dislocation Core Structures in BCC Metals by :

Download or read book Characterization of Dislocation Core Structures in BCC Metals written by and published by . This book was released on 2004 with total page 17 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scientific aim of this study was to use state-of-the-art TEM techniques to experimentally describe dislocation core structures in bcc metals through experimental characterization of screw dislocations in single-crystalline Mo. Methods were developed for deriving localized electron structure data from electron energy loss spectra (EELS) taken from perfect lattice regions and along dislocations and low angle boundaries in ordered NiAl. Significant changes in the fine structure of the NiL edge were associated with 001 dislocations in NiAl and comparisons with first-principles were used to characterize localized electronic structure and bonding in the vicinity of this dislocation. However, difficulties associated with the position of the energy edges for Mo precluded application of this technique to the study of 1/2111 screw dislocations in single-crystalline Mo. For this reason, the majority of this study focused on: direct HREM observations of the atomic columns surrounding 1/2111 screw dislocations in Mo, characterization of the displacement fields associated with these dislocations, mitigation of experimental noise, and comparison of the experimental observations with theoretically predicted dislocation structures.

Sub Angstrom Imaging of Dislocation Core Structures

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (727 download)

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Book Synopsis Sub Angstrom Imaging of Dislocation Core Structures by :

Download or read book Sub Angstrom Imaging of Dislocation Core Structures written by and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: During the past 50 years Transmission Electron Microscopy (TEM) has evolved from an imaging tool to a quantitative method that approaches the ultimate goal of understanding the atomic structure of materials atom by atom in three dimensions both experimentally and theoretically. Today's TEM abilities are tested in the special case of a Ga terminated 30 degree partial dislocation in GaAs:Be where it is shown that a combination of high-resolution phase contrast imaging, Scanning TEM, and local Electron Energy Loss Spectroscopy allows for a complete analysis of dislocation cores and associated stacking faults. We find that it is already possible to locate atom column positions with picometer precision in directly interpretable images of the projected crystal structure and that chemically different elements can already be identified together with their local electronic structure. In terms of theory, the experimental results can be quantitatively compared with ab initio electronic structure total energy calculations. By combining elasticity theory methods with atomic theory an equivalent crystal volume can be addressed. Therefore, it is already feasible to merge experiments and theory on a picometer length scale. While current experiments require the utilization of different, specialized instruments it is foreseeable that the rapid improvement of electron optical elements will soon generate a next generation of microscopes with the ability to image and analyze single atoms in one instrument with deep sub Angstrom spatial resolution and an energy resolution better than 100 meV.

Dislocations in Solids

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Publisher : Elsevier
ISBN 13 : 0444535349
Total Pages : 292 pages
Book Rating : 4.4/5 (445 download)

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Book Synopsis Dislocations in Solids by :

Download or read book Dislocations in Solids written by and published by Elsevier. This book was released on 2009-08-28 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: New materials addressed for the first time include the chapters on minerals by Barber et al and the chapter on dislocations in colloidal crystals by Schall and Spaepen. Moriarty et al extend the first principles calculations of kink configurations in bcc metals to high pressures, including the use of flexible boundary conditions to model dilatational effects. Rabier et al clarify the issue of glide-shuffle slip systems in diamond cubic and related III-V compounds. Metadislocations, discussed by Feuerbacher and Heggen, represent a new type of defect in multicomponent metal compounds and alloys. Kink mechanisms for dislocation motion at high pressure in bcc metals Dislocation core structures identified in silicon at high stress Metadislocations, a new type of defect, identified and described Extension of dislocation concepts to complex minerals First observations of dislocations in colloidal crystals

Microscopy of Semiconducting Materials 2001

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Publisher : CRC Press
ISBN 13 : 1351083074
Total Pages : 626 pages
Book Rating : 4.3/5 (51 download)

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Book Synopsis Microscopy of Semiconducting Materials 2001 by : A.G. Cullis

Download or read book Microscopy of Semiconducting Materials 2001 written by A.G. Cullis and published by CRC Press. This book was released on 2018-01-18 with total page 626 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Institute of Physics Conference Series is a leading International medium for the rapid publication of proceedings of major conferences and symposia reviewing new developments in physics and related areas. Volumes in the series comprise original refereed papers and are regarded as standard referee works. As such, they are an essential part of major libration collections worldwide. The twelfth conference on the Microscopy of Semiconducting Materials (MSM) was held at the University of Oxford, 25-29 March 2001. MSM conferences focus on recent international advances in semiconductor studies carried out by all forms of microscopy. The event was organized with scientific sponsorship by the Royal Microscopical Society, The Electron Microscopy and Analysis Group of the Institute of Physics and the Materials Research Society. With the continual shrinking of electronic device dimensions and accompanying enhancement in device performance, the understanding of semiconductor microscopic properties at the nanoscale (and even at the atomic scale) is increasingly critical for further progress to be achieved. This conference proceedings provides an overview of the latest instrumentation, analysis techniques and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and materials scientists.

Dislocations in Solids

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Publisher : CRC Press
ISBN 13 : 1466561343
Total Pages : 691 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Dislocations in Solids by : Hiroshi Suzuki

Download or read book Dislocations in Solids written by Hiroshi Suzuki and published by CRC Press. This book was released on 2023-03-08 with total page 691 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume comprises the Proceedings of the Yamada Conference IX on Dislocations in Solids, held in August 1984 in Tokyo. The purpose of the conference was two-fold: firstly to evaluate the increasing data on basic properties of dislocations and their interaction with other types of defects in solids and, secondly, to increase understanding of the material properties brought about by dislocation-related phenomena. Metals and alloys, semi-conductors and ions crystals were discussed. One of the important points of contention was the electronic state at the core of dislocation. Another was the dislocation model of amorphous structure.

High Resolution Electron Microscopy of Defects in Materials: Volume 183

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Publisher : Pittsburgh, Pa. : Materials Research Society
ISBN 13 :
Total Pages : 424 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis High Resolution Electron Microscopy of Defects in Materials: Volume 183 by : Materials Research Society

Download or read book High Resolution Electron Microscopy of Defects in Materials: Volume 183 written by Materials Research Society and published by Pittsburgh, Pa. : Materials Research Society. This book was released on 1990-08-10 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Dislocations in Solids

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Publisher : VSP
ISBN 13 : 9789067640435
Total Pages : 696 pages
Book Rating : 4.6/5 (44 download)

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Book Synopsis Dislocations in Solids by : Hideji Suzuki

Download or read book Dislocations in Solids written by Hideji Suzuki and published by VSP. This book was released on 1985-12 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume comprises the Proceedings of the Yamada Conference IX on Dislocations in Solids, held in August 1984 in Tokyo. The purpose of the conference was two-fold: firstly to evaluate the increasing data on basic properties of dislocations and their interaction with other types of defects in solids and, secondly, to increase understanding of the material properties brought about by dislocation-related phenomena. Metals and alloys, semi-conductors and ions crystals were discussed. One of the important points of contention was the electronic state at the core of dislocation. Another was the dislocation model of amorphous structure.

Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

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Publisher : CRC Press
ISBN 13 : 1000157016
Total Pages : 836 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 by : A.G. Cullis

Download or read book Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 written by A.G. Cullis and published by CRC Press. This book was released on 2021-02-01 with total page 836 pages. Available in PDF, EPUB and Kindle. Book excerpt: The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.

The Surface Science of Metal Oxides

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Publisher : Cambridge University Press
ISBN 13 : 9780521566872
Total Pages : 484 pages
Book Rating : 4.5/5 (668 download)

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Book Synopsis The Surface Science of Metal Oxides by : Victor E. Henrich

Download or read book The Surface Science of Metal Oxides written by Victor E. Henrich and published by Cambridge University Press. This book was released on 1994 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: Publisher Description

The Plaston Concept

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Publisher : Springer Nature
ISBN 13 : 9811677158
Total Pages : 278 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis The Plaston Concept by : Isao Tanaka

Download or read book The Plaston Concept written by Isao Tanaka and published by Springer Nature. This book was released on 2022 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt: This open access book presents the novel concept of plaston, which accounts for the high ductility or large plastic deformation of emerging high-performance structural materials, including bulk nanostructured metals, hetero-nanostructured materials, metallic glasses, intermetallics, and ceramics. The book describes simulation results of the collective atomic motion associated with plaston, by computational tools such as first-principle methods with predictive performance and large-scale atom-dynamics calculations. Multi-scale analyses with state-of-the art analytical tools nano/micro pillar deformation and nano-indentation experiments are also described. Finally, through collaborative efforts of experimental and computational work, examples of rational design and development of new structural materials are given, based on accurate understanding of deformation and fracture phenomena. This publication provides a valuable contribution to the field of structural materials research.

Proceedings of the Second International Symposium on Process Physics and Modeling in Semiconductor Technology

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Publisher :
ISBN 13 :
Total Pages : 826 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Proceedings of the Second International Symposium on Process Physics and Modeling in Semiconductor Technology by : G. R. Srinivasan

Download or read book Proceedings of the Second International Symposium on Process Physics and Modeling in Semiconductor Technology written by G. R. Srinivasan and published by . This book was released on 1991 with total page 826 pages. Available in PDF, EPUB and Kindle. Book excerpt:

In-Situ Transmission Electron Microscopy Experiments

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Publisher : John Wiley & Sons
ISBN 13 : 3527834842
Total Pages : 389 pages
Book Rating : 4.5/5 (278 download)

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Book Synopsis In-Situ Transmission Electron Microscopy Experiments by : Renu Sharma

Download or read book In-Situ Transmission Electron Microscopy Experiments written by Renu Sharma and published by John Wiley & Sons. This book was released on 2023-05-10 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.

纳米技术中的显微学手册

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Publisher : 清华大学出版社有限公司
ISBN 13 : 9787302097587
Total Pages : 440 pages
Book Rating : 4.0/5 (975 download)

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Book Synopsis 纳米技术中的显微学手册 by :

Download or read book 纳米技术中的显微学手册 written by and published by 清华大学出版社有限公司. This book was released on 2005 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: 本书叙述了电子显微学的内容,共有12个专题。力图使读者对所叙述的方法有一个概念上的理解,而不是只停留在对理论的堆砌上。

Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms

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Publisher : Springer
ISBN 13 : 3319483021
Total Pages : 112 pages
Book Rating : 4.3/5 (194 download)

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Book Synopsis Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms by : Jozef Veselý

Download or read book Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms written by Jozef Veselý and published by Springer. This book was released on 2016-11-25 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.

Multiscale Phenomena in Plasticity: From Experiments to Phenomenology, Modelling and Materials Engineering

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Publisher : Springer Science & Business Media
ISBN 13 : 9401140480
Total Pages : 540 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Multiscale Phenomena in Plasticity: From Experiments to Phenomenology, Modelling and Materials Engineering by : Joël Lépinoux

Download or read book Multiscale Phenomena in Plasticity: From Experiments to Phenomenology, Modelling and Materials Engineering written by Joël Lépinoux and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: A profusion of research and results on the mechanical behaviour of crystalline solids has followed the discovery of dislocations in the early thirties. This trend has been enhanced by the development of powerful experimental techniques. particularly X ray diffraction. transmission and scanning electron microscopy. microanalysis. The technological advancement has given rise to the study of various and complex materials. not to speak of those recently invented. whose mechanical properties need to be mastered. either for their lise as structural materials. or more simply for detenllining their fonnability processes. As is often the case this fast growth has been diverted both by the burial of early fundamental results which are rediscovered more or less accurately. and by the too fast publication of inaccurate results. which propagate widely. and are accepted without criticism. Examples of these statements abound. and will not be quoted here for the sake of dispassionateness. Understanding the mechanical properties of materials implies the use of various experimental techniques. combined with a good theoretical knowledge of elasticity. thermodynamics and solid state physics. The recent development of various computer techniques (simulation. ab initio calculations) has added to the difficulty of gathering the experimental information. and mastering the theoretical understanding. No laboratory is equipped with all the possible experimental settings. almost no scientist masters all this theoretical kno\vledge. Therefore. cooperation between scientists is needed more than even before.

Materials Interfaces

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Publisher : Springer Science & Business Media
ISBN 13 : 9780412412707
Total Pages : 748 pages
Book Rating : 4.4/5 (127 download)

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Book Synopsis Materials Interfaces by : D. Wolf

Download or read book Materials Interfaces written by D. Wolf and published by Springer Science & Business Media. This book was released on 1992-10-31 with total page 748 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces.