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Author : Benjamin Andrew Simkin
Publisher :
ISBN 13 :
Total Pages : 266 pages
Book Rating : 4.3/5 (129 download)
Download or read book Establishment and Applications of Electron Channeling Contrast Imaging written by Benjamin Andrew Simkin and published by . This book was released on 1997 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Benjamin Andrew Simkin
Publisher :
ISBN 13 :
Total Pages : 222 pages
Book Rating : 4.:/5 (18 download)
Download or read book Establishment and Application of Electron Channeling Contrast Imaging written by Benjamin Andrew Simkin and published by . This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Patrick Echlin
Publisher : Springer Science & Business Media
ISBN 13 : 1475790279
Total Pages : 463 pages
Book Rating : 4.4/5 (757 download)
Download or read book Advanced Scanning Electron Microscopy and X-Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Author : Adam J. Schwartz
Publisher : Springer Science & Business Media
ISBN 13 : 1475732058
Total Pages : 352 pages
Book Rating : 4.4/5 (757 download)
Download or read book Electron Backscatter Diffraction in Materials Science written by Adam J. Schwartz and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author :
Publisher :
ISBN 13 :
Total Pages : 842 pages
Book Rating : 4.E/5 ( download)
Download or read book Journal of Research of the National Institute of Standards and Technology written by and published by . This book was released on 1995 with total page 842 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Author : C. Barry Carter
Publisher : Springer
ISBN 13 : 3319266519
Total Pages : 543 pages
Book Rating : 4.3/5 (192 download)
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author : Ray Egerton
Publisher : Springer Science & Business Media
ISBN 13 : 9780387258003
Total Pages : 224 pages
Book Rating : 4.2/5 (58 download)
Download or read book Physical Principles of Electron Microscopy written by Ray Egerton and published by Springer Science & Business Media. This book was released on 2011-02-11 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author : Michio Inagaki
Publisher : Butterworth-Heinemann
ISBN 13 : 0128054689
Total Pages : 340 pages
Book Rating : 4.1/5 (28 download)
Download or read book Materials Science and Engineering of Carbon written by Michio Inagaki and published by Butterworth-Heinemann. This book was released on 2016-06-07 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups. Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications. Focuses on characterization techniques for carbon materials Authored by experts who are considered specialists in their respective techniques Presents practical results on various carbon materials, including fault results, which will help readers understand the optimum conditions for the characterization of carbon materials
Author : Nicolas Brodusch
Publisher : Springer
ISBN 13 : 9811044333
Total Pages : 143 pages
Book Rating : 4.8/5 (11 download)
Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Author : Peter W. Hawkes
Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)
Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author : David B. Williams
Publisher : Springer Science & Business Media
ISBN 13 : 1475725191
Total Pages : 708 pages
Book Rating : 4.4/5 (757 download)
Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Author : Wobrock, Mark
Publisher : KIT Scientific Publishing
ISBN 13 : 3731506823
Total Pages : 252 pages
Book Rating : 4.7/5 (315 download)
Download or read book Microplasticity of idealized single crystalline Ag cantilevers characterized with methods of high resolution written by Wobrock, Mark and published by KIT Scientific Publishing. This book was released on 2017-11-22 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Single crystalline, μm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are performed for further analysis. A mechanism to explain the formation of dislocation networks upon loading is suggested.
Author : Peter W. Hawkes
Publisher : Academic Press
ISBN 13 : 9780120147670
Total Pages : 426 pages
Book Rating : 4.1/5 (476 download)
Download or read book Advances in Imaging and Electron Physics written by Peter W. Hawkes and published by Academic Press. This book was released on 2002-12 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt: * A special volume devoted principally to the role of the late Sir Charles Oatley in the development of the scanning electron microscopeings * It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory * Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Although the scanning electron microscope had a prehistory in Germany and the USA, its real champion was Charles Oatley, who launched his project in the Cambridge University Engineering Department shortly after the end of World War II. A first microscope was built successfully by D. McMullan, one of the Guest Editors of this volume and a succession of progressively improved instruments followed. One in particular, built by K.C.A. Smith was commissioned specially for the Canadian Pulp and Paper Research Institute for use in their Montreal laboratories. All these efforts culminated in the commercial model built by the Cambridge Instrument Company and marketed in 1965 under the trade name, Stereoscan. these Advances, it seemed appropriate, in the centenary year of the birth of Sir Charles Oatley, that more details should be published to celebrate these achievements. This volume is the result. It contains not only historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory but also full or partial reproductions of many of the key publications, beginning with McMullan's early paper of 1953 and including Oatley's own Early history of the scanning electron microscope (1982). A website has been created, in which supplementary material is collected. This volume is a tribute to a bold pioneering scientist and a vivid record of the creation of the first commercial scanning electron microscopes and of subsequent developments.
Author : Anwar Ul-Hamid
Publisher : Springer
ISBN 13 : 3319984829
Total Pages : 422 pages
Book Rating : 4.3/5 (199 download)
Download or read book A Beginners' Guide to Scanning Electron Microscopy written by Anwar Ul-Hamid and published by Springer. This book was released on 2018-10-26 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author : Marc De Graef
Publisher : Cambridge University Press
ISBN 13 : 0521620066
Total Pages : 741 pages
Book Rating : 4.5/5 (216 download)
Download or read book Introduction to Conventional Transmission Electron Microscopy written by Marc De Graef and published by Cambridge University Press. This book was released on 2003-03-27 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Author : Shane Michael Kennedy
Publisher :
ISBN 13 :
Total Pages : 153 pages
Book Rating : 4.:/5 (92 download)
Download or read book Image Contrast in Mirror and Low Energy Electron Microscopy written by Shane Michael Kennedy and published by . This book was released on 2010 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: We develop several approaches to understand and interpret image contrast in mirror electron microscopy (MEM) and low energy electron microscopy (LEEM), with potential applications to photoemission electron microscopy (PEEM). We treat both the forward problem, of how surface features and properties create image contrast, and the inverse problem, of how we may infer quantitative information about surface features and properties from experimental MEM, LEEM and PEEM images. The thesis begins with the development of the Laplacian imaging theory of MEM, whereby image contrast is understood as the second derivative of the surface topography, blurred slightly to account for the interaction of the electron beam with the electric field above the specimen, rather than the specimen surface itself. This intuitive method includes the effects of lens aberrations and can be rapidly inverted to recover the surface topography from experimental MEM images. For specimen surface variations that are outside the regime of the Laplacian imaging theory and other models, we develop a caustic imaging theory for MEM. This involves solving the electric field above the specimen and tracing a family or envelope of rays through the immersion lens. Where initially adjacent rays cross, caustics are created, and these strong image features may be used to recover three dimensional surface topography. Both the Laplacian imaging theory and the caustic imaging theory are successfully applied to experimental MEM data to obtain the surface topography. As a complement to this ray-based treatment, we then develop a wave optical treatment of LEEM image contrast, adopting the complex transfer function methodology from transmission electron microscopy. This method includes spherical and chromatic aberration, and may be extended to include higher order aberrations for use in aberration corrected LEEM instruments. With knowledge of the complex transfer function, we then apply phase retrieval methods to simulated LEEM images, recovering the electron wave function and surface topography for a series of step terraces. Finally, we consider a wave optical treatment of MEM, investigating the behaviour of the electron wave in the vicinity of the turn around region. This is extended to explore the application of MEM beyond specimen surfaces, and the feasibility of imaging very weak potentials, such as the ponderomotive potential experienced by an electron in a light field.
Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
