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Embedded Processor Based Self Test
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Book Synopsis Embedded Processor-Based Self-Test by : Dimitris Gizopoulos
Download or read book Embedded Processor-Based Self-Test written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Book Synopsis Embedded Processor-Based Self-Test by : Gizopoulos
Download or read book Embedded Processor-Based Self-Test written by Gizopoulos and published by . This book was released on 2009-05-01 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Arithmetic Built-in Self-test for Embedded Systems by : Janusz Rajski
Download or read book Arithmetic Built-in Self-test for Embedded Systems written by Janusz Rajski and published by Prentice Hall. This book was released on 1998 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Arithmetic Built-In Self-Test for Embedded Systems offers a thorough treatment of the important issues in software-based built-in self-test for systems with embedded processors. Fundamental concepts are illustrated with practical scenarios for test generation, test application, and test response compaction. Arithmetic Built-In Self-Test for Embedded Systems uses an approach to cutting-edge technology that will be of interest to hardware and embedded system designers, test and design engineers, and researchers working on IC/core testing. It is also appropriate for graduate-level design courses. An introductory chapter provides a comprehensive tutorial covering the most relevant DFT and BIST techniques.
Book Synopsis On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors by : Matthias Pflanz
Download or read book On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors written by Matthias Pflanz and published by Springer. This book was released on 2003-07-31 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a new approach to on-line observation and concurrent checking of processors by refining and improving known techniques and introducing new ideas.The proposed on-line error detection and fast recover techniques support and complement other established methods. In combination with other on-line observation priniciples and with a combined hardware-software test, these techniques are used to fulfill a complete self-check scheme for an embedded processor.
Author :Krishnendu Chakrabarty Publisher :Springer Science & Business Media ISBN 13 :1475765274 Total Pages :202 pages Book Rating :4.4/5 (757 download)
Book Synopsis SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by : Krishnendu Chakrabarty
Download or read book SOC (System-on-a-Chip) Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Book Synopsis Software-based Self-test and Diagnosis for Processors and System-on-chips by : Li Chen
Download or read book Software-based Self-test and Diagnosis for Processors and System-on-chips written by Li Chen and published by . This book was released on 2003 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Processor Design written by Jari Nurmi and published by Springer Science & Business Media. This book was released on 2007-07-26 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.
Book Synopsis Railway Safety, Reliability, and Security: Technologies and Systems Engineering by : Flammini, Francesco
Download or read book Railway Safety, Reliability, and Security: Technologies and Systems Engineering written by Flammini, Francesco and published by IGI Global. This book was released on 2012-05-31 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt: Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :C. Metra Publisher :Institute of Electrical & Electronics Engineers(IEEE) ISBN 13 :9780769519685 Total Pages :229 pages Book Rating :4.5/5 (196 download)
Book Synopsis On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE by : C. Metra
Download or read book On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE written by C. Metra and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings written by and published by . This book was released on 2005 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Test Driven Development for Embedded C by : James W. Grenning
Download or read book Test Driven Development for Embedded C written by James W. Grenning and published by Pragmatic Bookshelf. This book was released on 2011-04-25 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt: Another day without Test-Driven Development means more time wasted chasing bugs and watching your code deteriorate. You thought TDD was for someone else, but it's not! It's for you, the embedded C programmer. TDD helps you prevent defects and build software with a long useful life. This is the first book to teach the hows and whys of TDD for C programmers. TDD is a modern programming practice C developers need to know. It's a different way to program---unit tests are written in a tight feedback loop with the production code, assuring your code does what you think. You get valuable feedback every few minutes. You find mistakes before they become bugs. You get early warning of design problems. You get immediate notification of side effect defects. You get to spend more time adding valuable features to your product. James is one of the few experts in applying TDD to embedded C. With his 1.5 decades of training,coaching, and practicing TDD in C, C++, Java, and C# he will lead you from being a novice in TDD to using the techniques that few have mastered. This book is full of code written for embedded C programmers. You don't just see the end product, you see code and tests evolve. James leads you through the thought process and decisions made each step of the way. You'll learn techniques for test-driving code right nextto the hardware, and you'll learn design principles and how to apply them to C to keep your code clean and flexible. To run the examples in this book, you will need a C/C++ development environment on your machine, and the GNU GCC tool chain or Microsoft Visual Studio for C++ (some project conversion may be needed).
Author :IEEE Circuits and Systems Society Publisher :Institute of Electrical & Electronics Engineers(IEEE) ISBN 13 : Total Pages :974 pages Book Rating :4.3/5 (91 download)
Book Synopsis IEEE International Symposium on Circuits and Systems by : IEEE Circuits and Systems Society
Download or read book IEEE International Symposium on Circuits and Systems written by IEEE Circuits and Systems Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 974 pages. Available in PDF, EPUB and Kindle. Book excerpt: These volumes relate to matters discussed during the 2003 IEEE International Symposium on Circuits and Systems, such as: analogue circuits and signal processing; communications; multimedia systems and applications; general and nonlinear circuits and systems; and neural networks and systems.
Download or read book Asian Test Symposium written by and published by . This book was released on 2005 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Dissertation Abstracts International by :
Download or read book Dissertation Abstracts International written by and published by . This book was released on 2004 with total page 820 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Book Synopsis Code Generation for Embedded Processors by : Peter Marwedel
Download or read book Code Generation for Embedded Processors written by Peter Marwedel and published by Springer. This book was released on 1995-06-30 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recently, new research efforts emerged on the edge between software compilation and hardware synthesis, to develop high-quality code generation tools for embedded processors. Code Generation for Embedded Processors provides a survey of these new developments. Although not limited to these targets, the main emphasis is on code generation for modern DSP processors.
