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Author : Jason Vaughn Clark
Publisher :
ISBN 13 :
Total Pages : 682 pages
Book Rating : 4.:/5 (35 download)
Download or read book Electro Micro-metrology written by Jason Vaughn Clark and published by . This book was released on 2005 with total page 682 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Waldemar Nawrocki
Publisher : Springer
ISBN 13 : 3319156691
Total Pages : 287 pages
Book Rating : 4.3/5 (191 download)
Download or read book Introduction to Quantum Metrology written by Waldemar Nawrocki and published by Springer. This book was released on 2015-03-24 with total page 287 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
Author : Joanne Surette
Publisher : DIANE Publishing
ISBN 13 : 078817701X
Total Pages : 85 pages
Book Rating : 4.7/5 (881 download)
Download or read book Advancing Metrology for Electrotechnology to Support the U.S. Economy written by Joanne Surette and published by DIANE Publishing. This book was released on 1999-04 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.
Author : Muammer Koç
Publisher : John Wiley & Sons
ISBN 13 : 1118010566
Total Pages : 490 pages
Book Rating : 4.1/5 (18 download)
Download or read book Micro-Manufacturing written by Muammer Koç and published by John Wiley & Sons. This book was released on 2011-05-06 with total page 490 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the first of its kind to collectively address design-based and mechanical micro-manufacturing topics in one place. It focuses on design and materials selection, as well as the manufacturing of micro-products using mechanical-based micro-manufacturing process technologies. After addressing the fundamentals and non-metallic-based micro-manufacturing processes in the semiconductor industry, it goes on to address specific metallic-based micro-manufacturing processes, such as: micro-forming, micro-machining, micro-molding, micro-laser processing, micro-layered manufacturing, micro-joining, micro-assembly and materials handling, and microEDM and ECM. The book provides an in-depth understanding of materials behavior at micro-scales and under different micro-scale processing conditions, while also including a wide variety of emerging micro-scale manufacturing issues and examples.
Author : R. E. Bible
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (137 download)
Download or read book Automated Parts Measurements Using Electro Optics written by R. E. Bible and published by . This book was released on 1980 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The application of electro optics to industrial metrology is discussed.Examples show how the use of optics, solid state sensors, and micro-processors provide automated measuring capabilities which were formerly difficult, time.
Author :
Publisher :
ISBN 13 :
Total Pages : 154 pages
Book Rating : 4.3/5 (91 download)
Download or read book Microlithography and Metrology in Micromachining written by and published by . This book was released on 1997 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 54 pages
Book Rating : 4.:/5 (3 download)
Download or read book Electromagnetic Metrology written by and published by . This book was released on 1975 with total page 54 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wei Gao
Publisher : Elsevier
ISBN 13 : 0128178515
Total Pages : 452 pages
Book Rating : 4.1/5 (281 download)
Download or read book Surface Metrology for Micro- and Nanofabrication written by Wei Gao and published by Elsevier. This book was released on 2020-10-30 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface Metrology for Micro- and Nanofabrication presents state-of-the-art measurement technologies for surface metrology in fabrication of micro- and nanodevices or components. This includes the newest general-purpose scanning probe microscopes, and both contact and non-contact surface profilers. In addition, the book outlines characterization and calibration techniques, as well as in-situ, on-machine, and in-process measurements for micro- and nanofabrication. Provides materials scientists and engineers with an informed overview of the state-of-the-art in surface metrology Helps readers select and design the optimized surface metrology systems and carry out proper surface metrology practices in the fabrication of micro/nano-devices and components Assesses the best techniques for repairing micro-defects
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 152 pages
Book Rating : 4.3/5 (91 download)
Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1995 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wei Gao
Publisher : Springer
ISBN 13 : 9789811049378
Total Pages : 0 pages
Book Rating : 4.0/5 (493 download)
Download or read book Metrology written by Wei Gao and published by Springer. This book was released on 2019-08-30 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements. This volume is part of a multi-volume handbook series that covers a comprehensive range of scientific and technological matters in ‘Precision Manufacturing’, for more information please view this link- https://www.springer.com/series/15575.
Author :
Publisher :
ISBN 13 :
Total Pages : 62 pages
Book Rating : 4.3/5 (91 download)
Download or read book NISTIR. written by and published by . This book was released on 2001 with total page 62 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 762 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1960 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 506 pages
Book Rating : 4.0/5 ( download)
Download or read book Microtecnic written by and published by . This book was released on 1973 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sergey Edward Lyshevski
Publisher : CRC Press
ISBN 13 : 1351835173
Total Pages : 752 pages
Book Rating : 4.3/5 (518 download)
Download or read book Nano- and Micro-Electromechanical Systems written by Sergey Edward Lyshevski and published by CRC Press. This book was released on 2018-10-03 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt: Society is approaching and advancing nano- and microtechnology from various angles of science and engineering. The need for further fundamental, applied, and experimental research is matched by the demand for quality references that capture the multidisciplinary and multifaceted nature of the science. Presenting cutting-edge information that is applicable to many fields, Nano- and Micro-Electromechanical Systems: Fundamentals of Nano and Microengineering, Second Edition builds the theoretical foundation for understanding, modeling, controlling, simulating, and designing nano- and microsystems. The book focuses on the fundamentals of nano- and microengineering and nano- and microtechnology. It emphasizes the multidisciplinary principles of NEMS and MEMS and practical applications of the basic theory in engineering practice and technology development. Significantly revised to reflect both fundamental and technological aspects, this second edition introduces the concepts, methods, techniques, and technologies needed to solve a wide variety of problems related to high-performance nano- and microsystems. The book is written in a textbook style and now includes homework problems, examples, and reference lists in every chapter, as well as a separate solutions manual. It is designed to satisfy the growing demands of undergraduate and graduate students, researchers, and professionals in the fields of nano- and microengineering, and to enable them to contribute to the nanotechnology revolution.
Author : Wolfgang Osten
Publisher : John Wiley & Sons
ISBN 13 : 3527648461
Total Pages : 471 pages
Book Rating : 4.5/5 (276 download)
Download or read book Optical Imaging and Metrology written by Wolfgang Osten and published by John Wiley & Sons. This book was released on 2012-09-10 with total page 471 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Author : W. Murray Bullis
Publisher :
ISBN 13 :
Total Pages : 48 pages
Book Rating : 4.3/5 (121 download)
Download or read book Metrology for submicrometer devices and circuits written by W. Murray Bullis and published by . This book was released on 1980 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Robert B. Northrop
Publisher : CRC Press
ISBN 13 : 1466596791
Total Pages : 947 pages
Book Rating : 4.4/5 (665 download)
Download or read book Introduction to Instrumentation and Measurements written by Robert B. Northrop and published by CRC Press. This book was released on 2018-09-03 with total page 947 pages. Available in PDF, EPUB and Kindle. Book excerpt: Weighing in on the growth of innovative technologies, the adoption of new standards, and the lack of educational development as it relates to current and emerging applications, the third edition of Introduction to Instrumentation and Measurements uses the authors’ 40 years of teaching experience to expound on the theory, science, and art of modern instrumentation and measurements (I&M). What’s New in This Edition: This edition includes material on modern integrated circuit (IC) and photonic sensors, micro-electro-mechanical (MEM) and nano-electro-mechanical (NEM) sensors, chemical and radiation sensors, signal conditioning, noise, data interfaces, and basic digital signal processing (DSP), and upgrades every chapter with the latest advancements. It contains new material on the designs of micro-electro-mechanical (MEMS) sensors, adds two new chapters on wireless instrumentation and microsensors, and incorporates extensive biomedical examples and problems. Containing 13 chapters, this third edition: Describes sensor dynamics, signal conditioning, and data display and storage Focuses on means of conditioning the analog outputs of various sensors Considers noise and coherent interference in measurements in depth Covers the traditional topics of DC null methods of measurement and AC null measurements Examines Wheatstone and Kelvin bridges and potentiometers Explores the major AC bridges used to measure inductance, Q, capacitance, and D Presents a survey of sensor mechanisms Includes a description and analysis of sensors based on the giant magnetoresistive effect (GMR) and the anisotropic magnetoresistive (AMR) effect Provides a detailed analysis of mechanical gyroscopes, clinometers, and accelerometers Contains the classic means of measuring electrical quantities Examines digital interfaces in measurement systems Defines digital signal conditioning in instrumentation Addresses solid-state chemical microsensors and wireless instrumentation Introduces mechanical microsensors (MEMS and NEMS) Details examples of the design of measurement systems Introduction to Instrumentation and Measurements is written with practicing engineers and scientists in mind, and is intended to be used in a classroom course or as a reference. It is assumed that the reader has taken core EE curriculum courses or their equivalents.
