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Author :
Publisher :
ISBN 13 :
Total Pages : 378 pages
Book Rating : 4.:/5 (974 download)
Download or read book Eighth International Conference on Secondary Ion Mass Spectrometry written by and published by . This book was released on 1991 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher :
ISBN 13 :
Total Pages : 950 pages
Book Rating : 4.F/5 ( download)
Download or read book Secondary Ion Mass Spectrometry SIMS VIII written by A. Benninghoven and published by . This book was released on 1992-09-29 with total page 950 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.
Author : Alfred Benninghoven
Publisher :
ISBN 13 :
Total Pages : 963 pages
Book Rating : 4.:/5 (83 download)
Download or read book Secondary ion mass spectrometry written by Alfred Benninghoven and published by . This book was released on 1990 with total page 963 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Elsevier Science & Technology
ISBN 13 :
Total Pages : 1092 pages
Book Rating : 4.F/5 ( download)
Download or read book Secondary Ion Mass Spectrometry written by A. Benninghoven and published by Elsevier Science & Technology. This book was released on 2000 with total page 1092 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
Author :
Publisher :
ISBN 13 :
Total Pages : 963 pages
Book Rating : 4.:/5 (246 download)
Download or read book Secondary Ion Mass Spectrometry written by and published by . This book was released on 1990 with total page 963 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642618715
Total Pages : 310 pages
Book Rating : 4.6/5 (426 download)
Download or read book Secondary Ion Mass Spectrometry SIMS II written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642881521
Total Pages : 455 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS III written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 455 pages. Available in PDF, EPUB and Kindle. Book excerpt: Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642822568
Total Pages : 518 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS IV written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.
Author : Alfred Benninghoven
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (473 download)
Download or read book Secondary ion mass spectrometry SIMS II. Proceedings of the 2. International Conference on Secondary Ion Mass Spectrometry (SIMS II) written by Alfred Benninghoven and published by . This book was released on 1979 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alfred Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642827241
Total Pages : 578 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS V written by Alfred Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 578 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author : International Conference on Secondary Ion Mass Spectrometry
Publisher :
ISBN 13 :
Total Pages : 879 pages
Book Rating : 4.:/5 (526 download)
Download or read book Secondary ion mass spectrometry SIMS XIII written by International Conference on Secondary Ion Mass Spectrometry and published by . This book was released on 2003 with total page 879 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 420 pages
Book Rating : 4.:/5 (122 download)
Download or read book The 16th International Conference on Secondary Ion Mass Spectrometry written by and published by . This book was released on 2007 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Wiley
ISBN 13 : 9780471927389
Total Pages : 1002 pages
Book Rating : 4.9/5 (273 download)
Download or read book Secondary Ion Mass Spectrometry: SIMS VII written by A. Benninghoven and published by Wiley. This book was released on 1990-06-28 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: Based on the proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, held in Monterey, California, September 3-8, 1989. Covers fundamental, complementary and enhancement techniques, comparative SIMS, geology, biology, polymers, metallurgy, profiling and semiconductors. Describes a valuable methodology (SIMS) for characterizing solid surfaces and presents numerous analytical applications.
Author : International Conference on Secondary Ion Mass Spe
Publisher :
ISBN 13 : 9780783718842
Total Pages : 1108 pages
Book Rating : 4.7/5 (188 download)
Download or read book Secondary Ion Mass Spectrometry written by International Conference on Secondary Ion Mass Spe and published by . This book was released on with total page 1108 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Wiley
ISBN 13 : 9780471930648
Total Pages : 944 pages
Book Rating : 4.9/5 (36 download)
Download or read book Secondary Ion Mass Spectrometry SIMS VIII written by A. Benninghoven and published by Wiley. This book was released on 1992-09-29 with total page 944 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.
Author : International Conference on Secondary Ion Mass Spectrometry
Publisher :
ISBN 13 :
Total Pages : 444 pages
Book Rating : 4.:/5 (92 download)
Download or read book Secondary Ion Mass Spectrometry SIMS II: Proceedings of the 3rd International Conference, Technical University, Budapest, Hungary, August 30-September 5,1981 written by International Conference on Secondary Ion Mass Spectrometry and published by . This book was released on 1982 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary ion mass spectrometry SIMS XV written by and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
