Economics Of Electronic Design Manufacture And Test

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Economics of Electronic Design, Manufacture and Test

Author : M. Abadir
Publisher : Springer Science & Business Media
ISBN 13 : 147575048X
Total Pages : 181 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Economics of Electronic Design, Manufacture and Test by : M. Abadir

Download or read book Economics of Electronic Design, Manufacture and Test written by M. Abadir and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.

VLSI Custom Microelectronics

Author : Stanley L. Hurst
Publisher : CRC Press
ISBN 13 : 0824746406
Total Pages : 489 pages
Book Rating : 4.8/5 (247 download)

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Book Synopsis VLSI Custom Microelectronics by : Stanley L. Hurst

Download or read book VLSI Custom Microelectronics written by Stanley L. Hurst and published by CRC Press. This book was released on 1998-11-05 with total page 489 pages. Available in PDF, EPUB and Kindle. Book excerpt: Focuses on the design and production of integrated circuits specifically designed for a particular application from original equipment manufacturers. The book outlines silicon and GaAs semiconductor fabrication techniques and circuit configurations; compares custom design style; discusses computer-aided design tools; and more.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Author : Manoj Sachdev
Publisher : Springer Science & Business Media
ISBN 13 : 0387465472
Total Pages : 343 pages
Book Rating : 4.3/5 (874 download)

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Book Synopsis Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by : Manoj Sachdev

Download or read book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Defect Oriented Testing for CMOS Analog and Digital Circuits

Author : Manoj Sachdev
Publisher : Springer Science & Business Media
ISBN 13 : 1475749260
Total Pages : 317 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Defect Oriented Testing for CMOS Analog and Digital Circuits by : Manoj Sachdev

Download or read book Defect Oriented Testing for CMOS Analog and Digital Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal

A Designer’s Guide to Built-In Self-Test

Author : Charles E. Stroud
Publisher : Springer Science & Business Media
ISBN 13 : 0306475049
Total Pages : 338 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis A Designer’s Guide to Built-In Self-Test by : Charles E. Stroud

Download or read book A Designer’s Guide to Built-In Self-Test written by Charles E. Stroud and published by Springer Science & Business Media. This book was released on 2005-12-27 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

Research Perspectives and Case Studies in System Test and Diagnosis

Author : John W. Sheppard
Publisher : Springer Science & Business Media
ISBN 13 : 1461555450
Total Pages : 240 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Research Perspectives and Case Studies in System Test and Diagnosis by : John W. Sheppard

Download or read book Research Perspectives and Case Studies in System Test and Diagnosis written by John W. Sheppard and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: "System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ¿any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science...”. From the Preface

Delay Fault Testing for VLSI Circuits

Author : Angela Krstic
Publisher : Springer Science & Business Media
ISBN 13 : 1461555973
Total Pages : 201 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Delay Fault Testing for VLSI Circuits by : Angela Krstic

Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Third International Conference on the Economics of Design, Test, and Manufacturing

Author : Tony Ambler
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 184 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Third International Conference on the Economics of Design, Test, and Manufacturing by : Tony Ambler

Download or read book Third International Conference on the Economics of Design, Test, and Manufacturing written by Tony Ambler and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1996 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: Focuses on economic analysis in the decision making and application of testing electronic circuits at all levels. The 21 papers, revised for publication, consider such facets as error modeling in a board test, synthesizing testable systolic arrays, manufacturing cost analysis for electronic packing,"

On-Line Testing for VLSI

Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1475760698
Total Pages : 152 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis On-Line Testing for VLSI by : Michael Nicolaidis

Download or read book On-Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Multi-Chip Module Test Strategies

Author : Yervant Zorian
Publisher : Springer Science & Business Media
ISBN 13 : 1461561078
Total Pages : 161 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Multi-Chip Module Test Strategies by : Yervant Zorian

Download or read book Multi-Chip Module Test Strategies written by Yervant Zorian and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

Introduction to IDDQ Testing

Author : S. Chakravarty
Publisher : Springer Science & Business Media
ISBN 13 : 146156137X
Total Pages : 336 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Introduction to IDDQ Testing by : S. Chakravarty

Download or read book Introduction to IDDQ Testing written by S. Chakravarty and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

Cost Analysis Of Electronic Systems (Second Edition)

Author : Peter Sandborn
Publisher : World Scientific
ISBN 13 : 9813148276
Total Pages : 576 pages
Book Rating : 4.8/5 (131 download)

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Book Synopsis Cost Analysis Of Electronic Systems (Second Edition) by : Peter Sandborn

Download or read book Cost Analysis Of Electronic Systems (Second Edition) written by Peter Sandborn and published by World Scientific. This book was released on 2016-12-15 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an introduction to the cost modeling for electronic systems that is suitable for advanced undergraduate and graduate students in electrical, mechanical and industrial engineering, and professionals involved with electronics technology development and management. This book melds elements of traditional engineering economics with manufacturing process and life-cycle cost management concepts to form a practical foundation for predicting the cost of electronic products and systems. Various manufacturing cost analysis methods are addressed including: process-flow, parametric, cost of ownership, and activity based costing. The effects of learning curves, data uncertainty, test and rework processes, and defects are considered. Aspects of system sustainment and life-cycle cost modeling including reliability (warranty, burn-in), maintenance (sparing and availability), and obsolescence are treated. Finally, total cost of ownership of systems, return on investment, cost-benefit analysis, and real options analysis are addressed.

Design to Test

Author : John Turino
Publisher : Springer Science & Business Media
ISBN 13 : 9401160449
Total Pages : 334 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Design to Test by : John Turino

Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

Electronic Design Automation for IC System Design, Verification, and Testing

Author : Luciano Lavagno
Publisher : CRC Press
ISBN 13 : 1482254638
Total Pages : 644 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Electronic Design Automation for IC System Design, Verification, and Testing by : Luciano Lavagno

Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Hardware Security

Author : Swarup Bhunia
Publisher : Morgan Kaufmann
ISBN 13 : 0128124784
Total Pages : 528 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Hardware Security by : Swarup Bhunia

Download or read book Hardware Security written by Swarup Bhunia and published by Morgan Kaufmann. This book was released on 2018-10-30 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardware Security: A Hands-On Learning Approach provides a broad, comprehensive and practical overview of hardware security that encompasses all levels of the electronic hardware infrastructure. It covers basic concepts like advanced attack techniques and countermeasures that are illustrated through theory, case studies and well-designed, hands-on laboratory exercises for each key concept. The book is ideal as a textbook for upper-level undergraduate students studying computer engineering, computer science, electrical engineering, and biomedical engineering, but is also a handy reference for graduate students, researchers and industry professionals. For academic courses, the book contains a robust suite of teaching ancillaries. Users will be able to access schematic, layout and design files for a printed circuit board for hardware hacking (i.e. the HaHa board) that can be used by instructors to fabricate boards, a suite of videos that demonstrate different hardware vulnerabilities, hardware attacks and countermeasures, and a detailed description and user manual for companion materials. - Provides a thorough overview of computer hardware, including the fundamentals of computer systems and the implications of security risks - Includes discussion of the liability, safety and privacy implications of hardware and software security and interaction - Gives insights on a wide range of security, trust issues and emerging attacks and protection mechanisms in the electronic hardware lifecycle, from design, fabrication, test, and distribution, straight through to supply chain and deployment in the field - A full range of instructor and student support materials can be found on the authors' own website for the book: http://hwsecuritybook.org

Cost Analysis of Electronic Systems

Author : Peter Sandborn
Publisher : World Scientific
ISBN 13 : 981438335X
Total Pages : 440 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis Cost Analysis of Electronic Systems by : Peter Sandborn

Download or read book Cost Analysis of Electronic Systems written by Peter Sandborn and published by World Scientific. This book was released on 2013 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understanding the cost ramifications of design, manufacturing and life-cycle management decisions is of central importance to businesses associated with all types of electronic systems. Cost Analysis of Electronic Systems contains carefully developed models and theory that practicing engineers can directly apply to the modeling of costs for real products and systems. In addition, this book brings to light and models many contributions to life-cycle costs that practitioners are aware of but never had the tools or techniques to address quantitatively in the past.Cost Analysis of Electronic Systems melds elements of traditional engineering economics with manufacturing process and life-cycle cost management concepts to form a practical foundation for predicting the cost of electronic products and systems. Various manufacturing cost analysis methods are addressed including: process-flow, parametric, cost of ownership, and activity-based costing. The effects of learning curves, data uncertainty, test and rework processes, and defects are considered. Aspects of system sustainment and life-cycle cost modeling including reliability (warranty, burn-in), maintenance (sparing and availability), and obsolescence are treated. Finally, total cost of ownership of systems and return on investment are addressed.Real life design scenarios from integrated circuit fabrication, electronic systems assembly, substrate fabrication, and electronic systems managementare used as examples of the application of the cost estimation methods developed within the book.