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Displacement Damage In Silicon Irradiated With 6 To 10 Mev Neutrons
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Book Synopsis Displacement Damage in Silicon Irradiated with 6- to 10-MeV Neutrons by : J. E. Youngblood
Download or read book Displacement Damage in Silicon Irradiated with 6- to 10-MeV Neutrons written by J. E. Youngblood and published by . This book was released on 1977 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: Some preliminary experimental and theoretical results on the energy dependence of neutron-induced displacement damage in silicon are presented. The reduction in carrier lifetime, as reflected in the change in forward voltage at a fixed injection level, has been measured in wide-base silicon diodes, for monoenergetic neutrons at selected energies between 5.6 and 9.8 MeV. Twenty-five measurements at 19 energies were made. To calculate the variations in damage with neutron energy, a computer program that could utilize all details of the best available neutron cross section data was prepared. This program accepts coefficients for a Legendre polynomial fit of a partial cross section, determines the silicon recoil energy at a particular angle, and calculates the Lindhard fraction of energy for displacement damage. The calculated results provide a direct indication of the effect of angular distributions and the sensitivity of damage calculations to various details of the input neutron cross sections. (Author).
Book Synopsis Annealing of 22-, 40-, and 158-MeV Proton Damage in N- and P-type Silicon by : Marvin Eddleman Beatty
Download or read book Annealing of 22-, 40-, and 158-MeV Proton Damage in N- and P-type Silicon written by Marvin Eddleman Beatty and published by . This book was released on 1969 with total page 34 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Radiation Damage Effects in 16-MeV Proton and 14-MeV Neutron Irradiated Nickel and Niobium by : ER. Bradley
Download or read book Radiation Damage Effects in 16-MeV Proton and 14-MeV Neutron Irradiated Nickel and Niobium written by ER. Bradley and published by . This book was released on 1979 with total page 17 pages. Available in PDF, EPUB and Kindle. Book excerpt: The high-energy (>10 keV) recoil spectra induced in metals by 16-MeV protons have been predicted to be similar to that induced by 14-MeV neutrons. The damage induced in nickel and niobium by 16-MeV protons and 14-MeV neutrons has been evaluated by transmission electron microscopy and flow stress measurements.
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1977 with total page 1110 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Energy Research Abstracts written by and published by . This book was released on 1986 with total page 1200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Evolution of Silicon Sensor Technology in Particle Physics by : Frank Hartmann
Download or read book Evolution of Silicon Sensor Technology in Particle Physics written by Frank Hartmann and published by Springer Science & Business Media. This book was released on 2008-12-01 with total page 211 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the post era of the Z and W discovery, after the observation of Jets at UA1 and UA2 at CERN, John Ellis visioned at a HEP conference at Lake Tahoe, California in 1983 “To proceed with high energy particle physics, one has to tag the avour of the quarks!” This statement re ects the need for a highly precise tracking device, being able to resolve secondary and tertiary vertices within high-particle densities. Since the d- tance between the primary interaction point and the secondary vertex is proportional tothelifetimeoftheparticipatingparticle,itisanexcellentquantitytoidentifypar- cle avour in a very fast and precise way. In colliding beam experiments this method was applied especially to tag the presence of b quarks within particle jets. It was rst introduced in the DELPHI experiment at LEP but soon followed by all collider - periments to date. The long expected t quark discovery was possible mainly with the help of the CDF silicon vertex tracker, providing the b quark information. In the beginning of the 21st century the new LHC experiments are beginning to take 2 shape. CMS with its 206m of silicon area is perfectly suited to cope with the high luminosity environment. Even larger detectors are envisioned for the far future, like the SiLC project for the International Linear Collider. Silicon sensors matured from small 1in. single-sided devices to large 6in. double-sided, double metal detectors and to 6in. single-sided radiation hard sensors.
Book Synopsis Modeling of Displacement Damage in Silicon Carbide Detectors Resulting from Neutron Irradiation by : Behrooz Khorsandi
Download or read book Modeling of Displacement Damage in Silicon Carbide Detectors Resulting from Neutron Irradiation written by Behrooz Khorsandi and published by . This book was released on 2007 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: A conclusion of this thesis is SiC detectors that are placed in the thermal neutron region of a graphite moderator-reflector reactor have a chance to survive at least one reactor refueling cycle, while their count rates are acceptably high.
Book Synopsis Metrics for Comparison Between Displacement Damage Due to Ion Beam and Neutron Irradiation in Silicon BJTs by :
Download or read book Metrics for Comparison Between Displacement Damage Due to Ion Beam and Neutron Irradiation in Silicon BJTs written by and published by . This book was released on 2007 with total page 7 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Uncertainty of Silicon 1-MeV Damage Function by :
Download or read book Uncertainty of Silicon 1-MeV Damage Function written by and published by . This book was released on 1997 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: The electronics radiation hardness-testing community uses the ASTM E722-93 Standard Practice to define the energy dependence of the nonionizing neutron damage to silicon semiconductors. This neutron displacement damage response function is defined to be equal to the silicon displacement kerma as calculated from the ORNL Si cross-section evaluation. Experimental work has shown that observed damage ratios at various test facilities agree with the defined response function to within 5%. Here, a covariance matrix for the silicon 1-MeV neutron displacement damage function is developed. This uncertainty data will support the electronic radiation hardness-testing community and will permit silicon displacement damage sensors to be used in least squares spectrum adjustment codes.
Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Dan M. Fleetwood
Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Dan M. Fleetwood and published by World Scientific. This book was released on 2004 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1976 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Report of NRL Progress by : Naval Research Laboratory (U.S.)
Download or read book Report of NRL Progress written by Naval Research Laboratory (U.S.) and published by . This book was released on 1974 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Annual Book of ASTM Standards by : ASTM International
Download or read book Annual Book of ASTM Standards written by ASTM International and published by . This book was released on 2004 with total page 1268 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book SCR. written by and published by . This book was released on 1962 with total page 12 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Government Reports Announcements & Index by :
Download or read book Government Reports Announcements & Index written by and published by . This book was released on 1977 with total page 1242 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fluka written by Alfredo Ferrari and published by . This book was released on 2005 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Shielding Aspects of Accelerators, Targets and Irradiation Facilities - SATIF 6 by : NEA Staff
Download or read book Shielding Aspects of Accelerators, Targets and Irradiation Facilities - SATIF 6 written by NEA Staff and published by OECD Publishing. This book was released on 2004 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: Particle accelerators are having an increasingly important impact on research, technology and lifestyle. Today they cover a wide range of applications including material science and medical applications. In recent years, requirements from new technological and research applications have emerged and the number of accelerator facilities has significantly increased. Their parameters (such as the beam energy, beam currents and intensities, targets composition, etc.) vary widely giving rise to new radiation shielding aspects and problems. The main objectives of the SATIF Meetings are to: promote the exchange of information among experts in the field of accelerator shielding and related topics; identify areas where international co-operation can be fruitful; and carry on a program of work in order to achieve progress in specific priority areas.
