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Development Of Pixel Super Resolution Scanning Transmission X Ray Microscopy For Material Science
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Book Synopsis Development of Pixel Super-resolution Scanning Transmission X-ray Microscopy for Material Science by : Talgat Mamyrbayev
Download or read book Development of Pixel Super-resolution Scanning Transmission X-ray Microscopy for Material Science written by Talgat Mamyrbayev and published by . This book was released on 2021* with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch
Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Book Synopsis Super-Resolution Microscopy for Material Science by : Lorenzo Albertazzi
Download or read book Super-Resolution Microscopy for Material Science written by Lorenzo Albertazzi and published by CRC Press. This book was released on 2024-03-26 with total page 249 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical microscopy is one of the most frequently used tools in chemistry and the life sciences. However, its limited resolution hampers the use of optical imaging to many other relevant problems in different disciplines. Super-Resolution Microscopy (SRM) is a new technique that allows the resolution of objects down to a few billionth of meters (nanometers), ten times better than classical microscopes, opening up opportunities to use this tool in new fields. This book describes the theory, principles, and practice of super-resolution microscopy in the field of materials science and nanotechnology. There is a growing interest in the applications of SRM beyond biology as new synthetic materials, such as nanoscale sensors and catalysts, nanostructured materials, functional polymers, and nanoparticles, have nanoscopic features that are challenging to visualize with traditional imaging methods. SRM has the potential to be used to image and understand these cutting-edge man-made objects and guide the design of materials for novel applications. This book is an ideal guide for researchers in the fields of microscopy and materials science and chemistry as well as graduate students studying physics, materials science, biomedical engineering, and chemistry. Key Features: Contains practical guidance on Super-Resolution Microscopy (SRM), an exciting and growing tool that was awarded the Nobel Prize for chemistry in 2014 Provides a new perspective targeting materials science, unlike existing books which target readers in chemistry, life science, and biology Targets students in its core chapters, while offering more advanced material for professionals and researchers in later chapters
Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 830 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
Book Synopsis Scanning Transmission X-ray Microscope for Materials Science Spectromicroscopy at the ALS. by :
Download or read book Scanning Transmission X-ray Microscope for Materials Science Spectromicroscopy at the ALS. written by and published by . This book was released on 1997 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300[mu]m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.
Book Synopsis Development of Scanning X-ray Microscopes for Materials Science Spectromicroscopy at the Advanced Light Source by :
Download or read book Development of Scanning X-ray Microscopes for Materials Science Spectromicroscopy at the Advanced Light Source written by and published by . This book was released on 1997 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt: Third generation synchrotron sources of soft x-rays provide an excellent opportunity to apply established x-ray spectroscopic materials analysis techniques to surface imaging on a sub-micron scale. This paper describes an effort underway at the Advanced Light Source (ALS) to pursue this development using Fresnel zone plate lenses. These are used to produce a sub-micron spot of x-rays for use in scanning microscopy. Several groups have developed microscopes using this technique. A specimen is rastered in the focused x-ray spot and a detector signal is acquired as a function of position to generate an image. Spectroscopic capability is added by holding the small spot on a feature of interest and scanning through the spectrum. The authors are pursuing two spectroscopic techniques: Near Edge X-ray Absorption Spectroscopy (NEXAFS), X-ray Photoelectron Spectroscopy (XPS) which together provide a powerful capability for light element analysis in materials science.
Book Synopsis X-Ray Microscopy and Spectromicroscopy by : Jürgen Thieme
Download or read book X-Ray Microscopy and Spectromicroscopy written by Jürgen Thieme and published by Springer Science & Business Media. This book was released on 2013-11-09 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.
Book Synopsis Microscopy of Materials by : David Keith Bowen
Download or read book Microscopy of Materials written by David Keith Bowen and published by John Wiley & Sons. This book was released on 1975 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-Ray Microscopy III by : Alan G. Michette
Download or read book X-Ray Microscopy III written by Alan G. Michette and published by Springer. This book was released on 2013-06-05 with total page 499 pages. Available in PDF, EPUB and Kindle. Book excerpt: The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King's College London (3-7 September 1990) with over 130 delegates. Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition. Because of the large number of papers their lengths were strictly limited and, while most papers can be directly identified with conference presentations, in a few cases those on similar topics by the same authors have been combined into a longer paper to allow better use of the space. The book is divided into six parts, with Parts IT-VI covering the major areas of interest at the conference. In Part 1 are two overviews; Ron Burge presented the opening paper of the conference, while the closing, summary, contrlbution by Janos Kirz is included here as a comprehensive introduction to the remainder of the book. Part IT covers developments in X -ray sources and optics. The high average brightnesses of synchrotron radiation sources have made many applications pos sible, while the more convenient, laboratory-based, plasma sources offer much promise for the future. Several contributions report significant advances in X-ray optics, which must clearly continue fully to exploit the latest sources.
Book Synopsis High Resolution Microscopy of Materials: Volume 139 by : William Krakow
Download or read book High Resolution Microscopy of Materials: Volume 139 written by William Krakow and published by . This book was released on 1989-09-12 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Modern Developments and Applications in Microbeam Analysis by : Glyn Love
Download or read book Modern Developments and Applications in Microbeam Analysis written by Glyn Love and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.
Download or read book Hot Embossing written by Matthias Worgull and published by Elsevier. This book was released on 2024-06-17 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: The second edition of Hot Embossing: Theory of Microreplication will present the current state of the art in microreplication with a focus on hot embossing, nanoimprint, thermoforming, and roll-to-roll replication. Polymer processing, the theory of polymers and the processing of polymers are discussed in detail. Aspects of process simulation and the corresponding material models are also covered. The book contains in-depth analysis of processing processes and replication techniques including mold fabrication. Monitoring, data analysis and reliability of molded parts is also discussed. In the Second Edition new processes are included, including the process of micro- and nanothermoforming to generate 3D structures and the hot pulling processes to generate hierarchical structures with high aspect ratios. Based on hot pulling, “Nanofur for Oil-water-separation is a large-scale biomimetic application. Upscaling, especially the seamless roll-to-roll replication, is also explored. The book is designed to cover the entire workflow for a seamless lithographic sleeve.This new edition marks a substantial update of the previous edition, incorporating several new chapters. It is an important resource for materials scientists and engineers working in the areas of micro- and nanofabrication. Comprehensively updated to include new techniques, processes, and variables that have come to prominence in recent years Includes new chapters that address monitoring, properties of molded parts, 3D thermoforming, hot pulling, functional materials, smart surfaces, and upscaling by roll-2-roll Discusses the entire microreplication process, from theory and processes to technology and mold to surface-oriented applications
Book Synopsis Materials Characterization Using Nondestructive Evaluation (NDE) Methods by : Gerhard Huebschen
Download or read book Materials Characterization Using Nondestructive Evaluation (NDE) Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Book Synopsis Visualizing Chemistry by : National Research Council
Download or read book Visualizing Chemistry written by National Research Council and published by National Academies Press. This book was released on 2006-06-01 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scientists and engineers have long relied on the power of imaging techniques to help see objects invisible to the naked eye, and thus, to advance scientific knowledge. These experts are constantly pushing the limits of technology in pursuit of chemical imagingâ€"the ability to visualize molecular structures and chemical composition in time and space as actual events unfoldâ€"from the smallest dimension of a biological system to the widest expanse of a distant galaxy. Chemical imaging has a variety of applications for almost every facet of our daily lives, ranging from medical diagnosis and treatment to the study and design of material properties in new products. In addition to highlighting advances in chemical imaging that could have the greatest impact on critical problems in science and technology, Visualizing Chemistry reviews the current state of chemical imaging technology, identifies promising future developments and their applications, and suggests a research and educational agenda to enable breakthrough improvements.
Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby
Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer. This book was released on 1999-10-31 with total page 489 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis INTRODUCTION TO SCANNING TRANS by : J. KEYSE
Download or read book INTRODUCTION TO SCANNING TRANS written by J. KEYSE and published by Springer. This book was released on 1998-02-25 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.
