Design And Control Of High Speed And Large Range Atomic Force Microscope

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Design and Control of High-speed and Large-range Atomic Force Microscope

Author : Iman Soltani Bozchalooi
Publisher :
ISBN 13 :
Total Pages : 227 pages
Book Rating : 4.:/5 (93 download)

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Book Synopsis Design and Control of High-speed and Large-range Atomic Force Microscope by : Iman Soltani Bozchalooi

Download or read book Design and Control of High-speed and Large-range Atomic Force Microscope written by Iman Soltani Bozchalooi and published by . This book was released on 2015 with total page 227 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis presents the design, control and instrumentation of a novel atomic force microscope (AFM). This AFM is capable of high-speed imaging while maintaining large out-of-plane and lateral scan ranges. The primary contributions of this thesis include the design and implementation of a high-speed and large-range AFM; design, implementation and control of a multi-actuated nano-positioner; development of a general direct data-based control design scheme for redundantly actuated nano-positioners; design and implementation of a non-linear amplitude demodulation method for tapping mode imaging; and development of a parameter estimation methodology for piezo actuator hysteresis modeling and compensation. Atomic force microscopes can provide nano-scale resolution images of sample surface topography in air, vacuum or in liquid. This instrument operates by scanning a micro-mechanical probe on a sample. A measurement of the probe-sample interaction is used to control the AFM scanner and also form a 3D image of the sample surface topography. The mechanical nature and the serial-point-collection bases of operation of this instrument significantly limits its speed and constrains its application to the study of static samples. Unlocking the high-speed performance capability of AFM enables study of dynamic nano-scale processes and opens up the possibility of novel scientific discoveries. Improving the speed performance of AFM however, should not compromise imaging range so that the instrument can accommodate imaging experiments with diverse lateral and out-of-plane scan range requirements. In addition to high-speed and large-range performance, instrument flexibility and ease of use are very important. An AFM should allow samples of different sizes, and provide a simple platform for setting up the imaging experiment. In this work all the components of the AFM are designed to meet these specifications. A multi-actuated scanner is designed and built that is composed of five nano-positioners with different range and bandwidth characteristics. Through redundant actuation this nano-positioner is capable of operating at high speeds and over large lateral and out-of-plane scan ranges. A general data-based compensator design methodology for the control of redundantly actuated nano-positioners is developed. In the proposed approach the compensators are obtained directly from the measured scanner actuator response, without any intermediate modeling. This feature makes updating or tuning the associated parameters easier. The flexibility of AFM control is maintained by designing these compensators auxiliary to a PID control unit. It is shown that in this form, a PID controller suffices to meet the needs of high-speed atomic force microscopy. This approach to control design is also used in the thesis to retroactively enhance existing AFMs operating on both flexure-based scanners and piezo-tubes. To improve the positioning accuracy of the scanner we proposed a more accurate parameter estimation scheme for the Maxwell model of hysteresis extended to the full hysteresis loop. Finally, to enable operation of AFMs with probe arrays in tapping mode a non-linear demodulation method based on the Teager Energy Operator is designed and implemented in both analog and digital forms. The main advantage of this technique is simplicity, enabling implementation of hundreds of these operators in digital form on FPGAs (Field Programmable Gate Arrays) or in ASIC (Application-Specific Integrated Circuit) form on AFM probe arrays for parallel sensing. The developments of this thesis form the bases for the design and implementation of a novel AFM. The implemented instrument is capable of high-speed imaging and simultaneously achieves 6 [mu]m out-of-plane and 120 [mu]m lateral scan ranges making it the largest range high-speed AFM reported to this date. This instrument also features a modular design with a laser spot size of 3.5 [mu]m compatible with small cantilevers, an optical view of the sample and probe for site selection and laser adjustment, a conveniently large (15 mm) waterproof sample stage that accommodates samples with various sizes and a data logging and plotting system with 20 MHz throughput for high resolution image acquisition at high imaging speeds. The designed AFM is used to visualize etching of calcite in a solution of sulfuric acid. Layer-by-layer dissolution along the crystalline lines in a low pH environment is observed in real time and the corresponding dissolution rate is estimated. The designed AFM is also used to visualize in real time the nucleation, growth and striping of copper on gold for the first time.

Design and Control Optimization for High-speed Jumping Mode Atomic Force Microscope

Author : Fangzhou Xia
Publisher :
ISBN 13 :
Total Pages : 111 pages
Book Rating : 4.:/5 (1 download)

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Book Synopsis Design and Control Optimization for High-speed Jumping Mode Atomic Force Microscope by : Fangzhou Xia

Download or read book Design and Control Optimization for High-speed Jumping Mode Atomic Force Microscope written by Fangzhou Xia and published by . This book was released on 2017 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this thesis, I improved the design of a high-speed Atomic Force Microscope (AFM) for jumping mode operation. The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation.

Control System Design for High-Speed Atomic Force Microscopy

Author : Nastaran Nikooienejad
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (131 download)

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Book Synopsis Control System Design for High-Speed Atomic Force Microscopy by : Nastaran Nikooienejad

Download or read book Control System Design for High-Speed Atomic Force Microscopy written by Nastaran Nikooienejad and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Video-rate atomic force microscopy is in high demand to visualize dynamic processes in realtime, whereas the functionality of a commercial atomic force microscope (AFM) is restricted to low-speed scans. In the past decades, extensive research efforts have aimed to reinforce the AFM structure toward high-speed atomic force microscopy. However, video-rate imaging of a relatively large scan area is still challenging due to the highly resonant nature of AFM and its conventional method of scanning. The AFM control system also needs to be significantly improved to harness the full potential of AFM mechanical structure at video rate and provide adequate robustness during scan. Therefore, besides the AFM configuration, scanning methods and control techniques contribute significantly to achieving the ultimate goal of sequential AFM imaging at video rate. This dissertation focuses on novel scanning methods and control design methodologies that facilitate sequential atomic force microscopy and improve positioning accuracy at high speed. First, we leverage a technique to smoothen the sequential cycloid trajectory and mitigate the sudden back and forth motions of a positioner in capturing successive frames of a scan. The resulting trajectory reduces the residual tracking error and enhances the AFM image quality. We also propose a systematic design methodology for a novel repetitive non-raster scan trajectory based on the rosette pattern. This pattern, generated by pure harmonic waveforms, can address the conventional issues with sequential non-raster imaging by enabling a smooth and continuous scan. We provide a thorvii ough mathematical analysis of the rosette pattern and a step-by-step design procedure for rosette scanning. We proceed by proposing high-precision model-based control design approaches for sequential AFM imaging using a microelectromechanical system (MEMS) nanopositioner. To precisely follow the reference setpoints in sequential cycloid and rosette scans, we design a tracking controller based on the internal model principle. The internal-model-based controller (IMBC) is intuitive and well-suited for tracking non-raster scan patterns. The controller incorporates the fundamental reference frequencies and their corresponding higher harmonics to reduce the deterministic error originated from uncompensated nonlinearities in the system. However, the resulting controller is of high order, and requires a priori knowledge of the dominant harmonics in the experimental tracking error. To resolve this, we develop a novel control scheme involving an internal-model-based control in feedback and an iterative learning control in feedforward. The internal-model-based controller only includes fundamental frequencies of the references while the iterative learning controller rejects the induced higher harmonics by learning from past experiences. The proposed control scheme is employed for tracking the rosette pattern at various scan rates. We investigate the performance of the proposed scanning methods and control techniques in closed-loop experiments. Finally, a series of high-quality images are obtained at high speed using a MEMS nanopositioner and a commercial AFM. A limiting factor toward high-speed atomic force microscopy is the lightly damped nature of the scanners. To increase the imaging bandwidth and scan speed, vibration control techniques have been practiced. Among them, fixed-structure strictly negative imaginary (SNI) controllers ensure robust stability of closed-loop system when the scanner incorporates collocated actuator and sensor pairs. In the third section of this dissertation, we present a convex synthesis of SNI controllers for a class of multi-input multi-output (MIMO) plants satisfying the negative imaginary property. The design procedure is based on the frequency response data of the plant, and the control objective is to minimize the distance between a desired and actual closed-loop frequency response. The controllers are experimentally implemented to augment damping to the fundamental resonant mode of a MEMS nanopositioner in a two-input two-output configuration.

Design and Implementation of Large-Range Compliant Micropositioning Systems

Author : Qingsong Xu
Publisher : John Wiley & Sons
ISBN 13 : 111913143X
Total Pages : 294 pages
Book Rating : 4.1/5 (191 download)

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Book Synopsis Design and Implementation of Large-Range Compliant Micropositioning Systems by : Qingsong Xu

Download or read book Design and Implementation of Large-Range Compliant Micropositioning Systems written by Qingsong Xu and published by John Wiley & Sons. This book was released on 2017-05-01 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: An innovative and timely guide to the modeling, design and implementation of large-range compliant micropositioning systems based on flexure hinges Features innovative compact mechanism designs for large-range translational and rotational positioning Provides original and concise treatment of various flexure hinges with well-presented design and control methods Focuses on design implementation and applications through detailed examples

High-Speed Atomic Force Microscopy in Biology

Author : Toshio Ando
Publisher : Springer Nature
ISBN 13 : 3662647850
Total Pages : 327 pages
Book Rating : 4.6/5 (626 download)

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Book Synopsis High-Speed Atomic Force Microscopy in Biology by : Toshio Ando

Download or read book High-Speed Atomic Force Microscopy in Biology written by Toshio Ando and published by Springer Nature. This book was released on 2022-03-23 with total page 327 pages. Available in PDF, EPUB and Kindle. Book excerpt: This first book on high-speed atomic force microscopy (HS-AFM) is intended for students and biologists who want to use HS-AFM in their research. It provides straightforward explanations of the principle and techniques of AFM and HS-AFM. Numerous examples of HS-AFM studies on proteins demonstrate how to apply this new form of microscopy to specific biological problems. Several precautions for successful imaging and the preparation of cantilever tips and substrate surfaces will greatly benefit first-time users of HS-AFM. In turn, the instrumentation techniques detailed in Chapter 4 can be skipped, but will be useful for engineers and scientists who want to develop the next generation of high-speed scanning probe microscopes for biology. The book is intended to facilitate the first-time use of this new technique, and to inspire students and researchers to tackle their own specific biological problems by directly observing dynamic events occurring in the nanoscopic world. Microscopy in biology has recently entered a new era with the advent of high-speed atomic force microscopy (HS-AFM). Unlike optical microscopy, electron microscopy, and conventional slow AFM, it allows us to directly observe biological molecules in physiological environments. Molecular “movies” created using HS-AFM can directly reveal how molecules behave and operate, without the need for subsequent complex analyses and roundabout interpretations. It also allows us to directly monitor morphological change in live cells, and dynamic molecular events occurring on the surfaces of living bacteria and intracellular organelles. As HS-AFM instruments were recently commercialized, in the near future HS-AFM is expected to become a common tool in biology, and will enhance and accelerate our understanding of biological phenomena.

Atomic Force Microscopy

Author : Greg Haugstad
Publisher : John Wiley & Sons
ISBN 13 : 1118360680
Total Pages : 496 pages
Book Rating : 4.1/5 (183 download)

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Book Synopsis Atomic Force Microscopy by : Greg Haugstad

Download or read book Atomic Force Microscopy written by Greg Haugstad and published by John Wiley & Sons. This book was released on 2012-09-04 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

High Speed Atomic Force Microscopy

Author : Younkoo Jeong
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (67 download)

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Book Synopsis High Speed Atomic Force Microscopy by : Younkoo Jeong

Download or read book High Speed Atomic Force Microscopy written by Younkoo Jeong and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: Since its introduction more than twenty years ago, Atomic Force Microscopy (AFM) has extended its application areas from material science to biology or biophysics, based on its capability to image/manipulate objects in various environments with sub-nanometer spatial resolution in three dimensions. Among the two most commonly used modes, the dynamic (tapping) mode has a great advantage over contact mode when imaging soft materials, minimizing potentially destructive shear and adhesive forces on the sample. The amplitude modulation is the most commonly used control method in the dynamic mode of AFM, in which the oscillation amplitude of the cantilever is regulated. However, in typical implementations, due to tapping dynamics of the AFM cantilevers, the transient response of the cantilever induced by changes of the tip-sample interaction force leads to greater variations in tip-sample interaction via feedback, causing excessive tapping forces and/or possible loss of tapping during the scanning, and thus greater sample distortions and imaging errors. In addition, the low bandwidth of the actuators in conventional AFMs, such as the z-positioner and the raster scanner limits the scanning speed. Therefore, while dynamic mode AFM has many potential applications, the inability to achieve direct and precise control of the tip-sample interaction forces and the low bandwidth of actuators for the tip-sample separation control and the raster scanning have been key barriers which imaging rate and inhibit innovation leading to new applications. In this research, the design, actuation and control of a new generation AFM probing system which enables high-speed and high-resolution imaging of samples are investigated. In order to achieve direct tip-sample interaction control during the scanning, a novel dynamic sensing and control method are implemented, in which the tip-sample interaction force of each tapping cycle is estimated and subsequently controlled for dynamic force microscopy. By employing collocated magnetic actuation of the AFM cantilever and dual-actuator tip-motion control scheme, the high bandwidth tip-motion control, whose bandwidth is comparable to that of the cantilever, the dynamics over-damped, and the motion range comparable to that of conventional z-scanner is achieved. For the high bandwidth raster scanning as well as high bandwidth tip-sample separation control, active multi-axis probing system is implemented, in which multi-axis magnetic actuators along with a multi-axis probe with one magnetic moment, specially designed and fabricated for the multi-axis actuation, achieves high bandwidth multi-axis tip-motion control along the Z axis and the X axis. In order to achieve the high resolution imaging, a low noise laser measurement system is implemented and integrated to a commercial AFM (MFP3D, Asylum research). For the implementation of the direct tip-sample interaction control and high bandwidth active multi-axis probing system, high speed programmable digital controller is developed using field programmable gate array (FPGA) whose closed loop update rate is two orders of magnitude higher than commercially available ones. The results of scanning a standard grating whose pitch is 100nm and a biological grating (repeating protein structure on purple membranes) whose lateral pitch is about 6.2 nm using the high speed AFM are presented and discussed.

A System Dynamics Approach to User Independence in High Speed Atomic Force Microscopy

Author : Daniel James Burns
Publisher :
ISBN 13 :
Total Pages : 146 pages
Book Rating : 4.:/5 (74 download)

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Book Synopsis A System Dynamics Approach to User Independence in High Speed Atomic Force Microscopy by : Daniel James Burns

Download or read book A System Dynamics Approach to User Independence in High Speed Atomic Force Microscopy written by Daniel James Burns and published by . This book was released on 2010 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt: As progress in molecular biology and nanotechnology continues, demand for rapid and high quality image acquisition has increased to the point where the limitations of atomic force microscopes (AFM) become impediments to further discovery. Many biological processes of interest occur on time scales faster than the observation capability of conventional AFMs, which are typically limited to imaging rates on the order of minutes. Imaging at faster scan rates excite resonances in the mechanical scanner that can distort the image, thereby preventing higher speed imaging. Although traditional robust feedforward controllers and input shaping have proven effective at minimizing the influence of scanner distortions, the lack of direct measurement and use of model-based controllers has required disassembling the microscope to access lateral motion with external sensors in order to perform a full system identification experiment, which places excessive demands on routine microscope operators. This work represents a new way to characterize the lateral scanner dynamics without addition of lateral sensors, and shape the commanded input signals in such a way that disturbing dynamics are not excited in an automatic and user-independent manner. Scanner coupling between the lateral and out-of-plane directions is exploited and used to build a minimal model of the scanner that is also sufficient to describe the source of the disturbances. This model informs the design of an online input shaper used to suppress components of the high speed command signals. The method presented is distinct from alternate approaches in that neither an information-complete system identification experiment, nor microscope modification are required. This approach has enabled an increase in the scan rates of unmodified commercial AFMs from 1-4 lines/second to over 100 lines/second and has been successfully applied to a custom-built high speed AFM, unlocking scan rates of over 1,600 lines/second. Images from this high speed AFM have been taken at more than 10 frames/second. Additionally, bulky optical components for sensing cantilever deflection and low bandwidth actuators constrain the AFM's potential observations, and the increasing instrument complexity requires operators skilled in optical alignment and controller tuning. Recent progress in MEMS fabrication has allowed the development of a new type of AFM cantilever with an integrated sensor and actuator. Such a fully instrumented cantilever enables direct measurement and actuation of the cantilever motion and interaction with the sample, eliminating the need for microscope operators to align the bulky optical components. This technology is expected to not only allow for high speed imaging but also the miniaturization of AFMs and expand their use to new experimental environments. Based on the complexity of these integrated MEMS devices, a thorough understanding of their behavior and a specialized controls approach is needed to guide non-expert users in their operation and extract high performance. The intrinsic properties of such MEMS cantilevers are investigated, and a combined approach is developed for sensing and control, optimized for high speed detection and actuation.

Atomic Force Microscopy in Molecular and Cell Biology

Author : Jiye Cai
Publisher : Springer
ISBN 13 : 9811315108
Total Pages : 235 pages
Book Rating : 4.8/5 (113 download)

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Book Synopsis Atomic Force Microscopy in Molecular and Cell Biology by : Jiye Cai

Download or read book Atomic Force Microscopy in Molecular and Cell Biology written by Jiye Cai and published by Springer. This book was released on 2018-11-03 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book addresses new achievements in AFM instruments – e.g. higher speed and higher resolution – and how AFM is being combined with other new methods like NSOM, STED, STORM, PALM, and Raman. This book explores the latest advances in atomic force microscopy and related techniques in molecular and cell biology. Atomic force microscopy (AFM) can be used to detect the superstructures of the cell membrane, cell morphology, cell skeletons and their mechanical properties. Opening up new fields of in-situ dynamic study for living cells, enzymatic reactions, fibril growth and biomedical research, these combined techniques will yield valuable new insights into molecule and cell biology. This book offers a valuable resource for students and researchers in the fields of biochemistry, cell research and chemistry etc.

Advances in High-Speed Atomic Force Microscopy

Author : Pascal Nievergelt
Publisher :
ISBN 13 :
Total Pages : 209 pages
Book Rating : 4.:/5 (15 download)

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Book Synopsis Advances in High-Speed Atomic Force Microscopy by : Pascal Nievergelt

Download or read book Advances in High-Speed Atomic Force Microscopy written by Pascal Nievergelt and published by . This book was released on 2018 with total page 209 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mots-clés de l'auteur: Atomic force microscopy (AFM) ; high--speed AFM ; photothermal excitation ; scanner design ; control system design ; off-resonance tapping AFM ; open hardware ; protein--protein dynamics ; live cell imaging.

Active Probe Atomic Force Microscopy

Author : Fangzhou Xia
Publisher : Springer
ISBN 13 : 9783031442322
Total Pages : 0 pages
Book Rating : 4.4/5 (423 download)

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Book Synopsis Active Probe Atomic Force Microscopy by : Fangzhou Xia

Download or read book Active Probe Atomic Force Microscopy written by Fangzhou Xia and published by Springer. This book was released on 2024-02-07 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists.

Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit

Author : En-Te Hwu
Publisher : Edwin Hwu
ISBN 13 :
Total Pages : 136 pages
Book Rating : 4./5 ( download)

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Book Synopsis Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit by : En-Te Hwu

Download or read book Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit written by En-Te Hwu and published by Edwin Hwu. This book was released on 2014-04-30 with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt: A novel non-contact multiaxial astigmatic detection system (ADS) is designed and developed using the astigmatism as the measuring principle for the translational displacement, the angle, and their variations of a measured surface simultaneously. An optical pickup unit (OPU) of a commercial digital versatile disk (DVD) read only memory (ROM) drive can be used directly as an optical path mechanism in the above mentioned ADS, which can measure the translational and angular displacements accurately and simultaneously. The total linear detection range and the maximum measurement bandwidth of the ADS are 6 mm and 80MHz, respectively. The resolution of the translational displacement measurement is in sub-angstrom scale. For an operating frequency of 700 kHz, the noise floors of the translational and angular signals are below 0.8 pm/Hz1/2 and 0.4 mrad/ Hz1/2, respectively. The ADS can monitor the translational and two orthogonal angular displacements of a micro fabricated cantilever in atomic force microscopy (AFM). All the three, contact non-contact and tapping, modes can resolve the single atomic steps of the graphite surface, which indicates that atomic resolution is achievable with the ADS. The thermal noise spectra of the AFM probe can be clearly measured as well. Furthermore, the accuracy of scanning probe microscopy (SPM) depends not only on the measurement system itself, but also by the accuracy of the signal processing, which further depends on the physical and geometrical characteristics of the probe. The structure of the ADS is compact and stable. Besides the measurements through AFM probes, the ADS can be operated in profilometer mode. The CD surface and the CCD microlens are measured by this mode. The maximum scanning speed can reach up to 3.84×106 mm/s theoretically, almost one million times faster than that of a commercial SPM system. The ADS has a great potential for future development, the expansibility and the accuracy can evolve with the performance of future OPU. From the DVD OPU to higher resolution one, such as the OPU of the Blu-ray drive or high- definition (HD-DVD), can be integrated into the ADS as well. KEYWORDS: Astigmatism, ADS, Translational displacement, Angular displacement, SPM, AFM, Cantilever, Optical profilometer

Atomic Force Microscopy

Author : Peter Eaton
Publisher : OUP Oxford
ISBN 13 : 0191576670
Total Pages : 256 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis Atomic Force Microscopy by : Peter Eaton

Download or read book Atomic Force Microscopy written by Peter Eaton and published by OUP Oxford. This book was released on 2010-03-25 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.

Design, Modeling and Control of Nanopositioning Systems

Author : Andrew J. Fleming
Publisher : Springer
ISBN 13 : 331906617X
Total Pages : 418 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Design, Modeling and Control of Nanopositioning Systems by : Andrew J. Fleming

Download or read book Design, Modeling and Control of Nanopositioning Systems written by Andrew J. Fleming and published by Springer. This book was released on 2014-05-15 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control. Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging. Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.

Model Development and Control Design for High Speed Atomic Force Microscopy

Author :
Publisher :
ISBN 13 :
Total Pages : 13 pages
Book Rating : 4.:/5 (742 download)

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Book Synopsis Model Development and Control Design for High Speed Atomic Force Microscopy by :

Download or read book Model Development and Control Design for High Speed Atomic Force Microscopy written by and published by . This book was released on 2004 with total page 13 pages. Available in PDF, EPUB and Kindle. Book excerpt: This paper addresses the development of energy-based models and model-based control designs necessary to achieve present and projected applications involving atomic force microscopy. The models are based on a combination of energy analysis at the mesoscopic level with stochastic homogenization techniques to construct low-order macroscopic models. Approximate model inverses are then employed as filters to linearize transducer responses for linear robust control design.

Atomic Force Microscopy For Biologists (2nd Edition)

Author : Victor J Morris
Publisher : World Scientific
ISBN 13 : 190897821X
Total Pages : 423 pages
Book Rating : 4.9/5 (89 download)

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Book Synopsis Atomic Force Microscopy For Biologists (2nd Edition) by : Victor J Morris

Download or read book Atomic Force Microscopy For Biologists (2nd Edition) written by Victor J Morris and published by World Scientific. This book was released on 2009-08-11 with total page 423 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems.The second edition of this bestseller has been updated to describe the latest developments in this exciting field, including a brand new chapter on force spectroscopy. The dramatic developments of AFM over the past ten years from a simple imaging tool to the multi-faceted, nano-manipulating technique that it is today are conveyed in a lively and informative narrative, which provides essential reading for students and experienced researchers alike./a

Nanoscale Calibration Standards and Methods

Author : Günter Wilkening
Publisher : John Wiley & Sons
ISBN 13 : 9783527405022
Total Pages : 554 pages
Book Rating : 4.4/5 (5 download)

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Book Synopsis Nanoscale Calibration Standards and Methods by : Günter Wilkening

Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2005-07-01 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing