Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Download Defect Analysis In Electron Microscopy full books in PDF, epub, and Kindle. Read online Defect Analysis In Electron Microscopy ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author : A. K. Head
Publisher : North-Holland
ISBN 13 :
Total Pages : 422 pages
Book Rating : 4.F/5 ( download)
Download or read book Computed Electron Micrographs and Defect Identification written by A. K. Head and published by North-Holland. This book was released on 1973 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Doneker
Publisher : Routledge
ISBN 13 : 1351456474
Total Pages : 524 pages
Book Rating : 4.3/5 (514 download)
Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author : M. H. Loretto
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (847 download)
Download or read book Defect Analysis in Electron Microscopy written by M. H. Loretto and published by . This book was released on 1986 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wei Li
Publisher :
ISBN 13 :
Total Pages : 31 pages
Book Rating : 4.:/5 (11 download)
Download or read book Automated Defect Analysis in Electron Microscopy Images written by Wei Li and published by . This book was released on 2018 with total page 31 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. H. Loretto
Publisher : Chapman & Hall
ISBN 13 : 9780412137600
Total Pages : 134 pages
Book Rating : 4.1/5 (376 download)
Download or read book Defect Analysis in Electron Microscopy written by M. H. Loretto and published by Chapman & Hall. This book was released on 1975-01-01 with total page 134 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M.L Jenkins
Publisher : CRC Press
ISBN 13 : 1420034642
Total Pages : 233 pages
Book Rating : 4.4/5 (2 download)
Download or read book Characterisation of Radiation Damage by Transmission Electron Microscopy written by M.L Jenkins and published by CRC Press. This book was released on 2000-11-21 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Author : Hiroyasu Saka
Publisher : World Scientific
ISBN 13 : 981123471X
Total Pages : 309 pages
Book Rating : 4.8/5 (112 download)
Download or read book Practical Electron Microscopy Of Lattice Defects written by Hiroyasu Saka and published by World Scientific. This book was released on 2021-04-14 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Author : Charles E. Lyman
Publisher : Springer Science & Business Media
ISBN 13 : 9780306435911
Total Pages : 428 pages
Book Rating : 4.4/5 (359 download)
Download or read book Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy written by Charles E. Lyman and published by Springer Science & Business Media. This book was released on 1990-08-31 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.
Author : John M. Rodenburg
Publisher : CRC Press
ISBN 13 : 1000112306
Total Pages : 708 pages
Book Rating : 4.0/5 (1 download)
Download or read book Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 written by John M. Rodenburg and published by CRC Press. This book was released on 2022-01-27 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Author : John Stirling
Publisher : John Wiley & Sons
ISBN 13 : 1118452836
Total Pages : 492 pages
Book Rating : 4.1/5 (184 download)
Download or read book Diagnostic Electron Microscopy written by John Stirling and published by John Wiley & Sons. This book was released on 2012-11-09 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diagnostic Electron Microscopy Diagnostic Electron Microscopy: A Practical Guide to Interpretation and Technique summarises the current interpretational applications of TEM in diagnostic pathology. This concise and accessible volume provides a working guide to the main, or most useful, applications of the technique including practical topics of concern to laboratory scientists, brief guides to traditional tissue and microbiological preparation techniques, microwave processing, digital imaging and measurement uncertainty. The text features both a screening and interpretational guide for TEM diagnostic applications and current TEM diagnostic tissue preparation methods pertinent to all clinical electron microscope units worldwide. Containing high-quality representative images, this up-to-date text includes detailed information on the most important diagnostic applications of transmission electron microscopy as well as instructions for specific tissues and current basic preparative techniques. The book is relevant to trainee pathologists and practising pathologists who are expected to understand and evaluate/screen tissues by TEM. In addition, technical and scientific staff involved in tissue preparation and diagnostic tissue evaluation/screening by TEM will find this text useful.
Author :
Publisher :
ISBN 13 :
Total Pages : 594 pages
Book Rating : 4.:/5 (43 download)
Download or read book Electron Microscopy and Analysis written by and published by . This book was released on 1991 with total page 594 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : U Valdre
Publisher : Elsevier
ISBN 13 : 0323142567
Total Pages : 785 pages
Book Rating : 4.3/5 (231 download)
Download or read book Electron Microscopy In Material Science written by U Valdre and published by Elsevier. This book was released on 2012-12-02 with total page 785 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.
Author : David Cherns
Publisher : Institute of Physics Publishing (GB)
ISBN 13 : 9780750303576
Total Pages : 616 pages
Book Rating : 4.3/5 (35 download)
Download or read book Electron Microscopy and Analysis 1995 written by David Cherns and published by Institute of Physics Publishing (GB). This book was released on 1995 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a wide-ranging survey of developments in the techniques and applications of electron microscopy, its associated analytical techniques, and the various complementary analytical and imaging methods available.
Author : S Amelinckx
Publisher : Elsevier
ISBN 13 : 0444601848
Total Pages : 472 pages
Book Rating : 4.4/5 (446 download)
Download or read book Diffraction and Imaging Techniques in Material Science P1 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a deformed crystal. It discusses the dynamical theory of diffraction of fast electrons, the treatment of absorption in the dynamical theory of electron diffraction, the use of electron microscopy to study planar interfaces, and analysis of weak-beam images. The book also covers the use of computed electron micrographs in defect identification, crystallographic analysis of dislocation loops containing shear components, and detection and identification of small coherent particles. In addition, the reader is introduced to interpretation of diffuse scattering and short-range order, along with the crystallography of martensitic transformations. The remaining chapters focus on the working principle of the transmission electron microscope, experimental structure imaging of crystals, and the study of diffuse scattering effects originating from substitutional disorder and displacement disorder. The information on diffraction and imaging techniques in material science contained in this book will be helpful to students, researchers, and scientists.
Author : David G. Rickerby
Publisher : Springer Science & Business Media
ISBN 13 : 9780792359395
Total Pages : 522 pages
Book Rating : 4.3/5 (593 download)
Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 1999-10-31 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Author : L.M Clarebrough
Publisher : Routledge
ISBN 13 : 135145319X
Total Pages : 446 pages
Book Rating : 4.3/5 (514 download)
Download or read book Electron Microscopy of Interfaces in Metals and Alloys written by L.M Clarebrough and published by Routledge. This book was released on 2021-09-02 with total page 446 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.
Author : Peter. B Hirsch
Publisher : CRC Press
ISBN 13 : 9780750305389
Total Pages : 240 pages
Book Rating : 4.3/5 (53 download)
Download or read book Topics in Electron Diffraction and Microscopy of Materials written by Peter. B Hirsch and published by CRC Press. This book was released on 1999-01-01 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
