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Author : Minesh Balkrishan Amin
Publisher :
ISBN 13 :
Total Pages : 264 pages
Book Rating : 4.:/5 (319 download)
Download or read book Data Parallel Fault Simulation for Combinational and Sequential Circuits written by Minesh Balkrishan Amin and published by . This book was released on 1996 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Chin-Yaw Tiew
Publisher :
ISBN 13 :
Total Pages : 176 pages
Book Rating : 4.:/5 (29 download)
Download or read book On Improving the Performance of Parallel Fault Simulation for Synchronous Sequential Circuits written by Chin-Yaw Tiew and published by . This book was released on 1993 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Mehrdad Mojtahedi
Publisher :
ISBN 13 :
Total Pages : 40 pages
Book Rating : 4.:/5 (634 download)
Download or read book New methods for parallel fast fault simulation for synchronous sequential circuits written by Mehrdad Mojtahedi and published by . This book was released on 1992 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Shih-Ming Li
Publisher :
ISBN 13 :
Total Pages : 86 pages
Book Rating : 4.:/5 (239 download)
Download or read book A Modified Parallel Fault Simulator for Combinational Circuits written by Shih-Ming Li and published by . This book was released on 1991 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Bernd Becker
Publisher :
ISBN 13 :
Total Pages : 10 pages
Book Rating : 4.:/5 (163 download)
Download or read book Structure based methods for parallel pattern fault simulation in combinational circuits written by Bernd Becker and published by . This book was released on 1990 with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ohyoung Song
Publisher :
ISBN 13 :
Total Pages : 30 pages
Book Rating : 4.:/5 (246 download)
Download or read book Parallel Pattern Fault Simulation Based on Stem Faults in Combinational Circuits written by Ohyoung Song and published by . This book was released on 1990 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Dilip Krishnaswamy
Publisher :
ISBN 13 :
Total Pages : 220 pages
Book Rating : 4.:/5 (391 download)
Download or read book Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation written by Dilip Krishnaswamy and published by . This book was released on 1997 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Nikolaus Gouders
Publisher :
ISBN 13 :
Total Pages : 4 pages
Book Rating : 4.:/5 (632 download)
Download or read book PARIS written by Nikolaus Gouders and published by . This book was released on 1991 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ernst G. Ulrich
Publisher : Springer Science & Business Media
ISBN 13 : 1461527384
Total Pages : 199 pages
Book Rating : 4.4/5 (615 download)
Download or read book Concurrent and Comparative Discrete Event Simulation written by Ernst G. Ulrich and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 199 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.
Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author : Stanford University. Computer Systems Laboratory
Publisher :
ISBN 13 :
Total Pages : 196 pages
Book Rating : 4.F/5 ( download)
Download or read book Fault Simulation in Adlib Sable written by Stanford University. Computer Systems Laboratory and published by . This book was released on 1983 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: This technical report presents work in the area of deductive fault simulation. This technique, one of the three fault simulation techniques discussed in the literature, has been implemented in ADLIB-SABLE, a hierarchical multi-level simulator designed and used at Stanford University. Most of the fault models illustrated in this report consider only two fault types: single stuck-at-0 and single stuck-at-Z (high impedance). Gate level fault models have been built for most commonly used gates. The ability to model the fault behavior of functional blocks in ADLIB-SABLE is also demonstrated. The motivation is that for many functional blocks, a gate level description may not be available or that the designer wishes to sacrifice detailed analysis for a higher simulation speed. Functional fault models are built for many commonly used blocks, using a decomposition technique. The ratio of functional fault simulation speed to gate level fault simulation speed has been observed to be of the order of 5 for the typical functional block sizes considered. The ratio however, is not the upper limit and will be larger for larger-sized functional blocks. It was also proved that the functional fault models are invariant with respect to the internal implementation details. A design discipline for sequential circuits is worked out which allows deductive fault simulation. Extensions to the simple (0,1) deductive techniques are studied and the fault models built in the extended domain are observed to be useful in modelling gates of some technologies. A comparison between deductive and concurrent fault simulation methods is given. Performance of deductive fault simulation, implemented in ADLIB-SABLE, shows that for sequential as well as combinational circuits, the CPU time increases linearly with increasing number of components simulated, an advantage over fault simulators which simulate one fault at a time and display a quadratic behavior.
Author : Marong Phadoongsidhi
Publisher :
ISBN 13 :
Total Pages : 152 pages
Book Rating : 4.:/5 (89 download)
Download or read book High Level Test Methodology for Crosstalk Faults in Sequential Circuits written by Marong Phadoongsidhi and published by . This book was released on 2004 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wolfgang Meyer
Publisher :
ISBN 13 :
Total Pages : 9 pages
Book Rating : 4.:/5 (753 download)
Download or read book Mixed-level fault simulation for hierarchical sequential circuits written by Wolfgang Meyer and published by . This book was released on 1993 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Egon Börger
Publisher : Springer Science & Business Media
ISBN 13 : 3642571999
Total Pages : 363 pages
Book Rating : 4.6/5 (425 download)
Download or read book Architecture Design and Validation Methods written by Egon Börger and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 363 pages. Available in PDF, EPUB and Kindle. Book excerpt: This state-of-the-art survey gives a systematic presentation of recent advances in the design and validation of computer architectures. The book covers a comprehensive range of architecture design and validation methods, from computer aided high-level design of VLSI circuits and systems to layout and testable design, including the modeling and synthesis of behavior and dataflow, cell-based logic optimization, machine assisted verification, and virtual machine design.
Author : Evstratios Vandris
Publisher :
ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.:/5 (319 download)
Download or read book Switch-level Fault Simulation of MOS VLSI Circuits written by Evstratios Vandris and published by . This book was released on 1991 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sumit Ghosh
Publisher : Springer Science & Business Media
ISBN 13 : 0387216162
Total Pages : 435 pages
Book Rating : 4.3/5 (872 download)
Download or read book Algorithm Design for Networked Information Technology Systems written by Sumit Ghosh and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: I felt deeply honored when Professor Sumit Ghosh asked me to write the foreword to his book with an extraordinary perspective. I have long admired him, ?rst as a student leader at Stanford, where he initiated the ?rst IEEE Computer Society’s student chapter, and later as an esteemed and inspiring friend whose transdisciplinary research broadened and enhanced the horizons of practitioners of computer science and engineering, including my own. His ideas, which are derived from his profound vision, deep critical thinking, and personal intuition, reach from information technology to bioscience, as - hibited in this excellent book. To me, an ordinary engineer, it opens up a panoramic view of the Universe of Knowledge that keeps expanding and - spiring,likethegoodIndianproverb,whichsays,“agoodbookinformsyou,an excellent book teaches you, and a great book changes you. ” I sincerely believe that Professor Ghosh’s book will help us change and advance the methods of systems engineering and technology. Vision Inspired vision sees ahead of others what will or may come to be, a vivid, imagined concept or anticipation. An inspired vision personi?es what is good and what like-minded individuals hope for. Our vision is one of creating an Internet of minds, where minds are Web sites or knowledge centers, which create, store, and radiate knowledge through interaction with other minds connected by a universal shared network. This vision will not just hasten the death of distance, but will also - carcerate ignorance.
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
