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Computed Electron Micrographs And Defect Humble
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Book Synopsis Computed Electron Micrographs And Defect Identification by : A.K. Head
Download or read book Computed Electron Micrographs And Defect Identification written by A.K. Head and published by Elsevier. This book was released on 2012-12-02 with total page 413 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
Book Synopsis Transmission Electron Microscopy by : Ludwig Reimer
Download or read book Transmission Electron Microscopy written by Ludwig Reimer and published by Springer Science & Business Media. This book was released on 2008-08-28 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Book Synopsis Introduction to Analytical Electron Microscopy by : John Hren
Download or read book Introduction to Analytical Electron Microscopy written by John Hren and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 609 pages. Available in PDF, EPUB and Kindle. Book excerpt: The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.
Book Synopsis Electron Microscopy in Mineralogy by : P.E. Champness
Download or read book Electron Microscopy in Mineralogy written by P.E. Champness and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Book Synopsis Properties and Microstructure by : R. K. MacCrone
Download or read book Properties and Microstructure written by R. K. MacCrone and published by Elsevier. This book was released on 2013-10-22 with total page 473 pages. Available in PDF, EPUB and Kindle. Book excerpt: Treatise on Materials Science and Technology, Volume 11: Properties And Microstructure covers the parameters important to understanding microstructural effects. The book discusses the direct observation and characterization of defects in materials; the cause and effect of crystal defects in silicon integrated circuits; as well as the microstructure of some noncrystalline ceramics. The text also describes microstructural defects in the important semiconductors silicon and germanium, microstructural effects in glasses, microstructural effects on the mechanical properties of ceramics, and finally, microstructures in ferrites. Materials scientists, materials engineers, and graduate students taking related courses will find the book invaluable.
Book Synopsis Principles of Electron Optics by : Peter W. Hawkes
Download or read book Principles of Electron Optics written by Peter W. Hawkes and published by Academic Press. This book was released on 1996-04-24 with total page 753 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Electron Optics
Book Synopsis Surface Characterization by : Dag Brune
Download or read book Surface Characterization written by Dag Brune and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 715 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Surface Characterization" provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method. Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribological, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included. "Surface Characterization" is addressed to both academic and industrial audiences. Scientists and engineers working on the production and development of new materials will find it an invaluable reference source. Physicist, chemists, chemical engineers, material scientists and engineers from every area of materials research will benefit from the wealth of practical advice the book provides.
Book Synopsis Introduction to Conventional Transmission Electron Microscopy by : Marc De Graef
Download or read book Introduction to Conventional Transmission Electron Microscopy written by Marc De Graef and published by Cambridge University Press. This book was released on 2003-03-27 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Book Synopsis Understanding Materials by : Colin Humphreys
Download or read book Understanding Materials written by Colin Humphreys and published by CRC Press. This book was released on 2020-01-29 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a very special book for two reasons. First, it is a tribute to Professor Sir Peter Hirsch from his students, colleagues and friends. Second, it is a collection of specially written review articles by world-class scientists that take the readers from the origins of modem materials science through to the cutting edge of the subject in the twenty- first century. The book will be a valuable resource for all researchers in materials science, particularly those specialising in electron microscopy and diffraction, and in the mechanical properties of materials. The front and back covers of this book are coloured images of historic electron micrographs depicting the first observation in the world of moving dislocations. The pictures were taken by Mike Whelan, then a research student of Peter Hirsch. The image on the front cover is before some dislocations have moved, and the back cover image is after the movement. See if you can spot the difference! This book had its genesis in a symposium organised by Mike Goringe, John Hutchison and myself to mark the retirement of Peter Hirsch from the Isaac Wolfson Chair of Metallurgy at Oxford. This symposium brought together a large number of Peter's former students and colleagues. Some of the most distinguished of these have now written the chapters in this book. The opening chapter, by Professor Ugo Valdre, provides a fascinating biographical sketch of Peter Hirsch from his early career in Cambridge to his retirement in Oxford. It contains many illuminating insights into the personality of Peter, both as a scientist and as a man. The next two chapters focus on the development of electron microscopy and diffraction. Professor Mike Whelan gives an eye-witness account of the seminal early work of Peter and his colleagues at Cambridge on the first observation of dislocations and their movements, using trans-mission electron microscopy. Professor Archie Howie extends this account to the present day, describing nanometer-scale resolution in scanning electron microscopes and atomic scale resolution in the scanning tunnelling microscope.
Book Synopsis Handbook of Surface and Interface Analysis by : John C. Riviere
Download or read book Handbook of Surface and Interface Analysis written by John C. Riviere and published by CRC Press. This book was released on 2009-06-24 with total page 671 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Book Synopsis Electron Microscopy by : S. Amelinckx
Download or read book Electron Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 527 pages. Available in PDF, EPUB and Kindle. Book excerpt: Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Book Synopsis Aggregation Phenomena of Point Defects in Silicon by : Erhard Sirtl
Download or read book Aggregation Phenomena of Point Defects in Silicon written by Erhard Sirtl and published by . This book was released on 1983 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Extended Defects in Semiconductors by : D. B. Holt
Download or read book Extended Defects in Semiconductors written by D. B. Holt and published by Cambridge University Press. This book was released on 2007-04-12 with total page 625 pages. Available in PDF, EPUB and Kindle. Book excerpt: A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
Book Synopsis Transmission Electron Microscopy by : David B. Williams
Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Book Synopsis Grain Boundaries by : Louisette Priester
Download or read book Grain Boundaries written by Louisette Priester and published by Springer Science & Business Media. This book was released on 2012-11-28 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Grain boundaries are a main feature of crystalline materials. They play a key role in determining the properties of materials, especially when grain size decreases and even more so with the current improvements of processing tools and methods that allow us to control various elements in a polycrystal. This book presents the theoretical basis of the study of grain boundaries and aims to open up new lines of research in this area. The treatment is light on mathematical approaches while emphasizing practical examples; the issues they raise are discussed with reference to theories. The general approach of the book has two main goals: to lead the reader from the concept of ‘ideal’ to ‘real’ grain boundaries; to depart from established knowledge and address the opportunities emerging through "grain boundary engineering", the control of morphological and crystallographic features that affect material properties. The book is divided in three parts: I ‘From interganular order to disorder’ deals with the concept of the perfect grain boundary, at equilibrium, and questions the maintenance of its crystalline state. II ‘From the ideal to the real grain boundary’ deals with the concept of the faulted grain boundary. It attempts to reveal the influence of the grain boundary structure on its defects, their formation and their accommodation. III ‘From free to constrained grain boundaries’ is devoted to grain boundary ensembles starting from the triple junction (the elemental configuration) to real grain boundary networks in polycrystals This part covers a new and topical development in the field. It presents for the first time an avenue for researchers working on macroscopic aspects, to approach the scale of description of grain boundaries. Audience: graduate students, researchers and engineers in Materials Science and all those scientists pursuing grain boundary engineering in order to improve materials performance.
Download or read book Catalysis written by John R. Anderson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: The development of a commercially successful process for the catalytic synthesis of ammonia was a scientific as well as a technical triumph. Its implications were con siderable. It demonstrated the power of a combination of innovative technology and engineering together with basic chemical science, and it introduced ideas and techniques into catalytic science and process engineering which are still with us today. In a real sense, this process changed the face of industrial chemistry and process technology. Of course, the key step in the direct synthesis of ammonia was the development of an efficient catalyst, and the historical account given by Dr. S. A. Topham in the first chapter of this volume shows how this was success fully accomplished, and how this was combined with the successful solution of other daunting technical problems to make the overall process possible. The microstructure of a catalyst is an important feature which determines its behaviour, and the electron microscope is one of the most important instrumental methods by means of which structural and microstruc tural information can be obtained. Nevertheless, the elec tron-optical processes of image formation are complex, but need to be properly understood if image interpreta tion is to be done reliably. In the second chapter of this volume, Dr. J. V. Sanders addresses the entire field of the application of electron microscopic methods to the examination of catalysts.
Book Synopsis Metallography – A Practical Tool for Correlating the Structure and Properties of Materials by :
Download or read book Metallography – A Practical Tool for Correlating the Structure and Properties of Materials written by and published by ASTM International. This book was released on 1974 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:
