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Characterization Of High Tc Materials And Devices By Electron Microscopy
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Book Synopsis Characterization of High Tc Materials and Devices by Electron Microscopy by : Nigel D. Browning
Download or read book Characterization of High Tc Materials and Devices by Electron Microscopy written by Nigel D. Browning and published by Cambridge University Press. This book was released on 2000-07-06 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
Book Synopsis Advanced Composite Materials by : Ashutosh Tiwari
Download or read book Advanced Composite Materials written by Ashutosh Tiwari and published by John Wiley & Sons. This book was released on 2016-09-14 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt: Composites materials is basically the combining of unique properties of materials to have synergistic effects. A combination of materials is needed to adapt to certain properties for any application area. There is an everlasting desire to make composite materials stronger, lighter or more durable than traditional materials. Carbon materials are known to be attractive in composites because of their combination of chemical and physical properties. In the recent years, development of new composites has been influenced by precision green approaches that restrict hazardous substances and waste created during production. This book ranges from the fundamental principles underpinning the fabrication of different composite materials to their devices, for example, applications in energy harvesting, memory devices, electrochemical biosensing and other advanced composite-based biomedical applications. This book provides a compilation of innovative fabrication strategies and utilization methodologies which are frequently adopted in the advanced composite materials community with respect to developing appropriate composites to efficiently utilize macro and nanoscale features. The key topics are: Pioneer composite materials for printed electronics Current-limiting defects in superconductors High-tech ceramics materials Carbon nanomaterials for electrochemical biosensing Nanostructured ceramics and bioceramics for bone cancer Importance of biomaterials for bone regeneration Tuning hydroxyapatite particles Carbon nanotubes reinforced bioceramic composite Biomimetic prototype interface
Author :Microscopy Society of America Publisher :Cambridge University Press ISBN 13 :9780521824057 Total Pages :556 pages Book Rating :4.8/5 (24 download)
Book Synopsis Proceedings: Microscopy and Microanalysis 2002: Volume 8 by : Microscopy Society of America
Download or read book Proceedings: Microscopy and Microanalysis 2002: Volume 8 written by Microscopy Society of America and published by Cambridge University Press. This book was released on 2002-12-16 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Defects in Microelectronic Materials and Devices by : Daniel M. Fleetwood
Download or read book Defects in Microelectronic Materials and Devices written by Daniel M. Fleetwood and published by CRC Press. This book was released on 2008-11-19 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch
Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 137 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Book Synopsis Characterisation of Radiation Damage by Transmission Electron Microscopy by : M.L Jenkins
Download or read book Characterisation of Radiation Damage by Transmission Electron Microscopy written by M.L Jenkins and published by CRC Press. This book was released on 2000-11-21 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.
Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1994 with total page 1162 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Directory of Federal Laboratory and Technology Resources by :
Download or read book Directory of Federal Laboratory and Technology Resources written by and published by DIANE Publishing. This book was released on 1994 with total page 727 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes the individual capabilities of each of 1,900 unique resources in the federal laboratory system, and provides the name and phone number of each contact. Includes government laboratories, research centers, testing facilities, and special technology information centers. Also includes a list of all federal laboratory technology transfer offices. Organized into 72 subject areas. Detailed indices.
Book Synopsis Directory of Federal Laboratory & Technology Resources by :
Download or read book Directory of Federal Laboratory & Technology Resources written by and published by . This book was released on 1993 with total page 778 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Transmission Electron Microscopy by : Alina Bruma
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Book Synopsis Research and Technology Program Digest Flash Index by :
Download or read book Research and Technology Program Digest Flash Index written by and published by . This book was released on 1967 with total page 794 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Review by : Oak Ridge National Laboratory
Download or read book Review written by Oak Ridge National Laboratory and published by . This book was released on 1981 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron Microscopy and Analysis 1999 by : C. J. Kiely
Download or read book Electron Microscopy and Analysis 1999 written by C. J. Kiely and published by CRC Press. This book was released on 1999-12-01 with total page 1320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis 1999 provides an overview of recent developments and outlines opportunities for future research in electron microscopy. The book presents the wide-ranging applications of these techniques in materials science, metallurgy, and surface science. It is an authoritative reference for academics and researchers working in materials science, instrumentation, electron optics, and condensed matter physics.
Book Synopsis OAR Cumulative Index of Research Results by :
Download or read book OAR Cumulative Index of Research Results written by and published by . This book was released on 1967 with total page 1264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron Microscopy and Analysis 2001 by : M. Aindow
Download or read book Electron Microscopy and Analysis 2001 written by M. Aindow and published by CRC Press. This book was released on 2001-12-01 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
