Application Of Near Field Optics To Semiconductor Materials Characterization

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Near Field Optics

Author : D.W. Pohl
Publisher : Springer Science & Business Media
ISBN 13 : 9401119783
Total Pages : 426 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Near Field Optics by : D.W. Pohl

Download or read book Near Field Optics written by D.W. Pohl and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning near-field optical microscopy (SNOM, also known as NSOM) is a new local probe technique with a resolving power of 10--50 nm. Not being limited by diffraction, near-field optics (NFO) opens new perspectives for optical characterization and the understanding of optical phenomena, in particular in biology, microelectronics and materials science. SNOM, after first demonstrations in '83/'84, has undergone a rapid development in the past two to four years. The increased interest has been largely stimulated by the wealth of optical properties that can be investigated and the growing importance of characterization on the nanometer scale in general. Examples include the use of fluorescence, birefrigence and plasmon effects for applications in particular in biology, microelectronics and materials science, to name just a few. This volume emerged from the first international meeting devoted exclusively to NFO, and comprises a complete survey of the 1992 activities in the field, in particular the variety of instrumental techniques that are currently being explored, the demonstration of the imaging capabilities as well as theoretical interpretations - a highly nontrivial task. The comprehensive collection of papers devoted to these and related subjects make the book a valuable tool for anybody interested in near-field optics.

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Microprobe Characterization of Optoelectronic Materials

Author : Juan Jimenez
Publisher : CRC Press
ISBN 13 : 1040283829
Total Pages : 731 pages
Book Rating : 4.0/5 (42 download)

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Book Synopsis Microprobe Characterization of Optoelectronic Materials by : Juan Jimenez

Download or read book Microprobe Characterization of Optoelectronic Materials written by Juan Jimenez and published by CRC Press. This book was released on 2024-11-01 with total page 731 pages. Available in PDF, EPUB and Kindle. Book excerpt: Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

Optical Characterization of Semiconductors

Author : Sidney Perkowitz
Publisher : Elsevier
ISBN 13 : 0080984274
Total Pages : 229 pages
Book Rating : 4.0/5 (89 download)

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Book Synopsis Optical Characterization of Semiconductors by : Sidney Perkowitz

Download or read book Optical Characterization of Semiconductors written by Sidney Perkowitz and published by Elsevier. This book was released on 2012-12-02 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.Discusses and compares infrared, Raman, and photoluminescence methodsEnables readers to choose the best method for a given problemIllustrates applications to help non-experts and industrial users, with answers to selected common problemsPresents fundamentals with examples from the semiconductor literature without excessive abstract discussionFeatures equipment lists and discussion of techniques to help establish characterization laboratories

Nano-optics and Near-field Optical Microscopy

Author : Anatoly V. Zayats
Publisher : Artech House
ISBN 13 : 1596932848
Total Pages : 379 pages
Book Rating : 4.5/5 (969 download)

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Book Synopsis Nano-optics and Near-field Optical Microscopy by : Anatoly V. Zayats

Download or read book Nano-optics and Near-field Optical Microscopy written by Anatoly V. Zayats and published by Artech House. This book was released on 2009 with total page 379 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.

Microelectronic Failure Analysis

Author :
Publisher : ASM International
ISBN 13 : 0871707691
Total Pages : 160 pages
Book Rating : 4.8/5 (717 download)

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Book Synopsis Microelectronic Failure Analysis by :

Download or read book Microelectronic Failure Analysis written by and published by ASM International. This book was released on 2002-01-01 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee

Optical Techniques for Solid-State Materials Characterization

Author : Rohit P. Prasankumar
Publisher : CRC Press
ISBN 13 : 1439814376
Total Pages : 735 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Optical Techniques for Solid-State Materials Characterization by : Rohit P. Prasankumar

Download or read book Optical Techniques for Solid-State Materials Characterization written by Rohit P. Prasankumar and published by CRC Press. This book was released on 2016-04-19 with total page 735 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides

Near Field Optics and Nanoscopy

Author : J. P. Fillard
Publisher : World Scientific
ISBN 13 : 9789810223496
Total Pages : 470 pages
Book Rating : 4.2/5 (234 download)

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Book Synopsis Near Field Optics and Nanoscopy by : J. P. Fillard

Download or read book Near Field Optics and Nanoscopy written by J. P. Fillard and published by World Scientific. This book was released on 1996 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the most recent information on optical nanoscopy. Far-Field and Near-Field properties on e.m. waves are presented which illustrate how optical images can be obtained from sub-micron objects. Scanning Probe techniques and computer processing are covered here. An explanation is given on how propagating photons or evanescent waves can behave over distances shorter than the wavelength, taking into account the presence of small objects. Quantum tunneling of photons is explained comparatively with the electron mechanism. Technical details are given on photon tunneling microscopes. Typical results already obtained with these techniques are also described.

University of Michigan Official Publication

Author : University of Michigan
Publisher : UM Libraries
ISBN 13 :
Total Pages : 212 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis University of Michigan Official Publication by : University of Michigan

Download or read book University of Michigan Official Publication written by University of Michigan and published by UM Libraries. This book was released on 1999 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Each number is the catalogue of a specific school or college of the University.

II-VI Semiconductor Materials and their Applications

Author : MariaC. Tamargo
Publisher : Routledge
ISBN 13 : 1351439375
Total Pages : 240 pages
Book Rating : 4.3/5 (514 download)

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Book Synopsis II-VI Semiconductor Materials and their Applications by : MariaC. Tamargo

Download or read book II-VI Semiconductor Materials and their Applications written by MariaC. Tamargo and published by Routledge. This book was released on 2018-05-04 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: II-VI Semiconductor Materials and Their Applications deals with II-VI compound semiconductors and the status of the two areas of current optoelectronics applications: blue-green emitters and IR detectors. Specifically, the growth, charactrtization, materials and device issues for these two applications are described. Emphasis is placed on the wide bandgap emitters where much progress has occurred recently.The book also presents new directions that have potential, future applications in optoelectronics for II-VI materials. In particular, it discusses the status of dilute magnetic semiconductors for mango-optical and electromagnetic devices, nonlinear optical properties, photorefractive effects and new materials and physics phenomena, such as self-organized, low-dimensional structures.II_VI Semiconductor Materials and Their Applications is a valuable reference book for researchers in the field as well as a textbook for materials science and applied physics courses.

Microelectronic Failure Analysis Desk Reference

Author :
Publisher : ASM International
ISBN 13 : 0871707454
Total Pages : 162 pages
Book Rating : 4.8/5 (717 download)

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Book Synopsis Microelectronic Failure Analysis Desk Reference by :

Download or read book Microelectronic Failure Analysis Desk Reference written by and published by ASM International. This book was released on 2001-01-01 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Semiconductor Materials

Author : B.G. Yacobi
Publisher : Springer Science & Business Media
ISBN 13 : 0306479427
Total Pages : 233 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Semiconductor Materials by : B.G. Yacobi

Download or read book Semiconductor Materials written by B.G. Yacobi and published by Springer Science & Business Media. This book was released on 2006-04-18 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: The technological progress is closely related to the developments of various materials and tools made of those materials. Even the different ages have been defined in relation to the materials used. Some of the major attributes of the present-day age (i.e., the electronic materials’ age) are such common tools as computers and fiber-optic telecommunication systems, in which semiconductor materials provide vital components for various mic- electronic and optoelectronic devices in applications such as computing, memory storage, and communication. The field of semiconductors encompasses a variety of disciplines. This book is not intended to provide a comprehensive description of a wide range of semiconductor properties or of a continually increasing number of the semiconductor device applications. Rather, the main purpose of this book is to provide an introductory perspective on the basic principles of semiconductor materials and their applications that are described in a relatively concise format in a single volume. Thus, this book should especially be suitable as an introductory text for a single course on semiconductor materials that may be taken by both undergraduate and graduate engineering students. This book should also be useful, as a concise reference on semiconductor materials, for researchers working in a wide variety of fields in physical and engineering sciences.

Thirty-fourth International Symposium for Testing and Failure Analysis

Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030913
Total Pages : 551 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis Thirty-fourth International Symposium for Testing and Failure Analysis by : ASM International

Download or read book Thirty-fourth International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2008-01-01 with total page 551 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Dopants and Defects in Semiconductors

Author : Matthew D. McCluskey
Publisher : CRC Press
ISBN 13 : 1439831521
Total Pages : 392 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Dopants and Defects in Semiconductors by : Matthew D. McCluskey

Download or read book Dopants and Defects in Semiconductors written by Matthew D. McCluskey and published by CRC Press. This book was released on 2012-02-23 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dopants and Defects in Semiconductors covers the theory, experimentation, and identification of impurities, dopants, and intrinsic defects in semiconductors. The book fills a crucial gap between solid-state physics and more specialized course texts. The authors first present introductory concepts, including basic semiconductor theory, defect classifications, crystal growth, and doping. They then explain electrical, vibrational, optical, and thermal properties. Moving on to characterization approaches, the text concludes with chapters on the measurement of electrical properties, optical spectroscopy, particle-beam methods, and microscopy. By treating dopants and defects in semiconductors as a unified subject, this book helps define the field and prepares students for work in technologically important areas. It provides students with a solid foundation in both experimental methods and the theory of defects in semiconductors.

Auger Electron Spectroscopy

Author : John Wolstenholme
Publisher : Momentum Press
ISBN 13 : 160650682X
Total Pages : 217 pages
Book Rating : 4.6/5 (65 download)

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Book Synopsis Auger Electron Spectroscopy by : John Wolstenholme

Download or read book Auger Electron Spectroscopy written by John Wolstenholme and published by Momentum Press. This book was released on 2015-07-28 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the use of AES and SAM for the characterization of a wide range of technological materials. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.

Handbook of Microscopy for Nanotechnology

Author : Nan Yao
Publisher : Springer Science & Business Media
ISBN 13 : 1402080069
Total Pages : 745 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Handbook of Microscopy for Nanotechnology by : Nan Yao

Download or read book Handbook of Microscopy for Nanotechnology written by Nan Yao and published by Springer Science & Business Media. This book was released on 2006-07-12 with total page 745 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Encyclopedic Handbook of Integrated Optics

Author : Kenichi Iga
Publisher : CRC Press
ISBN 13 : 1420027816
Total Pages : 528 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Encyclopedic Handbook of Integrated Optics by : Kenichi Iga

Download or read book Encyclopedic Handbook of Integrated Optics written by Kenichi Iga and published by CRC Press. This book was released on 2018-10-03 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: As optical technologies move closer to the core of modern computer architecture, there arise many challenges in building optical capabilities from the network to the motherboard. Rapid advances in integrated optics technologies are making this a reality. However, no comprehensive, up-to-date reference is available to the technologies and principles underlying the field. The Encyclopedic Handbook of Integrated Optics fills this void, collecting the work of 53 leading experts into a compilation of the most important concepts, phenomena, technologies, and terms covering all related fields. This unique book consists of two types of entries: the first is a detailed, full-length description; the other, a concise overview of the topic. Additionally, the coverage can be divided into four broad areas: A survey of the basics of integrated optics, exploring theory, practical concerns, and the fundamentals behind optical devices Focused discussion on devices and components such as arrayed waveguide grating, various types of lasers, optical amplifiers, and optoelectronic devices In-depth examination of subsystems including MEMS, optical pickup, and planar lightwave circuits Finally, systems considerations such as multiplexing, demultiplexing, 3R circuits, transmission, and reception Offering a broad and complete treatment of the field, the Encyclopedic Handbook of Integrated Optics is the complete guide to the fundamentals, principles, and applications of integrated optics technology.