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ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (113 download)
Download or read book 22nd annual proceedings reliability physics 1984 : Las Vegas, Nevada, April 3, 4, 5, 1984 written by and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (327 download)
Download or read book Reliability Physics 1984 written by and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (932 download)
Download or read book 22nd Annual Proceedings of International Reliability Physics Symposium, 1984, Las Vegas, Nevada written by and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (658 download)
Download or read book Reliability Physics, 1984 written by and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 332 pages
Book Rating : 4.:/5 (318 download)
Download or read book Reliability Physics 1984 written by and published by . This book was released on 1984 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (45 download)
Download or read book Reliability Physics 1984 written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics ... written by and published by . This book was released on 1984 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
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ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (784 download)
Download or read book 22nd Annual Proceedings Reliability Physics 1984 written by and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metallization, GaAs device reliability, failure analysis, laser techniques, microanalytical techniques, failure prediction, failure detection, oxide breakdown, contact reliability, passivation, interconnect electromigration.
Author : Milton Ohring
Publisher : Academic Press
ISBN 13 : 0080575528
Total Pages : 759 pages
Book Rating : 4.0/5 (85 download)
Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author : Electrochemical Society. Dielectric Science and Technology Division
Publisher : The Electrochemical Society
ISBN 13 : 9781566770033
Total Pages : 346 pages
Book Rating : 4.7/5 (7 download)
Download or read book Proceedings of the Symposia on Reliability of Semiconductor Devices/interconnections and Dielectric Breakdown, and Laser Process for Microelectronic Applications written by Electrochemical Society. Dielectric Science and Technology Division and published by The Electrochemical Society. This book was released on 1992 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers in this volume are from the 180th ECS Meeting, held in held in Phoenix, Arizona, Fall 1991. This symposium addresses all aspects of reliability of semiconductor devices, multilevel interconnection and dielectric breakdown in VLSI and ULSI technologies. The symposium establishes reliability from design through manufacturing. The second part of the symposium addresses laser ablation/etching, laser planarization laser/UV. CVD of metal end dielectric films, laser/UV enhanced etching and deposition processesing liquid phase, and photomodification of surfaces.
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ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.:/5 (318 download)
Download or read book Reliability Physics 1986 written by and published by . This book was released on 1986 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : International Society for Hybrid Microelectronics
Publisher :
ISBN 13 :
Total Pages : 520 pages
Book Rating : 4.:/5 (318 download)
Download or read book Proceedings of the 1984 International Symposium on Microelectronics written by International Society for Hybrid Microelectronics and published by . This book was released on 1984 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Hazara S. Rathore
Publisher : The Electrochemical Society
ISBN 13 : 9781566770972
Total Pages : 258 pages
Book Rating : 4.7/5 (79 download)
Download or read book Proceedings of the Symposium on Reliability of Metals in Electronics written by Hazara S. Rathore and published by The Electrochemical Society. This book was released on 1995 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Vikram J. Kapoor
Publisher :
ISBN 13 :
Total Pages : 570 pages
Book Rating : 4.0/5 ( download)
Download or read book Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films written by Vikram J. Kapoor and published by . This book was released on 1987 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : R.R. Tummala
Publisher : Springer Science & Business Media
ISBN 13 : 1461560373
Total Pages : 1060 pages
Book Rating : 4.4/5 (615 download)
Download or read book Microelectronics Packaging Handbook written by R.R. Tummala and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 1060 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electronics has become the largest industry, surpassing agriculture, auto, and heavy metal industries. It has become the industry of choice for a country to prosper, already having given rise to the phenomenal prosperity of Japan, Korea, Singapore, Hong Kong, and Ireland among others. At the current growth rate, total worldwide semiconductor sales will reach $300B by the year 2000. The key electronic technologies responsible for the growth of the industry include semiconductors, the packaging of semiconductors for systems use in auto, telecom, computer, consumer, aerospace, and medical industries, displays, magnetic, and optical storage as well as software and system technologies. There has been a paradigm shift, however, in these technologies, from mainframe and supercomputer applications at any cost, to consumer applications at approximately one-tenth the cost and size. Personal computers are a good example, going from $500IMIP when products were first introduced in 1981, to a projected $IIMIP within 10 years. Thin, light portable, user friendly and very low-cost are, therefore, the attributes of tomorrow's computing and communications systems. Electronic packaging is defined as interconnection, powering, cool ing, and protecting semiconductor chips for reliable systems. It is a key enabling technology achieving the requirements for reducing the size and cost at the system and product level.
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ISBN 13 :
Total Pages : 594 pages
Book Rating : 4.0/5 ( download)
Download or read book Conference Proceedings written by and published by . This book was released on 1989 with total page 594 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 268 pages
Book Rating : 4.:/5 (318 download)
Download or read book Reliability Physics 1985 written by and published by . This book was released on 1985 with total page 268 pages. Available in PDF, EPUB and Kindle. Book excerpt:
