1999 IEEE International Reliability Physics Symposium Proceedings

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ISBN 13 : 9780780352216
Total Pages : 448 pages
Book Rating : 4.3/5 (522 download)

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Book Synopsis 1999 IEEE International Reliability Physics Symposium Proceedings by : International Reliability Physics Symposium

Download or read book 1999 IEEE International Reliability Physics Symposium Proceedings written by International Reliability Physics Symposium and published by . This book was released on 1999 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt:

IEEE International Reliability Physics Symposium, 1999

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (131 download)

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Book Synopsis IEEE International Reliability Physics Symposium, 1999 by : IEEE, Electron Devices Society and Reliability Society Staff

Download or read book IEEE International Reliability Physics Symposium, 1999 written by IEEE, Electron Devices Society and Reliability Society Staff and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

1999 IEEE International Reliability Physics Symposium Proceedings

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)

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Download or read book 1999 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1999 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

1999 IEEE International Reliability Physics Symposium

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Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 464 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis 1999 IEEE International Reliability Physics Symposium by : IEEE Electron Devices Society

Download or read book 1999 IEEE International Reliability Physics Symposium written by IEEE Electron Devices Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt: This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.

Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (113 download)

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Reliability Physics and Engineering

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Publisher : Springer Science & Business Media
ISBN 13 : 1441963480
Total Pages : 324 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Reliability Physics and Engineering by : J. W. McPherson

Download or read book Reliability Physics and Engineering written by J. W. McPherson and published by Springer Science & Business Media. This book was released on 2010-08-05 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: All engineers could bene?t from at least one course in reliability physics and engineering. It is very likely that, starting with your very ?rst engineering po- tion, you will be asked — how long is your newly developed device expected to last? This text was designed to help you to answer this fundamentally important question. All materials and devices are expected to degrade with time, so it is very natural to ask — how long will the product last? The evidence for material/device degradation is apparently everywhere in nature. A fresh coating of paint on a house will eventually crack and peel. Doors in a new home can become stuck due to the shifting of the foundation. The new ?nish on an automobile will oxidize with time. The tight tolerances associated with ?nely meshed gears will deteriorate with time. Critical parameters associated with hi- precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakages, etc.) will degrade with time. In order to und- stand the lifetime of the material/device, it is important to understand the reliability physics (kinetics) for each of the potential failure mechanisms and then be able to develop the required reliability engineering methods that can be used to prevent, or at least minimize the occurrence of, device failure.

2000 IEEE International Reliability Physics Symposium

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Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780780358638
Total Pages : pages
Book Rating : 4.3/5 (586 download)

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Book Synopsis 2000 IEEE International Reliability Physics Symposium by : IEEE

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1997 IEEE International Reliability Physics Symposium Proceedings

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Publisher :
ISBN 13 :
Total Pages : 384 pages
Book Rating : 4.:/5 (15 download)

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Download or read book 1997 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1997 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Special Issue on the 2009 International Reliability Physics Symposium

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ISBN 13 :
Total Pages : 70 pages
Book Rating : 4.:/5 (698 download)

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Book Synopsis Special Issue on the 2009 International Reliability Physics Symposium by : International Reliability Physics Symposium. 47, 2009, Montréal

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1998 Ieee International Reliability Physics Symposium Proceedings (36th Annual)

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ISBN 13 :
Total Pages : 0 pages
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23rd International Reliability Physics Symposium

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ISBN 13 :
Total Pages : pages
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25th International Reliability Physics Symposium

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ISBN 13 :
Total Pages : pages
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Download or read book 25th International Reliability Physics Symposium written by and published by . This book was released on 1987 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

1997 IEEE International Reliability Physics Symposium Proceedings

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ISBN 13 : 9780780335769
Total Pages : 384 pages
Book Rating : 4.3/5 (357 download)

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Download or read book 1997 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1997 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: These papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported.

Comprehensive Nanoscience and Nanotechnology

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Publisher : Academic Press
ISBN 13 : 012812296X
Total Pages : 1881 pages
Book Rating : 4.1/5 (281 download)

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Download or read book Comprehensive Nanoscience and Nanotechnology written by and published by Academic Press. This book was released on 2019-01-02 with total page 1881 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive Nanoscience and Technology, Second Edition, Five Volume Set allows researchers to navigate a very diverse, interdisciplinary and rapidly-changing field with up-to-date, comprehensive and authoritative coverage of every aspect of modern nanoscience and nanotechnology. Presents new chapters on the latest developments in the field Covers topics not discussed to this degree of detail in other works, such as biological devices and applications of nanotechnology Compiled and written by top international authorities in the field

21st International Reliability Physics Symposium

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (972 download)

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Download or read book 21st International Reliability Physics Symposium written by and published by . This book was released on 1983 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis

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Publisher : ASM International
ISBN 13 : 1627082735
Total Pages : 540 pages
Book Rating : 4.6/5 (27 download)

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Book Synopsis ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis by :

Download or read book ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2019-12-01 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Dependable Multicore Architectures at Nanoscale

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Publisher : Springer
ISBN 13 : 3319544225
Total Pages : 294 pages
Book Rating : 4.3/5 (195 download)

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Book Synopsis Dependable Multicore Architectures at Nanoscale by : Marco Ottavi

Download or read book Dependable Multicore Architectures at Nanoscale written by Marco Ottavi and published by Springer. This book was released on 2017-08-28 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.