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Z Contrast Scanning Transmission Electron Microscopy Of Nanometer Scale Coated Particulate Materials
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Book Synopsis Z-contrast Scanning Transmission Electron Microscopy of Nanometer-scale Coated Particulate Materials by :
Download or read book Z-contrast Scanning Transmission Electron Microscopy of Nanometer-scale Coated Particulate Materials written by and published by . This book was released on 1998 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: Particulate materials with unique functional properties have been the focus of much attention in recent years. Of particular interest, due to their considerable scientific and technological importance, are particles coated with nanoparticles. These have greatly stimulated interest for their novel structure and properties. In these kinds of particulate materials, the interface structures between the support particle and the nanoparticle play a crucial role in controlling their properties. Consequently, imaging of the atomic structures at the interfaces can provide deep understanding of the relationship between the particulate and the corresponding properties. Z-contrast scanning transmission electron microscope (STEM) provides a new view of materials on the atomic scale, a direct image of atomic structure composition which can be interpreted without the need for any preconceived model structure. Therefore it is a powerful tool in the study of particulate materials. In this report, the authors present the structures of 18 micron diameter alumina particles coated with Ag nanoparticles. Particulates were prepared by a laser ablation technique, which involves laser ablation of the target material (Ag) onto a fluidized bed of core particles (alumina). The core alumina particles were fluidized inside the deposition system using a mechanical vibration method. For the STEM analysis, the particulates were lightly crushed in water using a pestle and mortar, then diluted in ethanol and deposited on a TEM grid coated with an amorphous carbon thin film.
Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby
Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.
Book Synopsis Scanning Microscopy for Nanotechnology by : Weilie Zhou
Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Book Synopsis Transmission Electron Microscopy of Nanomaterials by : Mohammad Jafari Eskandari
Download or read book Transmission Electron Microscopy of Nanomaterials written by Mohammad Jafari Eskandari and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Structural and analytical characterization, in the nanometer scale, has become very important for all types of materials in recent years. Transmission electron microscope (TEM) is a perfect instrument for this purpose, which is summarized in this chapter. Parameters such as particle size, grain size, lattice type, morphological information, crystallographic details, chemical composition, phase-type, and distribution can be obtained by transmission electron micrographs. Electron diffraction patterns of nanomaterials are also used to acquire quantitative information containing size, phase identification, orientation relationship and crystal defects in the lattice structure, etc. In this chapter, typical electron diffraction, high-resolution transmission and scanning transmission electron microscope imaging in materials research, especially in the study of nanoscience are presented.
Book Synopsis Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis by : Nobuo Tanaka
Download or read book Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis written by Nobuo Tanaka and published by World Scientific. This book was released on 2014-08-21 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Book Synopsis Nanometrology Using the Transmission Electron Microscope by : Vlad Stolojan
Download or read book Nanometrology Using the Transmission Electron Microscope written by Vlad Stolojan and published by Morgan & Claypool Publishers. This book was released on 2015-10-12 with total page 69 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Book Synopsis Transmission Electron Microscopy Characterization of Nanomaterials by : Challa S.S.R. Kumar
Download or read book Transmission Electron Microscopy Characterization of Nanomaterials written by Challa S.S.R. Kumar and published by Springer Science & Business Media. This book was released on 2013-12-09 with total page 718 pages. Available in PDF, EPUB and Kindle. Book excerpt: Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Book Synopsis Scanning Transmission Electron Microscopy by : Alina Bruma
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Book Synopsis Atomic-scale Characterization of Embedded and Supported Nanostructures by Scanning Transmission Electron Microscopy by : Volkan Ortalan
Download or read book Atomic-scale Characterization of Embedded and Supported Nanostructures by Scanning Transmission Electron Microscopy written by Volkan Ortalan and published by . This book was released on 2010 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Progress in Nanoscale Characterization and Manipulation by : Rongming Wang
Download or read book Progress in Nanoscale Characterization and Manipulation written by Rongming Wang and published by Springer. This book was released on 2018-08-30 with total page 511 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Book Synopsis Quantitative Scanning Transmission Electron Microscopy of Electronic and Nanostructured Materials by :
Download or read book Quantitative Scanning Transmission Electron Microscopy of Electronic and Nanostructured Materials written by and published by . This book was released on 2015 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electronic and nanostructured materials have been investigated using advanced scanning transmission electron microscopy (STEM) techniques. The first topic is the microstructure of Ga and Sb-doped ZnO. Ga-doped ZnO is a candidate transparent conducting oxide material. The microstructure of GZO thin films grown by MBE under different growth conditions and different substrates were examined using various electron microscopy (EM) techniques. The microstructure, prevalent defects, and polarity in these films strongly depend on the growth conditions and substrate. Sb-doped ZnO nanowires have been shown to be the first route to stable p-type ZnO. Using Z-contrast STEM, I have showed that an unusual microstructure of Sb-decorated head-to-head inversion domain boundaries and internal voids contain all the Sb in the nanowires and cause the p-type conduction. InGaN thin films and InGaN / GaN quantum wells (QW) for light emitting diodes are the second topic. Low-dose Z-contrast STEM, PACBED, and EDS on InGaN QW LED structures grown by MOCVD show no evidence for nanoscale composition variations, contradicting previous reports. In addition, a new extended defect in GaN and InGaN was discovered. The defect consists of a faceted pyramid-shaped void that produces a threading dislocation along the [0001] growth direction, and is likely caused by carbon contamination during growth. Non-rigid registration (NRR) and high-precision STEM of nanoparticles is the final topic. NRR is a new image processing technique that corrects distortions arising from the serial nature of STEM acquisition that previously limited the precision of locating atomic columns and counting the number of atoms in images. NRR was used to demonstrate sub-picometer precision in STEM images of single crystal Si and GaN, the best achieved in EM. NRR was used to measure the atomic surface structure of Pt nanoacatalysts and Au nanoparticles, which revealed new bond length variation phenomenon of surface atoms. In adition, NRR allowed for measuring the 3D atomic structure of the nanoparticles with less than 1 atom uncertainty, a long-standing problem in EM. Finally, NRR was adapted to EDS spectrum images, significantly enhancing the signal to noise ratio and resolution of an EDS spectrum image of Ca-doped NdTiO3 compared to conventional methods.
Book Synopsis Direct Imaging of the Atomic Structure and Chemistry of Defects and Interfaces by Z-contrast STEM (scanning Transmission Electron Microscopy). by :
Download or read book Direct Imaging of the Atomic Structure and Chemistry of Defects and Interfaces by Z-contrast STEM (scanning Transmission Electron Microscopy). written by and published by . This book was released on 1990 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: Z-contrast scanning transmission electron microscopy (STEM) is a fundamentally new approach to high-resolution imaging which provides unambiguous, compositionally sensitive images on the atomic scale. Such images are intuitively interpretable, even in thick regions of the sample, tremendously simplifying determination of the structure and chemistry of defects and interfaces. To illustrate this, examples are presented of commonly observed planar defects in laser-ablated thin films of YBa2Cu3O{sub 7-x}. Film/substrate interfaces are shown to be chemically diffuse on the atomic scale and steps or undulations in the substrate need not result in defects in the film. Low-angle grain boundaries are found to be chemically clean, the drastic reductions in critical currents with tilt angle being due to the array of intrinsic structural defects comprising the boundary. 20 refs., 10 figs.
Author :Roland Wiesendanger Publisher :Springer Science & Business Media ISBN 13 :9783540638155 Total Pages :238 pages Book Rating :4.6/5 (381 download)
Book Synopsis Scanning Probe Microscopy by : Roland Wiesendanger
Download or read book Scanning Probe Microscopy written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 1998-04-16 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Book Synopsis Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals by : Jie Feng
Download or read book Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals written by Jie Feng and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-dimensional characterization of defects is an essential step in the engineering of point defects to control the type, concentration, and spatial distribution of defects with nanometer-scale resolution to design materials with new functions and properties. High-resolution electron microscopy is becoming a general-purpose tool for characterizing several point defects with single-defect sensitivity and sub-unit cell spatial resolution in all three dimensions. Detectable defects include substitutional impurities, interstitial impurities, self-interstitials, and impurity-containing defect complexes. However, all the defects so far imaged at the single-defect level often increase the local electron scattering by 50% or more, and 3D imaging of defects that change column intensity less than 10%, such as single vacancies was only reported very recently. In the first part of this thesis, we demonstrated an approach for three-dimensional imaging of single vacancies using high precision quantitative high-angle annular dark-field Z-contrast scanning transmission electron microscopy. Vacancies are identified by both the reduction in scattered intensity created by the missing atom and the distortion of the surrounding atom positions. Vacancy positions are determined laterally to a unique lattice site in the image and in depth to within one of two lattice sites by dynamical diffraction effects. 35 single La vacancies are identified in images of a LaMnO3 thin film sample. The vacancies are randomly distributed in depth and correspond to a La vacancy concentration of 0.79%, which is consistent with the level of control of cation stoichiometry within our synthesis process (~1%) and with the equilibrium concentration of La vacancies under the film growth conditions. This method can be extended to detect other defects including impurities and defect clusters and these results represent a step forward in characterizing point defects in materials one at a time, at atomic resolution, matching our current capabilities in materials simulation and our growing control over defect distributions in synthesis. In the second parts of this thesis, I adapted the cut-edge Poisson denoising and machine learning algorithm into the four-dimensional STEM, which could potentially detect point defects that are undetectable by traditional STEM. We demonstrate that the iterative BM4D Poisson denoising algorithm could recover most of the image features corrupted by Poisson noise and increase the PSNR most. We also demonstrate that the convolutional neural network (VGG-16), trained on simulated PACBED data set, could accurately predict TEM sample thickness with> 99% accuracy within 100 nm with 2 nm thickness step.
Book Synopsis Liquid Cell Electron Microscopy by : Frances M. Ross
Download or read book Liquid Cell Electron Microscopy written by Frances M. Ross and published by Cambridge University Press. This book was released on 2017 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2.6.2 Electrodes for Electrochemistry
Book Synopsis Characterisation of Radiation Damage by Transmission Electron Microscopy by : M.L Jenkins
Download or read book Characterisation of Radiation Damage by Transmission Electron Microscopy written by M.L Jenkins and published by CRC Press. This book was released on 2000-11-21 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Book Synopsis Transmission Electron Microscopy by : Ludwig Reimer
Download or read book Transmission Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
