Thin Film And Depth Profile Analysis

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Thin Film and Depth Profile Analysis

Author : H. Oechsner
Publisher : Springer Science & Business Media
ISBN 13 : 3642464998
Total Pages : 214 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis Thin Film and Depth Profile Analysis by : H. Oechsner

Download or read book Thin Film and Depth Profile Analysis written by H. Oechsner and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.

Thin Film and Depth Profile Analysis

Author : H. W. Etzkorn
Publisher : Springer
ISBN 13 :
Total Pages : 232 pages
Book Rating : 4.:/5 (34 download)

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Book Synopsis Thin Film and Depth Profile Analysis by : H. W. Etzkorn

Download or read book Thin Film and Depth Profile Analysis written by H. W. Etzkorn and published by Springer. This book was released on 1984-11 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by numerous experts

Thin Film Analysis by X-Ray Scattering

Author : Mario Birkholz
Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Thin Film Analysis by X-Ray Scattering by : Mario Birkholz

Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Author : Alvin W. Czanderna
Publisher : Springer Science & Business Media
ISBN 13 : 0306469146
Total Pages : 447 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis by : Alvin W. Czanderna

Download or read book Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis written by Alvin W. Czanderna and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 447 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Thin Film and Depth Profile Analysis

Author : H. Oechsner
Publisher :
ISBN 13 : 9783642465000
Total Pages : 224 pages
Book Rating : 4.4/5 (65 download)

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Book Synopsis Thin Film and Depth Profile Analysis by : H. Oechsner

Download or read book Thin Film and Depth Profile Analysis written by H. Oechsner and published by . This book was released on 1984-11-01 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Handbook of Thin Films

Author : Hari Singh Nalwa
Publisher : Elsevier
ISBN 13 : 0080533248
Total Pages : 3436 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Handbook of Thin Films by : Hari Singh Nalwa

Download or read book Handbook of Thin Films written by Hari Singh Nalwa and published by Elsevier. This book was released on 2001-11-17 with total page 3436 pages. Available in PDF, EPUB and Kindle. Book excerpt: This five-volume handbook focuses on processing techniques, characterization methods, and physical properties of thin films (thin layers of insulating, conducting, or semiconductor material). The editor has composed five separate, thematic volumes on thin films of metals, semimetals, glasses, ceramics, alloys, organics, diamonds, graphites, porous materials, noncrystalline solids, supramolecules, polymers, copolymers, biopolymers, composites, blends, activated carbons, intermetallics, chalcogenides, dyes, pigments, nanostructured materials, biomaterials, inorganic/polymer composites, organoceramics, metallocenes, disordered systems, liquid crystals, quasicrystals, and layered structures.Thin films is a field of the utmost importance in today's materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices.Advanced, high-performance computers, high-definition TV, digital camcorders, sensitive broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are but a few examples of miniaturized device technologies that depend the utilization of thin film materials. The Handbook of Thin Films Materials is a comprehensive reference focusing on processing techniques, characterization methods, and physical properties of these thin film materials.

Diffusive Gradients in Thin-Films for Environmental Measurements

Author : William Davison
Publisher : Cambridge University Press
ISBN 13 : 110713076X
Total Pages : 321 pages
Book Rating : 4.1/5 (71 download)

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Book Synopsis Diffusive Gradients in Thin-Films for Environmental Measurements by : William Davison

Download or read book Diffusive Gradients in Thin-Films for Environmental Measurements written by William Davison and published by Cambridge University Press. This book was released on 2016-09-15 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: An essential guide to the applications and usage of the diffusive gradients in thin-films (DGT) technique for students and professionals.

X-ray Scattering

Author : Alicia Esther Ares
Publisher : BoD – Books on Demand
ISBN 13 : 9535128876
Total Pages : 230 pages
Book Rating : 4.5/5 (351 download)

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Book Synopsis X-ray Scattering by : Alicia Esther Ares

Download or read book X-ray Scattering written by Alicia Esther Ares and published by BoD – Books on Demand. This book was released on 2017-01-25 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.

Handbook of Semiconductor Manufacturing Technology

Author : Yoshio Nishi
Publisher : CRC Press
ISBN 13 : 1420017667
Total Pages : 1720 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Handbook of Semiconductor Manufacturing Technology by : Yoshio Nishi

Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2017-12-19 with total page 1720 pages. Available in PDF, EPUB and Kindle. Book excerpt: Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.

Mass Spectrometry Handbook

Author : Mike S. Lee
Publisher : John Wiley & Sons
ISBN 13 : 1118180720
Total Pages : 1362 pages
Book Rating : 4.1/5 (181 download)

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Book Synopsis Mass Spectrometry Handbook by : Mike S. Lee

Download or read book Mass Spectrometry Handbook written by Mike S. Lee and published by John Wiley & Sons. This book was released on 2012-04-16 with total page 1362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.

Materials Science of Thin Films

Author : Milton Ohring
Publisher : Academic Press
ISBN 13 : 0125249756
Total Pages : 817 pages
Book Rating : 4.1/5 (252 download)

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Book Synopsis Materials Science of Thin Films by : Milton Ohring

Download or read book Materials Science of Thin Films written by Milton Ohring and published by Academic Press. This book was released on 2002 with total page 817 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book that can be considered a textbook on thin film science, complete with exercises at the end of each chapter. Ohring has contributed many highly regarded reference books to the AP list, including Reliability and Failure of Electronic Materials and the Engineering Science of Thin Films. The knowledge base is intended for science and engineering students in advanced undergraduate or first-year graduate level courses on thin films and scientists and engineers who are entering or require an overview of the field. Since 1992, when the book was first published, the field of thin films has expanded tremendously, especially with regard to technological applications. The second edition will bring the book up-to-date with regard to these advances. Most chapters have been greatly updated, and several new chapters have been added.

Glow Discharge Plasmas in Analytical Spectroscopy

Author : R. Kenneth Marcus
Publisher : John Wiley & Sons
ISBN 13 : 0470857862
Total Pages : 498 pages
Book Rating : 4.4/5 (78 download)

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Book Synopsis Glow Discharge Plasmas in Analytical Spectroscopy by : R. Kenneth Marcus

Download or read book Glow Discharge Plasmas in Analytical Spectroscopy written by R. Kenneth Marcus and published by John Wiley & Sons. This book was released on 2003-05-27 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: This multi-author, edited volume includes chapters which deal with both basic and highly complex applications. Glow discharge devices are now being used in very novel ways for the analysis of liquids and gases, including molecular species detection and identification, an area that was beyond the perceived scope of applicability just ten years ago. It is expected that the next decade will see a growth in the interest and application of glow discharge devices far surpassing the expectations of the last century. Responding to the rapid growth in the field Includes both GD-MS and GD-AES In-depth coverage of applications Co-edited by the top names in the field in Europe and US, with high calibre contributions from around the world

The Materials Science of Thin Films

Author : Milton Ohring
Publisher : Academic Press
ISBN 13 : 9780125249904
Total Pages : 744 pages
Book Rating : 4.2/5 (499 download)

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Book Synopsis The Materials Science of Thin Films by : Milton Ohring

Download or read book The Materials Science of Thin Films written by Milton Ohring and published by Academic Press. This book was released on 1992 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt: Prepared as a textbook complete with problems after each chapter, specifically intended for classroom use in universities.

In Situ Real-Time Characterization of Thin Films

Author : Orlando Auciello
Publisher : John Wiley & Sons
ISBN 13 : 9780471241416
Total Pages : 282 pages
Book Rating : 4.2/5 (414 download)

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Book Synopsis In Situ Real-Time Characterization of Thin Films by : Orlando Auciello

Download or read book In Situ Real-Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application

Photoacoustic, Photothermal and Photochemical Processes at Surfaces and in Thin Films

Author : Peter Hess
Publisher : Springer Science & Business Media
ISBN 13 : 3642839452
Total Pages : 385 pages
Book Rating : 4.6/5 (428 download)

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Book Synopsis Photoacoustic, Photothermal and Photochemical Processes at Surfaces and in Thin Films by : Peter Hess

Download or read book Photoacoustic, Photothermal and Photochemical Processes at Surfaces and in Thin Films written by Peter Hess and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: Review articles by leading scientists in their fields are brought together in this volume to provide a comprehensive treatment of photoacoustic, photothermal and photochemical processes at surfaces and in thin films. The articles introduce the fields, review present knowledge and conclude with latest developments and future prospects. Topics covered include laser-induced desorption, ablation and surface damage; surface acoustic waves; photothermal and photoacoustic characterization of thin films and interfaces; depth profiling in the frequency and time domains; remote testing and nondestructive evaluation; materials characterization; and new theoretical approaches using fractals. The book will interest newcomers to photoacoustics, since it gives an overview of current research and details of experimental methods. It will also be a source of information for those already in the field due to its clear presentation of theory and experimental results. All relevant literature references in this rapidly expanding field are included.

ASM Metals Reference Book, 3rd Edition

Author : Michael Bauccio
Publisher : ASM International
ISBN 13 : 9780871704788
Total Pages : 628 pages
Book Rating : 4.7/5 (47 download)

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Book Synopsis ASM Metals Reference Book, 3rd Edition by : Michael Bauccio

Download or read book ASM Metals Reference Book, 3rd Edition written by Michael Bauccio and published by ASM International. This book was released on 1993-01-01 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference book makes it easy for anyone involved in materials selection, or in the design and manufacture of metallic structural components to quickly screen materials for a particular application. Information on practically all ferrous and nonferrous metals including powder metals is presented in tabular form for easy review and comparison between different materials. Included are chemical compositions, physical and mechanical properties, manufacturing processes, applications, pertinent specifications and standards, and test methods. Contents Overview: Glossary of metallurgical terms Selection of structural materials (specifications and standards, life cycle and failure modes, materials properties and design, and properties and applications) Physical data on the elements and alloys Testing and inspection Chemical composition and processing characteristics

Secondary Ion Mass Spectroscopy of Solid Surfaces

Author : V. T. Cherepin
Publisher : CRC Press
ISBN 13 : 1466563737
Total Pages : 150 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Secondary Ion Mass Spectroscopy of Solid Surfaces by : V. T. Cherepin

Download or read book Secondary Ion Mass Spectroscopy of Solid Surfaces written by V. T. Cherepin and published by CRC Press. This book was released on 2020-04-28 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.