The Imaging Of Structures And Structure Defects By High Resolution Electron Microscopy And Computer Simulation

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High-Resolution Electron Microscopy for Materials Science

Author : Daisuke Shindo
Publisher : Springer Science & Business Media
ISBN 13 : 4431684220
Total Pages : 196 pages
Book Rating : 4.4/5 (316 download)

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Book Synopsis High-Resolution Electron Microscopy for Materials Science by : Daisuke Shindo

Download or read book High-Resolution Electron Microscopy for Materials Science written by Daisuke Shindo and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

Author : A.G. Cullis
Publisher : CRC Press
ISBN 13 : 1000157016
Total Pages : 836 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 by : A.G. Cullis

Download or read book Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 written by A.G. Cullis and published by CRC Press. This book was released on 2021-02-01 with total page 836 pages. Available in PDF, EPUB and Kindle. Book excerpt: The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.

Research in Progress

Author :
Publisher :
ISBN 13 :
Total Pages : 834 pages
Book Rating : 4.:/5 (334 download)

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Book Synopsis Research in Progress by :

Download or read book Research in Progress written by and published by . This book was released on 1978 with total page 834 pages. Available in PDF, EPUB and Kindle. Book excerpt:

High-Resolution Transmission Electron Microscopy

Author : Peter Buseck
Publisher : Oxford University Press
ISBN 13 : 0195364651
Total Pages : 668 pages
Book Rating : 4.1/5 (953 download)

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Book Synopsis High-Resolution Transmission Electron Microscopy by : Peter Buseck

Download or read book High-Resolution Transmission Electron Microscopy written by Peter Buseck and published by Oxford University Press. This book was released on 1989-02-02 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.

Postdoctoral Research Associateships

Author :
Publisher :
ISBN 13 :
Total Pages : 212 pages
Book Rating : 4.3/5 ( download)

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Book Synopsis Postdoctoral Research Associateships by :

Download or read book Postdoctoral Research Associateships written by and published by . This book was released on 1984 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures

$Download Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures PDF Online Free$

Author : Victor A. Drits
Publisher : Springer Science & Business Media
ISBN 13 : 3642717292
Total Pages : 366 pages
Book Rating : 4.6/5 (427 download)

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Book Synopsis Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures by : Victor A. Drits

Download or read book Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures written by Victor A. Drits and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt: The decision of Springer-Verlag to publish this book in English came as a pleasant surprise. The fact is that I started writing the first version of the book back in 1978. I wished to attract attention to potentialities inherent in selected-area electron diffraction (SAED) which, for various reasons, were not being put to use. By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book. There were several aspects concerning these data that I wished to emphasize. First, it was mostly new and understudied minerals that possess the peculiar structural features studied by SAED and HREM. This could interest mineralogists, crystallo chemists, and crystallographers. Second, the results obtained indi cated that, under certain conditions, SAED could be an effective, and sometimes the only possible, method for structure analysis of minerals. This inference was of primary importance, since fine dispersion and poor crystallinity of numerous natural and synthe tic minerals makes their structure study by conventional diffrac tion methods hardly possible. Third, it was demonstrated that in many cases X-ray powder diffraction analysis of dispersed miner als ought to be combined with SAED and local energy dispersion analysis. This was important, since researchers in structural min eralogy quite often ignored, and still ignore even the simplest in formation which is readily available from geometrical analysis of SAED patterns obtained from microcrystals.

Transactions of the Japan Institute of Metals

Author : Nihon Kinzoku Gakkai
Publisher :
ISBN 13 :
Total Pages : 1256 pages
Book Rating : 4.:/5 (8 download)

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Book Synopsis Transactions of the Japan Institute of Metals by : Nihon Kinzoku Gakkai

Download or read book Transactions of the Japan Institute of Metals written by Nihon Kinzoku Gakkai and published by . This book was released on 1983 with total page 1256 pages. Available in PDF, EPUB and Kindle. Book excerpt:

High Dielectric Constant Materials

Author : Howard Huff
Publisher : Springer Science & Business Media
ISBN 13 : 3540264620
Total Pages : 723 pages
Book Rating : 4.5/5 (42 download)

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Book Synopsis High Dielectric Constant Materials by : Howard Huff

Download or read book High Dielectric Constant Materials written by Howard Huff and published by Springer Science & Business Media. This book was released on 2005-11-02 with total page 723 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). More than just an historical overview, this book will assess previous and present approaches related to scaling the gate dielectric and their impact, along with the creative directions and forthcoming challenges that will define the future of gate dielectric scaling technology.

Evaluation of Advanced Semiconductor Materials by Electron Microscopy

Author : David Cherns
Publisher : Springer Science & Business Media
ISBN 13 : 1461305276
Total Pages : 413 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Evaluation of Advanced Semiconductor Materials by Electron Microscopy by : David Cherns

Download or read book Evaluation of Advanced Semiconductor Materials by Electron Microscopy written by David Cherns and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 413 pages. Available in PDF, EPUB and Kindle. Book excerpt: The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the nanometer level, it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence on electrical and optical properties. Much of this information is being obtained by electron microscopy and this is also an area of rapid progress. There have been advances for thin film studies across a wide range of techniques, including, for example, convergent beam electron diffraction, X-ray and electron energy loss microanalysis and high spatial resolution cathodoluminescence as well as by conventional and high resolution methods. Important develop ments have also occurred in the study of surfaces and film growth phenomena by both microscopy and diffraction techniques. With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors. This was subsequently accepted for the 1988 programme and became the "NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy". The Workshop took place in the pleasant and intimate surroundings of Wills Hall, Bristol, UK, during the week 11-17 September 1988 and was attended by fifty-five participants from fourteen countries.

Materials and Molecular Research Division Annual Report

Author : Lawrence Berkeley Laboratory. Materials and Molecular Research Division
Publisher :
ISBN 13 :
Total Pages : 340 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Materials and Molecular Research Division Annual Report by : Lawrence Berkeley Laboratory. Materials and Molecular Research Division

Download or read book Materials and Molecular Research Division Annual Report written by Lawrence Berkeley Laboratory. Materials and Molecular Research Division and published by . This book was released on 1986 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Energy Research Abstracts

Author :
Publisher :
ISBN 13 :
Total Pages : 762 pages
Book Rating : 4.:/5 (3 download)

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Book Synopsis Energy Research Abstracts by :

Download or read book Energy Research Abstracts written by and published by . This book was released on 1993 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiannual, with semiannual and annual indexes. References to all scientific and technical literature coming from DOE, its laboratories, energy centers, and contractors. Includes all works deriving from DOE, other related government-sponsored information, and foreign nonnuclear information. Arranged under 39 categories, e.g., Biomedical sciences, basic studies; Biomedical sciences, applied studies; Health and safety; and Fusion energy. Entry gives bibliographical information and abstract. Corporate, author, subject, report number indexes.

Proceedings: Microscopy and Microanalysis 2002: Volume 8

Author : Microscopy Society of America
Publisher : Cambridge University Press
ISBN 13 : 9780521824057
Total Pages : 556 pages
Book Rating : 4.8/5 (24 download)

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Book Synopsis Proceedings: Microscopy and Microanalysis 2002: Volume 8 by : Microscopy Society of America

Download or read book Proceedings: Microscopy and Microanalysis 2002: Volume 8 written by Microscopy Society of America and published by Cambridge University Press. This book was released on 2002-12-16 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.

High-Resolution Electron Microscopy

Author : John C. H. Spence
Publisher : OUP Oxford
ISBN 13 : 0191508403
Total Pages : 427 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis High-Resolution Electron Microscopy by : John C. H. Spence

Download or read book High-Resolution Electron Microscopy written by John C. H. Spence and published by OUP Oxford. This book was released on 2013-09-12 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.

Feldspar Minerals

Author : Joseph V. Smith
Publisher : Springer Science & Business Media
ISBN 13 : 3642725945
Total Pages : 884 pages
Book Rating : 4.6/5 (427 download)

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Book Synopsis Feldspar Minerals by : Joseph V. Smith

Download or read book Feldspar Minerals written by Joseph V. Smith and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 884 pages. Available in PDF, EPUB and Kindle. Book excerpt: Remarks by JVS. Volumes 1 and 2 of Feldspar Minerals were published in 1974, but Volume 3 was not completed because I was forced to devote 3 years to the resolution of unforeseen problems in the construction of an ion probe. By 1977, the incomplete draft for Volume 3 had become obsolete because of the enormous advances in knowledge of feldspars, particularly those in lunar rocks and meteorites, and in both deep-seated and ancient terrestrial rocks. Furthermore, it soon became obvious that a completely new version of Feldspar Minerals was needed because of the important new results on the physical and chemical properties. I had kept up with the interesting but tedious chore of weekly reading of the incoming literature and maintenance of the files. By 1980, the intense day-to day pressure had gone from my research programs on lunar rocks and on the development of the ion microprobe as a quantitative geochemical instrument, and I began preparation of a second edition of Feldspar Minerals.

Journal of Computer-assisted Microscopy

Author :
Publisher :
ISBN 13 :
Total Pages : 376 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Journal of Computer-assisted Microscopy by :

Download or read book Journal of Computer-assisted Microscopy written by and published by . This book was released on 1992 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

Author : F.W. Boswell
Publisher : Springer Science & Business Media
ISBN 13 : 9401146039
Total Pages : 268 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals by : F.W. Boswell

Download or read book Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals written by F.W. Boswell and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 268 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modulated crystals have been intensively investigated over the past several years and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together for the first time the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning Tunnelling Microscopy is a new technique providing significant new insights into atomic scale details of the modulations' structures and a chapter on this method is included.

C,H,N and O in Si and Characterization and Simulation of Materials and Processes

Author : A. Borghesi
Publisher : North Holland
ISBN 13 :
Total Pages : 624 pages
Book Rating : 4.0/5 ( download)

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Book Synopsis C,H,N and O in Si and Characterization and Simulation of Materials and Processes by : A. Borghesi

Download or read book C,H,N and O in Si and Characterization and Simulation of Materials and Processes written by A. Borghesi and published by North Holland. This book was released on 1996 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing over 200 papers, this volume contains the proceedings of two symposia in the E-MRS series. Part I presents a state of the art review of the topic - Carbon, Hydrogen, Nitrogen and Oxygen in Silicon and in Other Elemental Semiconductors. There was strong representation from the industrial laboratories, illustrating that the topic is highly relevant for the semiconductor industry.The second part of the volume deals with a topic which is undergoing a process of convergence with two concerns that are more particularly application oriented. Firstly, the advanced instrumentation which, through the use of atomic force and tunnel microscopies, high resolution electron microscopy and other high precision analysis instruments, now allows for direct access to atomic mechanisms. Secondly, the technological development which in all areas of applications, particularly in the field of microelectronics and microsystems, requires as a result of the miniaturisation race, a precise mastery of the microscopic mechanisms.