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The Error Latency Of A Fault In A Combinational Digital Circuit
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Book Synopsis Fault-Tolerant Computing Systems by : Mario Dal Cin
Download or read book Fault-Tolerant Computing Systems written by Mario Dal Cin and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: 5th International GI/ITG/GMA Conference, Nürnberg, September 25-27, 1991. Proceedings
Book Synopsis Random Testing of Digital Circuits by : Rene David
Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Download or read book Digest of Papers written by and published by . This book was released on 1975 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Computer Design Aids for VLSI Circuits by : P. Antognetti
Download or read book Computer Design Aids for VLSI Circuits written by P. Antognetti and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nato Advanced Study Institute on "Computer Design Aids for VLSI Circuits" was held from July 21 to August 1, 1980 at Sogesta, Urbino, Italy. Sixty-three carefully chosen profes sionals were invited to participate in this institute together with 12 lecturers and 7 assistants. The 63 participants were selected from a group of almost 140 applicants. Each had the background to learn effectively the set of computer IC design aids which were presented. Each also had individual expertise in at least one of the topics of the Institute. The Institute was designed to provide hands-on type of experience rather than consisting of solely lecture and discussion. Each morning, detailed presentations were made concerning the critical algorithms that are used in the various types of computer IC design aids. Each afternoon a lengthy period was used to provide the participants with direct access to the computer programs. In addition to using the programs, the individual could, if his expertise was sufficient, make modifications of and extensions to the programs, or establish limitations of these present aids. The interest in this hands-on activity was very high and many participants worked with the programs every free hour. The editors would like to thank the Direction of SOGESTA for the excellent facilities, ~1r. R. Riccioni of the SOGESTA Computer Center and Mr. 11. Vanzi of the University of Genova for enabling all the programs to run smoothly on the set date. P.Antognetti D.O.Pederson Urbino, Summer 1980.
Download or read book Proceedings written by and published by . This book was released on 1977 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Testing and Diagnosis of VLSI and ULSI by : F. Lombardi
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Book Synopsis Selected Reprints on Logic Design for Testability by : Constantin C. Timoc
Download or read book Selected Reprints on Logic Design for Testability written by Constantin C. Timoc and published by . This book was released on 1984 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book FTC-5 written by and published by . This book was released on 1975 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability Modeling, Analysis And Optimization by : Hoang Pham
Download or read book Reliability Modeling, Analysis And Optimization written by Hoang Pham and published by World Scientific. This book was released on 2006-06-26 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: As our modern information-age society grows in complexity both in terms of embedded systems and applications, the problems and challenges in reliability become ever more complex. Bringing together many of the leading experts in the field, this volume presents a broad picture of current research on system modeling and optimization in reliability and its applications.The book comprises twenty-three chapters organized into four parts: Reliability Modeling, Software Quality Engineering, Software Reliability, and Maintenance and Inspection Policies. These sections cover a wide range of important topics, including system reliability modeling, optimization, software reliability and quality, maintenance theory and inspection, reliability failure analysis, sampling plans and schemes, software development processes and improvement, stochastic process modeling, statistical distributions and analysis, fault-tolerant performance, software measurements and cost effectiveness, queueing theory and applications, system availability, reliability of repairable systems, testing sampling inspection, software capability maturity model, accelerated life modeling, statistical control, and HALT testing.
Download or read book Digest of Papers - Compcon written by and published by . This book was released on 1975 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book FTCS-7 written by and published by . This book was released on 1977 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis The Evolution of Fault-Tolerant Computing by : A. Avizienis
Download or read book The Evolution of Fault-Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Book Synopsis Computer Arithmetic by : Earl E Swartzlander
Download or read book Computer Arithmetic written by Earl E Swartzlander and published by World Scientific. This book was released on 2015-03-17 with total page 486 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the new edition of the classic book Computer Arithmetic in three volumes published originally in 1990 by IEEE Computer Society Press. As in the original, the book contains many classic papers treating advanced concepts in computer arithmetic, which is very suitable as stand-alone textbooks or complementary materials to textbooks on computer arithmetic for graduate students and research professionals interested in the field. Told in the words of the initial developers, this book conveys the excitement of the creators, and the implementations provide insight into the details necessary to realize real chips. This second volume presents topics on error tolerant arithmetic, digit on-line arithmetic, number systems, and now in this new edition, a topic on implementations of arithmetic operations, all wrapped with an updated overview and a new introduction for each chapter. This volume is part of a 3 volume set: Computer Arithmetic Volume I Computer Arithmetic Volume II Computer Arithmetic Volume III The full set is available for sale in a print-only version. Contents:Error Tolerant ArithmeticOn-Line ArithmeticVLSI Adder ImplementationsVLSI Multiplier ImplementationsFloating-Point VLSI ChipsNumber RepresentationImplementations Readership: Graduate students and research professionals interested in computer arithmetic. Key Features:It reprints the classic papersIt covers advanced arithmetic operationsIt does this in the words of the original creatorsKeywords:Computer Arithmetic;Fault Tolerant;Arithmetic;On-Line Arithmetic;Adder Implementations;Multiplier Implementations;Floating Point Chips;Number Representation;Implementations
Download or read book Built-in Test written by and published by . This book was released on 1983 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Computer Systems Reliability by : T. Anderson
Download or read book Computer Systems Reliability written by T. Anderson and published by CUP Archive. This book was released on 1979-07-31 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliable Computer Systems by : Daniel P. Siewiorek
Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1973 with total page 1064 pages. Available in PDF, EPUB and Kindle. Book excerpt:
