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Testing Semiconductor Memories
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Book Synopsis Semiconductor Memories by : Ashok K. Sharma
Download or read book Semiconductor Memories written by Ashok K. Sharma and published by Wiley-IEEE Press. This book was released on 2002-09-10 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
Book Synopsis Testing Semiconductor Memories by : A. J. van de Goor
Download or read book Testing Semiconductor Memories written by A. J. van de Goor and published by John Wiley & Sons. This book was released on 1991 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is introduced along with tests for these models. The author also presents algorithms of relevant fault models, together with proofs of their correctness. Special attention is given to why a fault model belongs to a particular class and why it is of interest. A software package, suitable for use on IBM PCs and compatibles, is also available which consists of a set of memory test programs and a simulation package demonstrating how the algorithms are executed and the relationship of the algorithm with the memory
Book Synopsis High Performance Memory Testing by : R. Dean Adams
Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Book Synopsis Testing Static Random Access Memories by : Said Hamdioui
Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Book Synopsis Semiconductor Memories by : Betty Prince
Download or read book Semiconductor Memories written by Betty Prince and published by . This book was released on 1991 with total page 830 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This [...] handbook gives a complete overview to the design, manufacture, and application of semiconductor memory technology.[...] The move towards application-specific memories and the new developments in memory applications, including smart memories, computers and networks, are explored. The author also details the new trends in memory architecture and functionality, such as multiplexing, video memory architecture and error correction. For embedded memories, there is an explanation of the advantages and disadvantages, testing methods and reliability. Detailed consideration is given to future trends in memories - VLSI technology ; commodity memories ; smart cards ; smart houses ; CIM ; speech synthesis and recognition ; RISC architecture ; neural processors and superconductors." (source : 4ème de couv.)
Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang
Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Book Synopsis Testing and Testable Design of High-Density Random-Access Memories by : Pinaki Mazumder
Download or read book Testing and Testable Design of High-Density Random-Access Memories written by Pinaki Mazumder and published by Springer. This book was released on 2011-09-27 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "It is not in the interest of business leaders to turn public schools into vocational schools. We can teach [students] how to be marketing people. We can teach them how to manage balance sheets," stated Louis V. Gerstner Jr. of IBM at the recent Education Summit meeting in New York. He continued, "What is killing us is having to teach them to read and to compute and to communicate and to think." (TIME, April 8, 1996, page 40). The last sentence is most significant because it sets requirements for educa tion and hence gives the specification for a textbook. The textbook should contain all the necessary scientific information that the reader will need to practice the art in the technological world. In addition to the scientific detail, illustrative examples are necessary. The book should teach science without restricting creativity, and it should prepare the student for solving problems never encountered before. In pursuing our goal of advancing the frontiers of test technology, we must cover applications, education, and research. This is the first textbook in the "Frontiers" series. Semiconductor memories represent the frontier of VLSI in more ways than one. First, memories have always used more aggressive physical design rules and higher densities than other VLSI chips, thus advancing the semiconductor technology. Second, the availability of low-cost memory chips makes numerous software applications possible by fueling the demand for all types of chips.
Book Synopsis Contemporary Computing by : Sanjay Ranka
Download or read book Contemporary Computing written by Sanjay Ranka and published by Springer Science & Business Media. This book was released on 2010-07-26 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume constitutes the refereed proceedings of the Third International Conference on Contemporary Computing, IC3 2010, held in Noida, India, in August 2010.
Book Synopsis Phase Change Memory by : Andrea Redaelli
Download or read book Phase Change Memory written by Andrea Redaelli and published by Springer. This book was released on 2017-11-18 with total page 342 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.
Book Synopsis Design for Maintainability by : Louis J. Gullo
Download or read book Design for Maintainability written by Louis J. Gullo and published by John Wiley & Sons. This book was released on 2021-02-23 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: How to design for optimum maintenance capabilities and minimize the repair time Design for Maintainability offers engineers a wide range of tools and techniques for incorporating maintainability into the design process for complex systems. With contributions from noted experts on the topic, the book explains how to design for optimum maintenance capabilities while simultaneously minimizing the time to repair equipment. The book contains a wealth of examples and the most up-to-date maintainability design practices that have proven to result in better system readiness, shorter downtimes, and substantial cost savings over the entire system life cycle, thereby, decreasing the Total Cost of Ownership. Design for Maintainability offers a wealth of design practices not covered in typical engineering books, thus allowing readers to think outside the box when developing maintainability design requirements. The books principles and practices can help engineers to dramatically improve their ability to compete in global markets and gain widespread customer satisfaction. This important book: Offers a complete overview of maintainability engineering as a system engineering discipline Includes contributions from authors who are recognized leaders in the field Contains real-life design examples, both good and bad, from various industries Presents realistic illustrations of good maintainability design principles Provides discussion of the interrelationships between maintainability with other related disciplines Explores trending topics in technologies Written for design and logistics engineers and managers, Design for Maintainability is a comprehensive resource containing the most reliable and innovative techniques for improving maintainability when designing a system or product.
Book Synopsis Introduction to Logic Circuits & Logic Design with Verilog by : Brock J. LaMeres
Download or read book Introduction to Logic Circuits & Logic Design with Verilog written by Brock J. LaMeres and published by Springer. This book was released on 2017-04-17 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: This textbook for courses in Digital Systems Design introduces students to the fundamental hardware used in modern computers. Coverage includes both the classical approach to digital system design (i.e., pen and paper) in addition to the modern hardware description language (HDL) design approach (computer-based). Using this textbook enables readers to design digital systems using the modern HDL approach, but they have a broad foundation of knowledge of the underlying hardware and theory of their designs. This book is designed to match the way the material is actually taught in the classroom. Topics are presented in a manner which builds foundational knowledge before moving onto advanced topics. The author has designed the presentation with learning Goals and assessment at its core. Each section addresses a specific learning outcome that the student should be able to “do” after its completion. The concept checks and exercise problems provide a rich set of assessment tools to measure student performance on each outcome.
Book Synopsis Embedded Memory Design for Multi-Core and Systems on Chip by : Baker Mohammad
Download or read book Embedded Memory Design for Multi-Core and Systems on Chip written by Baker Mohammad and published by Springer Science & Business Media. This book was released on 2013-10-22 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.
Book Synopsis Embedded Systems by : Kiyofumi Tanaka
Download or read book Embedded Systems written by Kiyofumi Tanaka and published by BoD – Books on Demand. This book was released on 2012-03-16 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nowadays, embedded systems - computer systems that are embedded in various kinds of devices and play an important role of specific control functions, have permeated various scenes of industry. Therefore, we can hardly discuss our life or society from now onwards without referring to embedded systems. For wide-ranging embedded systems to continue their growth, a number of high-quality fundamental and applied researches are indispensable. This book contains 13 excellent chapters and addresses a wide spectrum of research topics of embedded systems, including parallel computing, communication architecture, application-specific systems, and embedded systems projects. Embedded systems can be made only after fusing miscellaneous technologies together. Various technologies condensed in this book as well as in the complementary book "Embedded Systems - Theory and Design Methodology", will be helpful to researchers and engineers around the world.
Book Synopsis Advances in Digital Forensics XV by : Gilbert Peterson
Download or read book Advances in Digital Forensics XV written by Gilbert Peterson and published by Springer. This book was released on 2019-08-06 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital forensics deals with the acquisition, preservation, examination, analysis and presentation of electronic evidence. Computer networks, cloud computing, smartphones, embedded devices and the Internet of Things have expanded the role of digital forensics beyond traditional computer crime investigations. Practically every crime now involves some aspect of digital evidence; digital forensics provides the techniques and tools to articulate this evidence in legal proceedings. Digital forensics also has myriad intelligence applications; furthermore, it has a vital role in cyber security -- investigations of security breaches yield valuable information that can be used to design more secure and resilient systems. Advances in Digital Forensics XV describes original research results and innovative applications in the discipline of digital forensics. In addition, it highlights some of the major technical and legal issues related to digital evidence and electronic crime investigations. The areas of coverage include: forensic models, mobile and embedded device forensics, filesystem forensics, image forensics, and forensic techniques. This book is the fifteenth volume in the annual series produced by the International Federation for Information Processing (IFIP) Working Group 11.9 on Digital Forensics, an international community of scientists, engineers and practitioners dedicated to advancing the state of the art of research and practice in digital forensics. The book contains a selection of fourteen edited papers from the Fifteenth Annual IFIP WG 11.9 International Conference on Digital Forensics, held in Orlando, Florida, USA in the winter of 2019. Advances in Digital Forensics XV is an important resource for researchers, faculty members and graduate students, as well as for practitioners and individuals engaged in research and development efforts for the law enforcement and intelligence communities.
Book Synopsis Microelectronics Fialure Analysis Desk Reference, Seventh Edition by : Tejinder Gandhi
Download or read book Microelectronics Fialure Analysis Desk Reference, Seventh Edition written by Tejinder Gandhi and published by ASM International. This book was released on 2019-11-01 with total page 719 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
