Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Surface Chemical Analysis Secondary Ion Mass Spectrometry Linearity Of Intensity Scale In Single Ion Counting Time Of Flight Mass Analysers
Download Surface Chemical Analysis Secondary Ion Mass Spectrometry Linearity Of Intensity Scale In Single Ion Counting Time Of Flight Mass Analysers full books in PDF, epub, and Kindle. Read online Surface Chemical Analysis Secondary Ion Mass Spectrometry Linearity Of Intensity Scale In Single Ion Counting Time Of Flight Mass Analysers ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Linearity of Intensity Scale in Single Ion Counting Time-of-Flight Mass Analysers by : British Standards Institute Staff
Download or read book Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Linearity of Intensity Scale in Single Ion Counting Time-of-Flight Mass Analysers written by British Standards Institute Staff and published by . This book was released on 1913-12-31 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface chemistry, Chemical analysis and testing, Surfaces, Mass spectrometry, Mass spectrometers, Secondary, Ions, Calibration, Control samples
Book Synopsis Tracked Changes. Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Linearity of Intensity Scale in Single Ion Counting Time-of-flight Mass Analysers by : British Standards Institution
Download or read book Tracked Changes. Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Linearity of Intensity Scale in Single Ion Counting Time-of-flight Mass Analysers written by British Standards Institution and published by . This book was released on 2023 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis BS ISO 17862. Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Linearity of Intensity Scale in Single Ion Counting Time-of-flight Mass Analysers by : British Standards Institution
Download or read book BS ISO 17862. Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Linearity of Intensity Scale in Single Ion Counting Time-of-flight Mass Analysers written by British Standards Institution and published by . This book was released on 2020 with total page 33 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Secondary Ion Mass Spectrometry by : Fred Stevie
Download or read book Secondary Ion Mass Spectrometry written by Fred Stevie and published by Momentum Press. This book was released on 2015-09-15 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Download or read book ToF-SIMS written by John C. Vickerman and published by . This book was released on 2001 with total page 820 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectroemtry is the most versatile of surface analysis techniques that has been developed. Following an overview, this work includes sections devoted to: instrumentation and sample handling; fundamentals and molecular dynamics simulations; optimisation methods; and data interpretation, and analytical applications.
Book Synopsis Surface Chemical Analysis. Secondary-Ion Mass Spectrometry. Repeatability and Constancy of the Relative-Intensity Scale in Static Secondary-Ion Mass Spectrometry by : British Standards Institute Staff
Download or read book Surface Chemical Analysis. Secondary-Ion Mass Spectrometry. Repeatability and Constancy of the Relative-Intensity Scale in Static Secondary-Ion Mass Spectrometry written by British Standards Institute Staff and published by . This book was released on 2008-12-31 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface chemistry, Chemical analysis and testing, Mass spectrometry, Mass spectrometers, Secondary, Ions, Reproducibility, Measurement characteristics
Book Synopsis Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Correction Method for Saturated Intensity in Single Ion Counting Dynamic Secondary Ion Mass Spectrometry by : British Standards Institute Staff
Download or read book Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Correction Method for Saturated Intensity in Single Ion Counting Dynamic Secondary Ion Mass Spectrometry written by British Standards Institute Staff and published by . This book was released on 1918-03-14 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analysis, Mass, Chemical analysis and testing, Surface chemistry, Spectroscopy, Surfaces, Ions, Intensity, Secondary
Book Synopsis Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Calibration of the Mass Scale for a Time-Of-flight Secondary Ion Mass Spectrometer by : British Standards Institute Staff
Download or read book Surface Chemical Analysis. Secondary Ion Mass Spectrometry. Calibration of the Mass Scale for a Time-Of-flight Secondary Ion Mass Spectrometer written by British Standards Institute Staff and published by . This book was released on 1918-11-16 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mass spectrometry, Chemical analysis and testing, Ions, Surface chemistry, Control samples, Secondary, Surfaces, Mass spectrometers, Calibration
Book Synopsis Secondary Ion Mass Spectroscopy of Solid Surfaces by : V. T. Cherepin
Download or read book Secondary Ion Mass Spectroscopy of Solid Surfaces written by V. T. Cherepin and published by CRC Press. This book was released on 2020-04-28 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
Book Synopsis Secondary Ion Mass Spectrometry by : Robert G. Wilson
Download or read book Secondary Ion Mass Spectrometry written by Robert G. Wilson and published by Wiley-Interscience. This book was released on 1989-11-16 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
Book Synopsis Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data by : Negar Shahrokhesfahani
Download or read book Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data written by Negar Shahrokhesfahani and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful tool for advanced surface analysis. It produces large data sets, which consist of mass spectra at each pixel at an imaged area. Many ToF SIMS instruments use a type of detector that suffers from two problems that lead to non-linearity in the measured sample properties: detector saturation and dead time. Linearity in this type of system is defined as the proportionality of the measured and true ion counts. Non-linearity can influence the interpretation of the data with methods such as multivariate analysis. "Detector saturation" happens when more than one ion arrives at the detector in the time interval related to one specific channel but the detector records only a single count. "Dead time" is when one event happens at a certain channel and the detector become insensitive to subsequent ions arriving within the dead time window. These problems both lead to under-counting of ions. In this thesis, we mainly focus on correcting for the dead time effects. Using extensive simulations, we first characterize the adverse effects of dead time on the output and evaluate quality of existing ways to "correct" for dead time effects. Then, we propose a novel method using the Maximum Likelihood Estimation (MLE) to estimate the true spectrum for the measured data. Specifically, we incorporate the statistical distribution of the dead time affected data in MLE, which leads to a new method for dead time correction.
Book Synopsis An Introduction to Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science by : Sarah Fearn
Download or read book An Introduction to Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science written by Sarah Fearn and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Book Synopsis Secondary Ion Mass Spectrometry SIMS II by : A. Benninghoven
Download or read book Secondary Ion Mass Spectrometry SIMS II written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Secondary Ion Mass Spectrometry by : Paul van der Heide
Download or read book Secondary Ion Mass Spectrometry written by Paul van der Heide and published by John Wiley & Sons. This book was released on 2014-08-19 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Book Synopsis Secondary Ion Mass Spectrometry by : J. C. Vickerman
Download or read book Secondary Ion Mass Spectrometry written by J. C. Vickerman and published by Oxford University Press, USA. This book was released on 1989 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Book Synopsis Secondary Ion Mass Spectrometry by : Kurt F. J. Heinrich
Download or read book Secondary Ion Mass Spectrometry written by Kurt F. J. Heinrich and published by . This book was released on 1975 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry by : Danica Heller-Krippendorf
Download or read book Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry written by Danica Heller-Krippendorf and published by Springer Spektrum. This book was released on 2019-11-15 with total page 195 pages. Available in PDF, EPUB and Kindle. Book excerpt: Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.
