Sub Angstrom Imaging Of Dislocation Core Structures

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Science of Microscopy

Author : P.W. Hawkes
Publisher : Springer Science & Business Media
ISBN 13 : 0387497625
Total Pages : 1336 pages
Book Rating : 4.3/5 (874 download)

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Book Synopsis Science of Microscopy by : P.W. Hawkes

Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Multifunctional Oxide Heterostructures

Author : Evgeny Y. Tsymbal
Publisher : OUP Oxford
ISBN 13 : 0191642223
Total Pages : 416 pages
Book Rating : 4.1/5 (916 download)

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Book Synopsis Multifunctional Oxide Heterostructures by : Evgeny Y. Tsymbal

Download or read book Multifunctional Oxide Heterostructures written by Evgeny Y. Tsymbal and published by OUP Oxford. This book was released on 2012-08-30 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is devoted to the rapidly developing field of oxide thin-films and heterostructures. Oxide materials combined with atomic-scale precision in a heterostructure exhibit an abundance of macroscopic physical properties involving the strong coupling between the electronic, spin, and structural degrees of freedom, and the interplay between magnetism, ferroelectricity, and conductivity. Recent advances in thin-film deposition and characterization techniques made possible the experimental realization of such oxide heterostructures, promising novel functionalities and device concepts. The book consists of chapters on some of the key innovations in the field over recent years, including strongly correlated oxide heterostructures, magnetoelectric coupling and multiferroic materials, thermoelectric phenomena, and two-dimensional electron gases at oxide interfaces. The book covers the core principles, describes experimental approaches to fabricate and characterize oxide heterostructures, demonstrates new functional properties of these materials, and provides an overview of novel applications.

Defects in Microelectronic Materials and Devices

Author : Daniel M. Fleetwood
Publisher : CRC Press
ISBN 13 : 1420043773
Total Pages : 772 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Defects in Microelectronic Materials and Devices by : Daniel M. Fleetwood

Download or read book Defects in Microelectronic Materials and Devices written by Daniel M. Fleetwood and published by CRC Press. This book was released on 2008-11-19 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe

Dislocations in Solids

Author :
Publisher : Elsevier
ISBN 13 : 0080524680
Total Pages : 681 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Dislocations in Solids by :

Download or read book Dislocations in Solids written by and published by Elsevier. This book was released on 2007-05-16 with total page 681 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dislocations are lines of irregularity in the structure of a solid analogous to the bumps in a badly laid carpet. Like these bumps they can be easily moved, and they provide the most important mechanism by which the solid can be deformed. They also have a strong influence on crystal growth and on the electronic properties of semiconductors.·Influence of dislocations on piezoelectric behavior·New mechanisms for hardening in twinned crystals·Bringing theories of martensite transformation into agreement·Atomic scale motion of dislocations in electron microscopy·Dislocation patterns deduced from X-ray diffraction·Role of dislocations in friction·Dislocation motion in quasicrystals

Modeling Nanoscale Imaging in Electron Microscopy

Author : Thomas Vogt
Publisher : Springer Science & Business Media
ISBN 13 : 1461421918
Total Pages : 190 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Modeling Nanoscale Imaging in Electron Microscopy by : Thomas Vogt

Download or read book Modeling Nanoscale Imaging in Electron Microscopy written by Thomas Vogt and published by Springer Science & Business Media. This book was released on 2012-03-02 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Nanoscale Science and Technology

Author : Robert Kelsall
Publisher : John Wiley & Sons
ISBN 13 : 0470020865
Total Pages : 472 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Nanoscale Science and Technology by : Robert Kelsall

Download or read book Nanoscale Science and Technology written by Robert Kelsall and published by John Wiley & Sons. This book was released on 2005-11-01 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanotechnology is a vital new area of research and development addressing the control, modification and fabrication of materials, structures and devices with nanometre precision and the synthesis of such structures into systems of micro- and macroscopic dimensions. Future applications of nanoscale science and technology include motors smaller than the diameter of a human hair and single-celled organisms programmed to fabricate materials with nanometer precision. Miniaturisation has revolutionised the semiconductor industry by making possible inexpensive integrated electronic circuits comprised of devices and wires with sub-micrometer dimensions. These integrated circuits are now ubiquitous, controlling everything from cars to toasters. The next level of miniaturisation, beyond sub-micrometer dimensions into nanoscale dimensions (invisible to the unaided human eye) is a booming area of research and development. This is a very hot area of research with large amounts of venture capital and government funding being invested worldwide, as such Nanoscale Science and Technology has a broad appeal based upon an interdisciplinary approach, covering aspects of physics, chemistry, biology, materials science and electronic engineering. Kelsall et al present a coherent approach to nanoscale sciences, which will be invaluable to graduate level students and researchers and practising engineers and product designers.

High-Resolution Electron Microscopy

Author : John C. H. Spence
Publisher : OUP Oxford
ISBN 13 : 0191508403
Total Pages : 427 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis High-Resolution Electron Microscopy by : John C. H. Spence

Download or read book High-Resolution Electron Microscopy written by John C. H. Spence and published by OUP Oxford. This book was released on 2013-09-12 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.

Advances in Imaging and Electron Physics

Author :
Publisher : Academic Press
ISBN 13 : 0080880355
Total Pages : 591 pages
Book Rating : 4.0/5 (88 download)

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Book Synopsis Advances in Imaging and Electron Physics by :

Download or read book Advances in Imaging and Electron Physics written by and published by Academic Press. This book was released on 2009-06-12 with total page 591 pages. Available in PDF, EPUB and Kindle. Book excerpt: The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. First book on the subject of correctors Well known contributors from academia and microscope manufacturers Provides an ideal starting point for preparing funding proposals

Structural Analysis of Defects in III-V Compound Semiconductors

Author : Xiaoyu Xu
Publisher :
ISBN 13 :
Total Pages : 258 pages
Book Rating : 4.:/5 (35 download)

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Book Synopsis Structural Analysis of Defects in III-V Compound Semiconductors by : Xiaoyu Xu

Download or read book Structural Analysis of Defects in III-V Compound Semiconductors written by Xiaoyu Xu and published by . This book was released on 2005 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Progress in Nanoscale Characterization and Manipulation

Author : Rongming Wang
Publisher : Springer
ISBN 13 : 9811304548
Total Pages : 511 pages
Book Rating : 4.8/5 (113 download)

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Book Synopsis Progress in Nanoscale Characterization and Manipulation by : Rongming Wang

Download or read book Progress in Nanoscale Characterization and Manipulation written by Rongming Wang and published by Springer. This book was released on 2018-08-30 with total page 511 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Transmission Electron Microscopy

Author : C. Barry Carter
Publisher : Springer
ISBN 13 : 3319266519
Total Pages : 543 pages
Book Rating : 4.3/5 (192 download)

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Book Synopsis Transmission Electron Microscopy by : C. Barry Carter

Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Scanning Transmission Electron Microscopy

Author : Stephen J. Pennycook
Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 764 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission Electron Microscopy

Author : David B. Williams
Publisher : Springer Science & Business Media
ISBN 13 : 1475725191
Total Pages : 708 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Transmission Electron Microscopy by : David B. Williams

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Encyclopedia of Materials

Author : K. H. J. Buschow
Publisher :
ISBN 13 :
Total Pages : 1056 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Encyclopedia of Materials by : K. H. J. Buschow

Download or read book Encyclopedia of Materials written by K. H. J. Buschow and published by . This book was released on 2001 with total page 1056 pages. Available in PDF, EPUB and Kindle. Book excerpt: Accompanyind CR-ROM conrtains The Encyclopedia of Materials Science and Technology on a web access disc.

Fundamental Aspects of Dislocation Theory

Author : John Arthur Simmons
Publisher :
ISBN 13 :
Total Pages : 752 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Fundamental Aspects of Dislocation Theory by : John Arthur Simmons

Download or read book Fundamental Aspects of Dislocation Theory written by John Arthur Simmons and published by . This book was released on 1970 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Atom Probe Tomography

Author : Williams Lefebvre
Publisher : Academic Press
ISBN 13 : 0128047453
Total Pages : 418 pages
Book Rating : 4.1/5 (28 download)

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Book Synopsis Atom Probe Tomography by : Williams Lefebvre

Download or read book Atom Probe Tomography written by Williams Lefebvre and published by Academic Press. This book was released on 2016-05-30 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Industrial Applications Of Electron Microscopy

Author : Zhigang Li
Publisher : CRC Press
ISBN 13 : 0824745760
Total Pages : 640 pages
Book Rating : 4.8/5 (247 download)

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Book Synopsis Industrial Applications Of Electron Microscopy by : Zhigang Li

Download or read book Industrial Applications Of Electron Microscopy written by Zhigang Li and published by CRC Press. This book was released on 2002-12-04 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.