Strategies To Reduce Power During Vlsi Circuit Testing

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Power-Aware Testing and Test Strategies for Low Power Devices

Author : Patrick Girard
Publisher : Springer Science & Business Media
ISBN 13 : 1441909281
Total Pages : 376 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Power-Aware Testing and Test Strategies for Low Power Devices by : Patrick Girard

Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Power-Constrained Testing of VLSI Circuits

Author : Nicola Nicolici
Publisher : Springer Science & Business Media
ISBN 13 : 0306487314
Total Pages : 182 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Power-Constrained Testing of VLSI Circuits by : Nicola Nicolici

Download or read book Power-Constrained Testing of VLSI Circuits written by Nicola Nicolici and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Thermal-Aware Testing of Digital VLSI Circuits and Systems

Author : Santanu Chattopadhyay
Publisher : CRC Press
ISBN 13 : 1351227769
Total Pages : 86 pages
Book Rating : 4.3/5 (512 download)

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Book Synopsis Thermal-Aware Testing of Digital VLSI Circuits and Systems by : Santanu Chattopadhyay

Download or read book Thermal-Aware Testing of Digital VLSI Circuits and Systems written by Santanu Chattopadhyay and published by CRC Press. This book was released on 2018-04-24 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

Progress in VLSI Design and Test

Author : Hafizur Rahaman
Publisher : Springer
ISBN 13 : 3642314945
Total Pages : 427 pages
Book Rating : 4.6/5 (423 download)

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Book Synopsis Progress in VLSI Design and Test by : Hafizur Rahaman

Download or read book Progress in VLSI Design and Test written by Hafizur Rahaman and published by Springer. This book was released on 2012-06-26 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

Evolvable Systems: From Biology to Hardware

Author : Gianluca Tempesti
Publisher : Springer Science & Business Media
ISBN 13 : 3642153224
Total Pages : 406 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Evolvable Systems: From Biology to Hardware by : Gianluca Tempesti

Download or read book Evolvable Systems: From Biology to Hardware written by Gianluca Tempesti and published by Springer Science & Business Media. This book was released on 2010-08-30 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Biology has inspired electronics from the very beginning: the machines that we now call computers are deeply rooted in biological metaphors. Pioneers such as Alan Turing and John von Neumann openly declared their aim of creating arti?cial machines that could mimic some of the behaviors exhibited by natural organisms. Unfortunately, technology had not progressed enough to allow them to put their ideas into practice. The 1990s saw the introduction of programmable devices, both digital (FP- GAs) and analogue (FPAAs). These devices, by allowing the functionality and the structure of electronic devices to be easily altered, enabled researchers to endow circuits with some of the same versatility exhibited by biological entities and sparked a renaissance in the ?eld of bio-inspired electronics with the birth of what is generally known as evolvable hardware. Eversince,the?eldhasprogressedalongwiththetechnologicalimprovements and has expanded to take into account many di?erent biological processes, from evolution to learning, from development to healing. Of course, the application of these processes to electronic devices is not always straightforward (to say the least!), but rather than being discouraged, researchers in the community have shown remarkable ingenuity, as demostrated by the variety of approaches presented at this conference and included in these proceedings.

Advanced Circuits for Emerging Technologies

Author : Krzysztof Iniewski
Publisher : John Wiley & Sons
ISBN 13 : 1118181476
Total Pages : 632 pages
Book Rating : 4.1/5 (181 download)

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Book Synopsis Advanced Circuits for Emerging Technologies by : Krzysztof Iniewski

Download or read book Advanced Circuits for Emerging Technologies written by Krzysztof Iniewski and published by John Wiley & Sons. This book was released on 2012-04-17 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book will address the-state-of-the-art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three-dimensional (3-D) CMOS integration and co-integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies. The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.

On-Line Testing for VLSI

Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1475760698
Total Pages : 152 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis On-Line Testing for VLSI by : Michael Nicolaidis

Download or read book On-Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design

Author : Andreas Burg
Publisher : Springer
ISBN 13 : 3642450733
Total Pages : 245 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design by : Andreas Burg

Download or read book VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design written by Andreas Burg and published by Springer. This book was released on 2013-11-26 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.

Advances in Information Technology Research and Application: 2012 Edition

Author :
Publisher : ScholarlyEditions
ISBN 13 : 1464990514
Total Pages : 3360 pages
Book Rating : 4.4/5 (649 download)

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Book Synopsis Advances in Information Technology Research and Application: 2012 Edition by :

Download or read book Advances in Information Technology Research and Application: 2012 Edition written by and published by ScholarlyEditions. This book was released on 2012-12-26 with total page 3360 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Information Technology Research and Application / 2012 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Information Technology. The editors have built Advances in Information Technology Research and Application / 2012 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Information Technology in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Advances in Information Technology Research and Application / 2012 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Clock Distribution Networks in VLSI Circuits and Systems

Author : Eby G. Friedman
Publisher : IEEE Computer Society Press
ISBN 13 :
Total Pages : 552 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Clock Distribution Networks in VLSI Circuits and Systems by : Eby G. Friedman

Download or read book Clock Distribution Networks in VLSI Circuits and Systems written by Eby G. Friedman and published by IEEE Computer Society Press. This book was released on 1995 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: Improve the performance and reliability of synchronous digital integrated circuits with this anthology of key literature on the design and analysis of clock distribution networks for VLSI based computer and signal processing systems. Beginning with an extensive tutorial overview and bibliography, this all in one source offers substantive coverage of the most relevant issues related to the design of clock distribution networks for application to high performance synchronous design. Related topics include clock skew; automated layout of clock nets; distributed buffet and interconnect delays; clock distribution design of structured custom VLSI circuits; wafer scale integration; systolic arrays; globally asynchronous, locally synchronous systems; microwave issues; low power clocking techniques; process insensitive circuits; deterministic and probabilistic delay models; system timing specifications; clock distribution networks of well known circuits and future research in clock distribution networks. The material presented in Clock Distribution Networks in VLSI Circuits and Systems will be valuable to anyone with an interest in synchronous integrated circuits, computer design, or signal processing implementation issues.

Energy Systems Design for Low-Power Computing

Author : Gatti, Rathishchandra Ramachandra
Publisher : IGI Global
ISBN 13 : 1668449765
Total Pages : 413 pages
Book Rating : 4.6/5 (684 download)

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Book Synopsis Energy Systems Design for Low-Power Computing by : Gatti, Rathishchandra Ramachandra

Download or read book Energy Systems Design for Low-Power Computing written by Gatti, Rathishchandra Ramachandra and published by IGI Global. This book was released on 2023-03-07 with total page 413 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advancement in computing technologies, the need for power is also increasing. Approximately 3% of the total power consumption is spent by data centers and computing devices. This percentage will rise when more internet of things (IoT) devices are connected to the web. The handling of this data requires immense power. Energy Systems Design for Low-Power Computing disseminates the current research and the state-of-the-art technologies, topologies, standards, and techniques for the deployment of energy intelligence in edge computing, distributed computing, and centralized computing infrastructure. Covering topics such as electronic cooling, stochastic data analysis, and energy consumption, this premier reference source is an excellent resource for data center designers, VLSI designers, network developers, students and teachers of higher education, librarians, researchers, and academicians.

IDDQ Testing of VLSI Circuits

Author : Ravi K. Gulati
Publisher : Springer Science & Business Media
ISBN 13 : 1461531462
Total Pages : 121 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis IDDQ Testing of VLSI Circuits by : Ravi K. Gulati

Download or read book IDDQ Testing of VLSI Circuits written by Ravi K. Gulati and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Design and Test Technology for Dependable Systems-on-chip

Author : Raimund Ubar
Publisher : IGI Global
ISBN 13 : 1609602145
Total Pages : 580 pages
Book Rating : 4.6/5 (96 download)

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Book Synopsis Design and Test Technology for Dependable Systems-on-chip by : Raimund Ubar

Download or read book Design and Test Technology for Dependable Systems-on-chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

System-on-Chip Test Architectures

Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 0080556809
Total Pages : 893 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

Electronic Design Automation for IC System Design, Verification, and Testing

Author : Luciano Lavagno
Publisher : CRC Press
ISBN 13 : 1482254638
Total Pages : 644 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Electronic Design Automation for IC System Design, Verification, and Testing by : Luciano Lavagno

Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Microelectronic Devices, Circuits and Systems

Author : V. Arunachalam
Publisher : Springer Nature
ISBN 13 : 9811650489
Total Pages : 490 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Microelectronic Devices, Circuits and Systems by : V. Arunachalam

Download or read book Microelectronic Devices, Circuits and Systems written by V. Arunachalam and published by Springer Nature. This book was released on 2021-08-02 with total page 490 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes selected papers from the Second International Conference on Microelectronic Devices, Circuits and Systems, ICMDCS 2021, held in Vellore, India, in February 2021. The 32 full papers and 6 short papers presented were thoroughly reviewed and selected from 103 submissions. They are organized in the topical sections on digital design for signal, image and video processing; VLSI testing and verification; emerging technologies and IoT; nano-scale modelling and process technology device; analog and mixed signal design; communication technologies and circuits; technology and modelling for micro electronic devices; electronics for green technology.