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Author : Thomas W. Staley
Publisher :
ISBN 13 :
Total Pages : 444 pages
Book Rating : 4.:/5 (89 download)
Download or read book Statistical Optimization and Analysis of X-ray Rocking Curves written by Thomas W. Staley and published by . This book was released on 1997 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Saurabh N. Shah
Publisher :
ISBN 13 :
Total Pages : 220 pages
Book Rating : 4.:/5 (211 download)
Download or read book X-ray Rocking Curve Analysis Characterization of Electronic Materials written by Saurabh N. Shah and published by . This book was released on 1989 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wei Huang
Publisher :
ISBN 13 :
Total Pages : 154 pages
Book Rating : 4.:/5 (419 download)
Download or read book X-ray Rocking Curve Analysis by Program Simulation of Electronic Materials written by Wei Huang and published by . This book was released on 1998 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Richard William Henson
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (61 download)
Download or read book An Expert System for X-ray Rocking Curve Analysis Using Analogical Reasoning written by Richard William Henson and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A.G. Cullis
Publisher : CRC Press
ISBN 13 : 1351091530
Total Pages : 1135 pages
Book Rating : 4.3/5 (51 download)
Download or read book Microscopy of Semiconducting Materials 2003 written by A.G. Cullis and published by CRC Press. This book was released on 2018-01-10 with total page 1135 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of Semiconducting Materials focuses on international developments in semiconductor studies carried out by all forms of microscopy. It provides an overview of the latest instrumentation, analysis techniques, and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and material scientists.
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 826 pages
Book Rating : 4.:/5 (31 download)
Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1968 with total page 826 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1572 pages
Book Rating : 4.:/5 (31 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1992 with total page 1572 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1058 pages
Book Rating : 4.3/5 (91 download)
Download or read book Physics Briefs written by and published by . This book was released on 1993 with total page 1058 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. Kurita
Publisher :
ISBN 13 :
Total Pages : 7 pages
Book Rating : 4.:/5 (125 download)
Download or read book A Statistical Analysis of X-ray Stress Measurement by the Gaussian Curve-Fitting Method written by M. Kurita and published by . This book was released on 1981 with total page 7 pages. Available in PDF, EPUB and Kindle. Book excerpt: Simplified equations for calculating peak position and its standard deviation caused by counting statistics, which is a fundamental source of scatter in X-ray stress measurement, are derived for the Gaussian curve-fitting method. These equations when used with an inexpensive microcomputer will facilitate a precise and rapid residual stress determination. The time required for calculating the peak position and its standard deviation with such a microcomputer is only 0.9 s.
Author : M. Kurita
Publisher :
ISBN 13 :
Total Pages : 9 pages
Book Rating : 4.:/5 (125 download)
Download or read book Statistical Analysis of X-ray Residual Stress Measurement Using the Half-Width Method written by M. Kurita and published by . This book was released on 1982 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray stress measurement can be used to nondestructively measure the residual stress in small areas of metallic materials. The equation for calculating the standard deviation of the stress as a result of statistical counting errors ?S which are a fundamental source of scatter in X-ray stress measurements, is derived for the half-width method using the preset time technique. This equation shows that ?S is independent of the half-width of the diffraction line but is inversely proportional to the slope of the line side. Residual stresses in the three hardened steels, JIS S35C, S45C, and SK3, were determined by three methods, that is, the parabola and the Gaussian curve-fitting methods and the half-width method. The stress values determined by the three methods agreed well with each other. The standard deviation ?S determined by the half-width method is smaller than that determined by the curve-fitting methods for most materials, but it becomes larger as the diffraction line broadens.
Author :
Publisher :
ISBN 13 :
Total Pages : 872 pages
Book Rating : 4.3/5 (91 download)
Download or read book American Doctoral Dissertations written by and published by . This book was released on 1996 with total page 872 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Mario Birkholz
Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)
Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author : Yves Epelboin
Publisher : Springer Science & Business Media
ISBN 13 : 9401736995
Total Pages : 317 pages
Book Rating : 4.4/5 (17 download)
Download or read book World Directory of Crystallographers written by Yves Epelboin and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 9th edition of the World Directory of Crystallographers and of Other Scientists Employing Crystallographic Methods, which contains 7907 entries embracing 72 countries, differs considerably from the 8th edition, published in 1990. The content has been updated, and the methods used to acquire the information presented and to produce this new edition of the Directory have involved the latest advances in technology. The Directory is now also available as a regularly updated electronic database, accessible via e-mail, Telnet, Gopher, World-Wide Web, and Mosaic. Full details are given in an Appendix to the printed edition.
Author : Alicia Esther Ares
Publisher : BoD – Books on Demand
ISBN 13 : 9535128876
Total Pages : 230 pages
Book Rating : 4.5/5 (351 download)
Download or read book X-ray Scattering written by Alicia Esther Ares and published by BoD – Books on Demand. This book was released on 2017-01-25 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.
Author : Günter H. Zschornack
Publisher : Springer Science & Business Media
ISBN 13 : 3540286187
Total Pages : 969 pages
Book Rating : 4.5/5 (42 download)
Download or read book Handbook of X-Ray Data written by Günter H. Zschornack and published by Springer Science & Business Media. This book was released on 2007-01-24 with total page 969 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
Author : Jean Daillant
Publisher : Springer Science & Business Media
ISBN 13 : 3540486968
Total Pages : 347 pages
Book Rating : 4.5/5 (44 download)
Download or read book X-Ray and Neutron Reflectivity: Principles and Applications written by Jean Daillant and published by Springer Science & Business Media. This book was released on 2003-07-01 with total page 347 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Author : S. C. Schmidt
Publisher :
ISBN 13 :
Total Pages : 1030 pages
Book Rating : 4.3/5 (91 download)
Download or read book High-pressure Science and Technology, 1993 written by S. C. Schmidt and published by . This book was released on 1994 with total page 1030 pages. Available in PDF, EPUB and Kindle. Book excerpt:
