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Special Section On The 12th Ieee Vlsi Test Symposium
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Book Synopsis Index to IEEE Publications by : Institute of Electrical and Electronics Engineers
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1997 with total page 1468 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Introduction to VLSI Design Flow by : Sneh Saurabh
Download or read book Introduction to VLSI Design Flow written by Sneh Saurabh and published by Cambridge University Press. This book was released on 2023-06-09 with total page 983 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ISTFA 2012 written by ASM International and published by ASM International. This book was released on 2012 with total page 643 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Design, Automation, and Test in Europe by : Rudy Lauwereins
Download or read book Design, Automation, and Test in Europe written by Rudy Lauwereins and published by Springer Science & Business Media. This book was released on 2008-01-08 with total page 499 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
Book Synopsis Integrated Circuit Manufacturability by : José Pineda de Gyvez
Download or read book Integrated Circuit Manufacturability written by José Pineda de Gyvez and published by John Wiley & Sons. This book was released on 1998-10-30 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: "INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Book Synopsis Advances in VLSI and Embedded Systems by : Zuber Patel
Download or read book Advances in VLSI and Embedded Systems written by Zuber Patel and published by Springer Nature. This book was released on 2020-08-28 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Book Synopsis Advances in Electronic Testing by : Dimitris Gizopoulos
Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Author :Krishnendu Chakrabarty Publisher :Springer Science & Business Media ISBN 13 :1475765274 Total Pages :202 pages Book Rating :4.4/5 (757 download)
Book Synopsis SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by : Krishnendu Chakrabarty
Download or read book SOC (System-on-a-Chip) Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Book Synopsis Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors by : José Rodrigo Azambuja
Download or read book Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors written by José Rodrigo Azambuja and published by Springer. This book was released on 2014-07-07 with total page 107 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes fault tolerance techniques based on software and hardware to create hybrid techniques. They are able to reduce overall performance degradation and increase error detection when associated with applications implemented in embedded processors. Coverage begins with an extensive discussion of the current state-of-the-art in fault tolerance techniques. The authors then discuss the best trade-off between software-based and hardware-based techniques and introduce novel hybrid techniques. Proposed techniques increase existing fault detection rates up to 100%, while maintaining low performance overheads in area and application execution time.
Book Synopsis Machine Learning Support for Fault Diagnosis of System-on-Chip by : Patrick Girard
Download or read book Machine Learning Support for Fault Diagnosis of System-on-Chip written by Patrick Girard and published by Springer Nature. This book was released on 2023-03-13 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Book Synopsis Boolean Differential Calculus by : Bernd Steinbach
Download or read book Boolean Differential Calculus written by Bernd Steinbach and published by Springer Nature. This book was released on 2022-05-31 with total page 203 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Boolean Differential Calculus (BDC) is a very powerful theory that extends the basic concepts of Boolean Algebras significantly. Its applications are based on Boolean spaces and n, Boolean operations, and basic structures such as Boolean Algebras and Boolean Rings, Boolean functions, Boolean equations, Boolean inequalities, incompletely specified Boolean functions, and Boolean lattices of Boolean functions. These basics, sometimes also called switching theory, are widely used in many modern information processing applications. The BDC extends the known concepts and allows the consideration of changes of function values. Such changes can be explored for pairs of function values as well as for whole subspaces. The BDC defines a small number of derivative and differential operations. Many existing theorems are very welcome and allow new insights due to possible transformations of problems. The available operations of the BDC have been efficiently implemented in several software packages. The common use of the basic concepts and the BDC opens a very wide field of applications. The roots of the BDC go back to the practical problem of testing digital circuits. The BDC deals with changes of signals which are very important in applications of the analysis and the synthesis of digital circuits. The comprehensive evaluation and utilization of properties of Boolean functions allow, for instance, to decompose Boolean functions very efficiently; this can be applied not only in circuit design, but also in data mining. Other examples for the use of the BDC are the detection of hazards or cryptography. The knowledge of the BDC gives the scientists and engineers an extended insight into Boolean problems leading to new applications, e.g., the use of Boolean lattices of Boolean functions.
Book Synopsis Proceedings of the 2nd International Conference on Communication, Devices and Computing by : Sumit Kundu
Download or read book Proceedings of the 2nd International Conference on Communication, Devices and Computing written by Sumit Kundu and published by Springer Nature. This book was released on 2019-12-16 with total page 720 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gathers high-quality papers presented at the 2nd International Conference on Communication, Devices & Computing (ICCDC 2019), held at Haldia Institute of Technology from March 14–15, 2019. The papers are divided into three main areas: communication technologies, electronics circuits & devices and computing. Written by students and researchers from around the world, they accurately reflect the global status quo.
Book Synopsis Hardware Security and Trust by : Nicolas Sklavos
Download or read book Hardware Security and Trust written by Nicolas Sklavos and published by Springer. This book was released on 2017-01-11 with total page 254 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to hardware security, from specification to implementation. Applications discussed include embedded systems ranging from small RFID tags to satellites orbiting the earth. The authors describe a design and synthesis flow, which will transform a given circuit into a secure design incorporating counter-measures against fault attacks. In order to address the conflict between testability and security, the authors describe innovative design-for-testability (DFT) computer-aided design (CAD) tools that support security challenges, engineered for compliance with existing, commercial tools. Secure protocols are discussed, which protect access to necessary test infrastructures and enable the design of secure access controllers.
Book Synopsis Logic Functions and Equations by : Christian Posthoff
Download or read book Logic Functions and Equations written by Christian Posthoff and published by Springer. This book was released on 2018-12-31 with total page 511 pages. Available in PDF, EPUB and Kindle. Book excerpt: The expanded and updated 2nd edition of this classic text offers the reader a comprehensive introduction to the concepts of logic functions and equations and their applications across computer science. The approach emphasizes a thorough understanding of the fundamental principles as well as numerical and computer-based solution methods. Updated throughout, some major additions for the 2nd edition include: - an expanded introductory section on logic equations; - a new chapter on sets, lattices, and classes of logic functions; - a new chapter about SAT-problems; - a new chapter about methods to solve extremely complex problems; and - an expanded section with new decomposition methods utilizing the Boolean Differential Calculus extended to lattices of logic functions. The book provides insight into applications across binary arithmetic, coding, complexity, logic design, programming, computer architecture, and artificial intelligence. Based on the extensive teaching experience of the authors, Logic Functions and Equations is highly recommended for a one- or two-semester course in computer science and related programs. It provides straightforward high-level access to these methods and enables sophisticated applications, elegantly bridging the gap between mathematics and the theoretical foundations of computer science.
Book Synopsis Soft Errors in Modern Electronic Systems by : Michael Nicolaidis
Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Book Synopsis Embedded Software and Systems by : Laurence T. Yang
Download or read book Embedded Software and Systems written by Laurence T. Yang and published by Springer. This book was released on 2005-11-30 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt: Welcome to the proceedings of the 2005 International Conference on Emb- ded Software and Systems (ICESS 2005) held in Xian, China, December 16-18, 2005. With the advent of VLSI system level integration and system-on-chip, the center of gravity of the computer industry is now moving from personal c- puting into embedded computing. Embedded software and systems are incre- ingly becoming a key technological component of all kinds of complex technical systems, ranging from vehicles, telephones, aircraft, toys, security systems, to medical diagnostics, weapons, pacemakers, climate control systems, etc. The ICESS 2005 conference provided a premier international forum for - searchers, developers and providers from academia and industry to address all resulting profound challenges; to present and discuss their new ideas, - search results, applications and experience; to improve international com- nication and cooperation; and to promote embedded software and system - dustrialization and wide applications on all aspects of embedded software and systems.
Book Synopsis System-level Test and Validation of Hardware/Software Systems by : Matteo Sonza Reorda
Download or read book System-level Test and Validation of Hardware/Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.