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ISBN 13 :
Total Pages : 430 pages
Book Rating : 4.3/5 (91 download)
Download or read book Annual IEEE Semiconductor Thermal Measurement and Management Symposium written by and published by . This book was released on 2003 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 312 pages
Book Rating : 4.X/5 (4 download)
Download or read book 1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium written by Institute of Electrical and Electronics Engineers and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1997 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features coverage of new developments in and applications relating to generation and removal of heat within semiconductor devices, and measurement of junction temperatures under various application and environmental conditions.
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ISBN 13 :
Total Pages : 838 pages
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Author : IEEE/SEMI International Semiconductor Manufacturing Science Symposium
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ISBN 13 :
Total Pages : 184 pages
Book Rating : 4.3/5 (91 download)
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Total Pages : 2152 pages
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ISBN 13 :
Total Pages : 152 pages
Book Rating : 4.3/5 (91 download)
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Author : Marta Rencz
Publisher : Springer Nature
ISBN 13 : 3030861740
Total Pages : 389 pages
Book Rating : 4.0/5 (38 download)
Download or read book Theory and Practice of Thermal Transient Testing of Electronic Components written by Marta Rencz and published by Springer Nature. This book was released on 2023-01-23 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.
Author : British Library. Document Supply Centre
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ISBN 13 :
Total Pages : 990 pages
Book Rating : 4.3/5 (91 download)
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ISBN 13 :
Total Pages : 408 pages
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Total Pages : 392 pages
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Total Pages : 1040 pages
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Author : IEEE Electron Devices Society
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 376 pages
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Author : Kazuaki Yazawa
Publisher : World Scientific
ISBN 13 : 9811218285
Total Pages : 389 pages
Book Rating : 4.8/5 (112 download)
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ISBN 13 :
Total Pages : 1644 pages
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Total Pages : 770 pages
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Total Pages : 1010 pages
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